{"id":"https://openalex.org/W1894414010","doi":"https://doi.org/10.1109/icvd.2004.1261042","title":"Random access scan: a solution to test power, test data volume and test time","display_name":"Random access scan: a solution to test power, test data volume and test time","publication_year":2004,"publication_date":"2004-06-03","ids":{"openalex":"https://openalex.org/W1894414010","doi":"https://doi.org/10.1109/icvd.2004.1261042","mag":"1894414010"},"language":"en","primary_location":{"id":"doi:10.1109/icvd.2004.1261042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2004.1261042","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 17th International Conference on VLSI Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111608473","display_name":"Dong Hyun Baik","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dong Hyun Baik","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218098","display_name":"Kewal K. Saluja","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.K. Saluja","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin, Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kajihara","raw_affiliation_strings":["Department of Computer Sciences and Electronics, Kyushu Institute of Technology, Iizuka, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Computer Sciences and Electronics, Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111608473"],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":4.7633,"has_fulltext":false,"cited_by_count":54,"citation_normalized_percentile":{"value":0.94722697,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"883","last_page":"888"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7861430644989014},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7081161737442017},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6828435659408569},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6595616936683655},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6458182334899902},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6287062168121338},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.6209576725959778},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5724277496337891},{"id":"https://openalex.org/keywords/random-access","display_name":"Random access","score":0.5378503203392029},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5292612314224243},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.5214849710464478},{"id":"https://openalex.org/keywords/travelling-salesman-problem","display_name":"Travelling salesman problem","score":0.49809741973876953},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4279688596725464},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.41666221618652344},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3089054226875305},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.23426872491836548},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.23415464162826538},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14355158805847168},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13682302832603455}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7861430644989014},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7081161737442017},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6828435659408569},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6595616936683655},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6458182334899902},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6287062168121338},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.6209576725959778},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5724277496337891},{"id":"https://openalex.org/C101722063","wikidata":"https://www.wikidata.org/wiki/Q218825","display_name":"Random access","level":2,"score":0.5378503203392029},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5292612314224243},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.5214849710464478},{"id":"https://openalex.org/C175859090","wikidata":"https://www.wikidata.org/wiki/Q322212","display_name":"Travelling salesman problem","level":2,"score":0.49809741973876953},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4279688596725464},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.41666221618652344},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3089054226875305},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.23426872491836548},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.23415464162826538},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14355158805847168},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13682302832603455},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icvd.2004.1261042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2004.1261042","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 17th International Conference on VLSI Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W52459088","https://openalex.org/W1595368737","https://openalex.org/W1894414010","https://openalex.org/W1967602327","https://openalex.org/W1978040115","https://openalex.org/W2017708378","https://openalex.org/W2102168889","https://openalex.org/W2104548962","https://openalex.org/W2106303764","https://openalex.org/W2107995582","https://openalex.org/W2122955150","https://openalex.org/W2129031233","https://openalex.org/W2138654786","https://openalex.org/W2150448461","https://openalex.org/W2151526282","https://openalex.org/W2152533296","https://openalex.org/W2160621850","https://openalex.org/W2170059017","https://openalex.org/W2427394675","https://openalex.org/W2752885492","https://openalex.org/W4243807552","https://openalex.org/W6602054072","https://openalex.org/W6639440081","https://openalex.org/W6675998153","https://openalex.org/W6682904543"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W4234763172","https://openalex.org/W2992024382","https://openalex.org/W2125317684","https://openalex.org/W1606802855","https://openalex.org/W3121464923"],"abstract_inverted_index":{"Adherence":[0],"to":[1,63],"serial":[2],"scan":[3,39],"is":[4],"preventing":[5],"the":[6,22,34,69],"researchers":[7],"from":[8],"investigating":[9],"alternative":[10],"design":[11],"for":[12,40,99],"test":[13,19,44,46,50,70,83,89],"techniques":[14],"that":[15],"may":[16],"offer":[17],"larger":[18],"benefit":[20],"at":[21],"cost":[23],"of":[24,36,43,60,73],"some":[25],"what":[26],"higher":[27],"overhead.":[28],"In":[29],"this":[30],"paper,":[31],"we":[32],"investigate":[33],"use":[35],"random":[37,65],"access":[38,66],"simultaneous":[41],"reduction":[42,87,95],"power,":[45],"data":[47,90],"volume":[48,91],"and":[49,68,92],"application":[51,84],"time.":[52],"We":[53],"provide":[54],"an":[55],"asymmetric":[56],"traveling":[57],"salesman":[58],"formulation":[59],"these":[61],"problems":[62],"minimize":[64],"scans":[67],"data.":[71],"Application":[72],"our":[74],"method":[75],"results":[76],"into":[77],"nearly":[78],"3/spl":[79],"times/":[80],"speedup":[81],"in":[82,88,96],"time,":[85],"60%":[86],"over":[93],"99%":[94],"power":[97],"consumption":[98],"benchmark":[100],"circuits.":[101]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":6}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}