{"id":"https://openalex.org/W4409561507","doi":"https://doi.org/10.1109/icvisp64524.2024.10959695","title":"PCB Surface Defect Detection Algorithm based on SC-YOLO","display_name":"PCB Surface Defect Detection Algorithm based on SC-YOLO","publication_year":2024,"publication_date":"2024-12-27","ids":{"openalex":"https://openalex.org/W4409561507","doi":"https://doi.org/10.1109/icvisp64524.2024.10959695"},"language":"en","primary_location":{"id":"doi:10.1109/icvisp64524.2024.10959695","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icvisp64524.2024.10959695","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 8th International Conference on Vision, Image and Signal Processing (ICVISP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/icvisp64524.2024.10959695","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100400178","display_name":"Shuo Wang","orcid":"https://orcid.org/0000-0002-9655-2920"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuo Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114218288","display_name":"Yueteng Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yueteng Shen","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110040473","display_name":"Jianing Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianing Zheng","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076967452","display_name":"Yaowen Zhang","orcid":"https://orcid.org/0009-0001-5376-822X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaowen Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100422698","display_name":"Yingying Zhang","orcid":"https://orcid.org/0000-0002-0964-1774"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingying Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology,Hefei,China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100400178"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.43852969,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6053065657615662},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41468241810798645},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3737320899963379},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34780317544937134}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6053065657615662},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41468241810798645},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3737320899963379},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34780317544937134}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icvisp64524.2024.10959695","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icvisp64524.2024.10959695","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 8th International Conference on Vision, Image and Signal Processing (ICVISP)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/icvisp64524.2024.10959695","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icvisp64524.2024.10959695","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 8th International Conference on Vision, Image and Signal Processing (ICVISP)","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2052545764","https://openalex.org/W2102605133","https://openalex.org/W2747355315","https://openalex.org/W2765854388","https://openalex.org/W2963037989","https://openalex.org/W3111404230","https://openalex.org/W4213436958","https://openalex.org/W4226027146","https://openalex.org/W4312237696","https://openalex.org/W4384296778","https://openalex.org/W4393308750"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"Printed":[0],"circuit":[1],"boards":[2],"(PCBs)":[3],"are":[4],"fundamental":[5],"components":[6],"in":[7,112,134],"electronic":[8],"devices.":[9],"This":[10],"study":[11],"introduces":[12],"a":[13,108,124],"YOLOv8":[14],"-":[15,90,129],"based":[16,49],"network":[17,67],"for":[18,127],"PCB":[19,131],"defect":[20,23,132],"detection.":[21],"The":[22,99],"features":[24],"can":[25,65],"be":[26],"effectively":[27],"extracted,":[28],"which":[29,64],"could":[30],"lead":[31],"to":[32,115],"information":[33],"loss":[34],"reduced":[35],"by":[36,80],"the":[37,45,51,77,87,95,104,121],"proposed":[38,105],"improved":[39],"C2f-SC":[40],"module.":[41],"Subsequently,":[42],"we":[43],"constructed":[44],"feature":[46],"fusion":[47],"structure":[48],"on":[50],"GSConv.":[52],"By":[53],"operating":[54],"through":[55],"independent":[56],"spatial":[57],"channel":[58],"grouping":[59],"convolution":[60],"and":[61,69],"cross-stage":[62],"cascading,":[63],"reduce":[66],"parameters":[68],"improves":[70],"detection":[71,133],"efficiency.":[72],"CARAFE":[73],"up-sampling":[74],"method":[75],"expands":[76],"receptive":[78],"field":[79],"aggregating":[81],"contextual":[82],"information.":[83],"In":[84],"this":[85],"research,":[86],"Sony":[88],"zve":[89],"10L":[91],"was":[92],"employed":[93],"as":[94],"image":[96],"acquisition":[97],"device.":[98],"experimental":[100],"outcomes":[101],"demonstrate":[102],"that":[103],"model":[106,122],"achieves":[107],"4.2":[109],"%":[110],"increase":[111],"mAP":[113],"compared":[114],"YOLOv8.":[116],"With":[117],"only":[118],"2.77M":[119],"parameters,":[120],"offers":[123],"viable":[125],"solution":[126],"real":[128],"time":[130],"industrial":[135],"applications.":[136]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}