{"id":"https://openalex.org/W2142100913","doi":"https://doi.org/10.1109/icvd.2003.1183161","title":"Mutual testing based on wavelet transforms","display_name":"Mutual testing based on wavelet transforms","publication_year":2003,"publication_date":"2003-08-27","ids":{"openalex":"https://openalex.org/W2142100913","doi":"https://doi.org/10.1109/icvd.2003.1183161","mag":"2142100913"},"language":"en","primary_location":{"id":"doi:10.1109/icvd.2003.1183161","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2003.1183161","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th International Conference on VLSI Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036733255","display_name":"C.P. Ravikumar","orcid":"https://orcid.org/0000-0003-0809-5545"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"C.P. Ravikumar","raw_affiliation_strings":["ASIC, Texas Instruments India, Bangalore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASIC, Texas Instruments India, Bangalore","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058117376","display_name":"N. Kakkar","orcid":null},"institutions":[{"id":"https://openalex.org/I44430492","display_name":"Indian Institute of Management Bangalore","ror":"https://ror.org/02xxpjq61","country_code":"IN","type":"education","lineage":["https://openalex.org/I44430492"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"N. Kakkar","raw_affiliation_strings":["IIM-Bangalore, Bangalore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIM-Bangalore, Bangalore, India","institution_ids":["https://openalex.org/I44430492"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083818177","display_name":"Sanjeev Chopra","orcid":null},"institutions":[{"id":"https://openalex.org/I158012942","display_name":"University of Richmond","ror":"https://ror.org/03y71xh61","country_code":"US","type":"education","lineage":["https://openalex.org/I158012942"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Chopra","raw_affiliation_strings":["Richmond, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Richmond, VA, USA","institution_ids":["https://openalex.org/I158012942"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.21023578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"10","issue":null,"first_page":"347","last_page":"352"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7070772647857666},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.6203166246414185},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5732230544090271},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5038201212882996},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.459585577249527},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44119614362716675},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4354607164859772},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4344831109046936},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.41333723068237305},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37584227323532104},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.182824969291687},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17798438668251038},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1141546368598938},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11213579773902893},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11171424388885498},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10143223404884338}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7070772647857666},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.6203166246414185},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5732230544090271},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5038201212882996},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.459585577249527},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44119614362716675},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4354607164859772},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4344831109046936},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.41333723068237305},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37584227323532104},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.182824969291687},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17798438668251038},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1141546368598938},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11213579773902893},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11171424388885498},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10143223404884338},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icvd.2003.1183161","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icvd.2003.1183161","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"16th International Conference on VLSI Design, 2003. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W207687799","https://openalex.org/W1512748702","https://openalex.org/W1554885925","https://openalex.org/W1666015432","https://openalex.org/W1967575124","https://openalex.org/W2033443176","https://openalex.org/W2088326394","https://openalex.org/W2096109341","https://openalex.org/W2125465843","https://openalex.org/W2147542078","https://openalex.org/W2152279620","https://openalex.org/W3165001235","https://openalex.org/W4302458519","https://openalex.org/W6795798984"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2176409448","https://openalex.org/W2120447654","https://openalex.org/W2977179488","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W2374664672","https://openalex.org/W2048817854"],"abstract_inverted_index":{"Mutual":[0,57],"testing":[1,20,58,170,195],"is":[2,21,46,182,200],"a":[3,172,185,202],"technique":[4,146],"for":[5],"both":[6],"on-line":[7],"and":[8,34,112],"off-line":[9],"built-in":[10],"self-test":[11],"in":[12,18,55,66,77,107,137],"VLSI":[13],"circuits.":[14],"The":[15,44,144,188],"essential":[16],"idea":[17],"mutual":[19],"that":[22],"if":[23,49,61],"identical":[24,42,103],"test":[25,33,189],"patterns":[26],"are":[27,64,94],"applied":[28],"to":[29,82,102,132,156,162,193],"the":[30,38,50,62,69,73,91,97,116,120,125,128,134,152,168,176,180,197],"circuit":[31,45,74],"under":[32],"its":[35],"alternate":[36,70,177,198],"implementation,":[37],"two":[39,92,121,135],"must":[40],"generate":[41],"outputs.":[43],"declared":[47],"faulty":[48],"outputs":[51],"do":[52],"not":[53],"match":[54],"content.":[56],"will":[59,105],"fail":[60],"waveforms":[63],"compared":[65],"time,":[67],"since":[68],"implementations":[71,93],"of":[72,96,119,127,158,171,179,196],"may":[75],"differ":[76,106],"speed,":[78],"making":[79],"it":[80,166],"necessary":[81],"apply":[83],"tests":[84],"at":[85,184],"different":[86],"clock":[87],"rates.":[88],"Even":[89],"when":[90,175],"instantiations":[95],"same":[98],"block,":[99],"their":[100],"responses":[101],"inputs":[104],"frequency,":[108],"phase,":[109],"noise":[110],"content,":[111],"amplitude,":[113],"depending":[114],"on":[115],"physical":[117],"placement":[118],"instances.":[122],"We":[123],"describe":[124],"use":[126],"Discrete":[129],"Wavelet":[130],"Transform":[131],"compare":[133],"signals":[136],"time":[138],"as":[139,141],"well":[140],"frequency":[142],"domains.":[143],"proposed":[145],"has":[147],"several":[148],"benefits.":[149],"It":[150],"reduces":[151],"yield":[153],"loss":[154],"due":[155,161,192],"misclassification":[157],"good":[159],"circuits":[160],"incorrect":[163],"comparison.":[164],"Secondly,":[165],"permits":[167],"at-speed":[169],"block":[173,181],"even":[174],"implementation":[178,199],"tested":[183],"slower":[186],"speed.":[187],"power":[190],"reduction":[191],"slower-speed":[194],"also":[201],"distinct":[203],"advantage.":[204]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}