{"id":"https://openalex.org/W2767487695","doi":"https://doi.org/10.1109/idaacs.2017.8095136","title":"The device for remote measurements of geometric dimensions and positions","display_name":"The device for remote measurements of geometric dimensions and positions","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2767487695","doi":"https://doi.org/10.1109/idaacs.2017.8095136","mag":"2767487695"},"language":"en","primary_location":{"id":"doi:10.1109/idaacs.2017.8095136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idaacs.2017.8095136","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109039401","display_name":"Mykhaylo Palamar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":true,"raw_author_name":"Mykhaylo Palamar","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037272339","display_name":"Igor Zelinskyy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Igor Zelinskyy","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008843287","display_name":"Myroslava Yavorska","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147056","display_name":"Ternopil Ivan Pului National Technical University","ror":"https://ror.org/045hmbf04","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210147056"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"Myroslava Yavorska","raw_affiliation_strings":["Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine"],"affiliations":[{"raw_affiliation_string":"Instrumentation Department, Ternopil Ivan Pul'uj National Technical University, Ternopil, Ukraine","institution_ids":["https://openalex.org/I4210147056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109039401"],"corresponding_institution_ids":["https://openalex.org/I4210147056"],"apc_list":null,"apc_paid":null,"fwci":0.1977,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55254622,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"15","issue":null,"first_page":"524","last_page":"527"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monochrome","display_name":"Monochrome","score":0.8901827335357666},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5710822939872742},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5230154395103455},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.47082287073135376},{"id":"https://openalex.org/keywords/measurement-device","display_name":"Measurement device","score":0.43958455324172974},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.15357667207717896},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12978363037109375}],"concepts":[{"id":"https://openalex.org/C2776754580","wikidata":"https://www.wikidata.org/wiki/Q10770146","display_name":"Monochrome","level":2,"score":0.8901827335357666},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5710822939872742},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5230154395103455},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47082287073135376},{"id":"https://openalex.org/C3019950295","wikidata":"https://www.wikidata.org/wiki/Q2041172","display_name":"Measurement device","level":2,"score":0.43958455324172974},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.15357667207717896},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12978363037109375}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idaacs.2017.8095136","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idaacs.2017.8095136","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 9th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W846549612","https://openalex.org/W1605143296","https://openalex.org/W2156345706","https://openalex.org/W4206519171","https://openalex.org/W4248250898"],"related_works":["https://openalex.org/W2794975693","https://openalex.org/W4206962867","https://openalex.org/W2058170566","https://openalex.org/W2772917594","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747"],"abstract_inverted_index":{"A":[0],"non-contact":[1],"technique":[2],"for":[3],"measurement":[4,21],"of":[5,20,26],"geometric":[6],"dimensions":[7],"and":[8],"positions":[9],"in":[10],"the":[11,18],"monochrome":[12],"light":[13],"is":[14],"presented":[15],"along":[16],"with":[17],"assessment":[19],"performance":[22],"by":[23],"automatic":[24],"processing":[25],"measurement.":[27]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}