{"id":"https://openalex.org/W4205872388","doi":"https://doi.org/10.1109/idaacs53288.2021.9660850","title":"Computational Intelligence Application to Reproduce a Map of Surface Deviations based on the Results of Remote Measurements","display_name":"Computational Intelligence Application to Reproduce a Map of Surface Deviations based on the Results of Remote Measurements","publication_year":2021,"publication_date":"2021-09-22","ids":{"openalex":"https://openalex.org/W4205872388","doi":"https://doi.org/10.1109/idaacs53288.2021.9660850"},"language":"en","primary_location":{"id":"doi:10.1109/idaacs53288.2021.9660850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idaacs53288.2021.9660850","pdf_url":null,"source":{"id":"https://openalex.org/S4363607971","display_name":"2021 11th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 11th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109039401","display_name":"Mykhaylo Palamar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Mykhaylo Palamar","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008843287","display_name":"Myroslava Yavorska","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Myroslava Yavorska","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037272339","display_name":"Igor Zelinskyy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Igor Zelinskyy","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069707210","display_name":"Mykhaylo Strembitskyi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Mykhaylo Strembitskyi","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1518,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.77962578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":95},"biblio":{"volume":"93","issue":null,"first_page":"741","last_page":"744"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14320","display_name":"Optics and Image Analysis","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1404","display_name":"Management Information Systems"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6846514344215393},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.6422703266143799},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.6182491183280945},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5678979754447937},{"id":"https://openalex.org/keywords/reflector","display_name":"Reflector (photography)","score":0.46131396293640137},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.3988611698150635},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.38984912633895874},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.38141822814941406},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1332409679889679},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10377594828605652},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09954708814620972},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07513174414634705}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6846514344215393},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6422703266143799},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.6182491183280945},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5678979754447937},{"id":"https://openalex.org/C2778415886","wikidata":"https://www.wikidata.org/wiki/Q1823435","display_name":"Reflector (photography)","level":3,"score":0.46131396293640137},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3988611698150635},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.38984912633895874},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38141822814941406},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1332409679889679},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10377594828605652},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09954708814620972},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07513174414634705},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2982854487","wikidata":"https://www.wikidata.org/wiki/Q9128","display_name":"Light source","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idaacs53288.2021.9660850","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idaacs53288.2021.9660850","pdf_url":null,"source":{"id":"https://openalex.org/S4363607971","display_name":"2021 11th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 11th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W37652387","https://openalex.org/W2001856064","https://openalex.org/W2130763758","https://openalex.org/W2211390032","https://openalex.org/W2232230455","https://openalex.org/W2484091976"],"related_works":["https://openalex.org/W2745129434","https://openalex.org/W2110569808","https://openalex.org/W2052172349","https://openalex.org/W2504087329","https://openalex.org/W2033183813","https://openalex.org/W2361911914","https://openalex.org/W2100710187","https://openalex.org/W2041134563","https://openalex.org/W4250428870","https://openalex.org/W2385963608"],"abstract_inverted_index":{"Algorithmic":[0],"and":[1],"software":[2],"for":[3],"automatic":[4],"data":[5],"processing":[6],"of":[7,10,26,28,38],"remote":[8],"measurement":[9],"spatial":[11],"coordinates":[12],"on":[13],"the":[14,24,29,33,39,46],"surface":[15,31],"are":[16],"presented.":[17],"The":[18,36],"developed":[19,40],"technique":[20,41],"allows":[21],"to":[22],"reproduce":[23],"map":[25],"deviations":[27],"investigated":[30],"from":[32],"reference":[34],"sample.":[35],"application":[37],"is":[42],"illustrated":[43],"by":[44],"testing":[45],"reflector":[47],"profile.":[48]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}