{"id":"https://openalex.org/W2161165912","doi":"https://doi.org/10.1109/icvd.2004.1261046","title":"Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking","display_name":"Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking","publication_year":2004,"publication_date":"2004-06-21","ids":{"openalex":"https://openalex.org/W2161165912","doi":"https://doi.org/10.1109/icvd.2004.1261046","mag":"2161165912"},"language":"en","primary_location":{"id":"doi:10.1109/icvd.2004.1261046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2004.1261046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th International Conference on VLSI Design. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067544120","display_name":"Gethin Norman","orcid":"https://orcid.org/0000-0001-9326-4344"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"G. Norman","raw_affiliation_strings":["School of Computer Science, University of Binningham, Birmingham, UK"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, University of Binningham, Birmingham, UK","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036097359","display_name":"David Parker","orcid":"https://orcid.org/0000-0003-4137-8862"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Parker","raw_affiliation_strings":["School of Computer Science, University of Binningham, Birmingham, UK"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, University of Binningham, Birmingham, UK","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081710233","display_name":"Marta Kwiatkowska","orcid":"https://orcid.org/0000-0001-9022-7599"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Kwiatkowska","raw_affiliation_strings":["School of Computer Science, University of Binningham, Birmingham, UK"],"affiliations":[{"raw_affiliation_string":"School of Computer Science, University of Binningham, Birmingham, UK","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021517996","display_name":"Sandeep K. Shukla","orcid":"https://orcid.org/0000-0001-5525-7426"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.K. Shukla","raw_affiliation_strings":["Virginia Technology, Blacksburg, VA, USA"],"affiliations":[{"raw_affiliation_string":"Virginia Technology, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5067544120"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":11.1799,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.98803728,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"907","last_page":"912"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8052062392234802},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.7212247848510742},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6412385106086731},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5823732018470764},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5703759789466858},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4682289958000183},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3313356637954712},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2149951457977295},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2025807499885559},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16984662413597107}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8052062392234802},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.7212247848510742},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6412385106086731},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5823732018470764},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5703759789466858},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4682289958000183},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3313356637954712},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2149951457977295},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2025807499885559},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16984662413597107},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/icvd.2004.1261046","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2004.1261046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"17th International Conference on VLSI Design. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.135.1555","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.135.1555","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://csdl.computer.org/comp/proceedings/vlsid/2004/2072/00/20720907.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.3.6873","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.3.6873","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.bham.ac.uk/~dxp/papers/vlsi04.ps.gz","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.330.6661","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.330.6661","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.prismmodelchecker.org/papers/vlsi04.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1498125516","https://openalex.org/W1593235352","https://openalex.org/W2005998857","https://openalex.org/W2022829874","https://openalex.org/W2107810558","https://openalex.org/W2119147938","https://openalex.org/W2122386818","https://openalex.org/W2134991157","https://openalex.org/W2148533576","https://openalex.org/W2149607873","https://openalex.org/W2184094821","https://openalex.org/W2497735908","https://openalex.org/W3182208082","https://openalex.org/W6629738725"],"related_works":["https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4245282135","https://openalex.org/W2033512842","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W2036953450","https://openalex.org/W4300955944","https://openalex.org/W2170004886"],"abstract_inverted_index":{"As":[0],"we":[1,140],"move":[2],"from":[3],"deep":[4],"submicron":[5],"technology":[6],"to":[7,30,33,44,66,144,148],"nanotechnology":[8],"for":[9,14,62,87,155],"device":[10],"manufacture,":[11],"the":[12,24,84,106,111,118],"need":[13],"defect-tolerant":[15,88],"architectures":[16],"is":[17,21],"gaining":[18],"importance.":[19],"This":[20,90],"because,":[22],"at":[23],"nanoscale,":[25],"devices":[26],"will":[27,41],"be":[28,42,58,67],"prone":[29],"errors":[31,132],"due":[32],"manufacturing":[34],"defects,":[35,97],"ageing,":[36],"and":[37,102],"transient":[38],"faults.":[39],"Micro-architects":[40],"required":[43],"design":[45,64,153],"their":[46],"logic":[47],"around":[48],"defect":[49],"tolerance":[50],"through":[51],"redundancy.":[52],"However,":[53],"measures":[54],"of":[55,83,113,121,152],"reliability":[56,100],"must":[57],"quantified":[59],"in":[60,133],"order":[61],"such":[63],"methodologies":[65],"acceptable.":[68],"We":[69,109,128],"propose":[70],"a":[71,122],"CAD":[72],"framework":[73,91,115,147],"based":[74],"on":[75],"probabilistic":[76,94],"model":[77,93],"checking":[78],"which":[79],"provides":[80],"efficient":[81],"evaluation":[82],"reliability/redundancy":[85,119],"trade-off":[86,120,154],"architectures.":[89],"can":[92],"assumptions":[95],"about":[96],"easily":[98],"compute":[99],"figures":[101],"help":[103],"designers":[104],"make":[105],"right":[107],"decisions.":[108],"demonstrate":[110],"power":[112],"our":[114,146],"by":[116],"evaluating":[117],"canonical":[123],"example,":[124],"namely":[125],"NAND":[126],"multiplexing.":[127],"not":[129],"only":[130],"find":[131],"analytically":[134],"computed":[135],"bounds":[136],"published":[137],"recently,":[138],"but":[139],"also":[141],"show":[142],"how":[143],"use":[145],"evaluate":[149],"various":[150],"facets":[151],"reliability.":[156]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}