{"id":"https://openalex.org/W4385624515","doi":"https://doi.org/10.1109/icufn57995.2023.10200315","title":"Soft-Error Injection System for Processor on FPGA Platform","display_name":"Soft-Error Injection System for Processor on FPGA Platform","publication_year":2023,"publication_date":"2023-07-04","ids":{"openalex":"https://openalex.org/W4385624515","doi":"https://doi.org/10.1109/icufn57995.2023.10200315"},"language":"en","primary_location":{"id":"doi:10.1109/icufn57995.2023.10200315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icufn57995.2023.10200315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Fourteenth International Conference on Ubiquitous and Future Networks (ICUFN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061791982","display_name":"Jea Hack Lee","orcid":"https://orcid.org/0009-0000-7085-2194"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jeahack Lee","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103126454","display_name":"Hyeonseong Kim","orcid":"https://orcid.org/0000-0002-9160-8876"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeonseong Kim","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006627490","display_name":"Sihyeong Park","orcid":"https://orcid.org/0000-0001-8244-4817"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sihyeong Park","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088408086","display_name":"Yun Pyo Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yun Pyo Hong","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065074359","display_name":"Seokhun Jeon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokhun Jeon","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100642851","display_name":"Byung\u2010Soo Kim","orcid":"https://orcid.org/0000-0001-5210-7430"},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byung-Soo Kim","raw_affiliation_strings":["Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea"],"affiliations":[{"raw_affiliation_string":"Korea Electronics Technology Institute,SoC Platform Research Center,Seongnam-si,Korea","institution_ids":["https://openalex.org/I4210131650"]},{"raw_affiliation_string":"SoC Platform Research Center, Korea Electronics Technology Institute, Seongnam-si, Korea","institution_ids":["https://openalex.org/I4210131650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5061791982"],"corresponding_institution_ids":["https://openalex.org/I4210131650"],"apc_list":null,"apc_paid":null,"fwci":0.1339,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4307562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"733","last_page":"735"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8247377872467041},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7414234280586243},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7019222378730774},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6973402500152588},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.6948173642158508},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6151614785194397},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5713144540786743},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4954479932785034},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4640345573425293},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.4628858268260956},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4444124102592468},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4251171052455902},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.32381051778793335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17112001776695251},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.17009204626083374},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.16269278526306152},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12014561891555786}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8247377872467041},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7414234280586243},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7019222378730774},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6973402500152588},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.6948173642158508},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6151614785194397},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5713144540786743},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4954479932785034},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4640345573425293},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.4628858268260956},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4444124102592468},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4251171052455902},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.32381051778793335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17112001776695251},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.17009204626083374},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.16269278526306152},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12014561891555786},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icufn57995.2023.10200315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icufn57995.2023.10200315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 Fourteenth International Conference on Ubiquitous and Future Networks (ICUFN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1998921161","https://openalex.org/W2023856022","https://openalex.org/W2074673023","https://openalex.org/W2159262743","https://openalex.org/W2531550288","https://openalex.org/W2557733141","https://openalex.org/W2947606730","https://openalex.org/W2962861998","https://openalex.org/W3197881353","https://openalex.org/W4238392979","https://openalex.org/W4251881069","https://openalex.org/W6728118415"],"related_works":["https://openalex.org/W3018727313","https://openalex.org/W2373958571","https://openalex.org/W1526253314","https://openalex.org/W1864358311","https://openalex.org/W2163463765","https://openalex.org/W2622269177","https://openalex.org/W1523508240","https://openalex.org/W2007562802","https://openalex.org/W1994651680","https://openalex.org/W1553526993"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,28,62,106],"soft-error":[4,47,102],"injection":[5,48,103],"system":[6,17,49,75,104],"on":[7,54],"the":[8,46,71,91,97,111],"FPGA":[9,56],"platform":[10,57],"using":[11,27],"an":[12,20,38,55],"ARM":[13],"Cortex-M3":[14],"processor.":[15],"The":[16,43,74,101],"consists":[18],"of":[19,45,78,113],"error":[21,92],"injector":[22],"that":[23],"generates":[24],"random":[25],"numbers":[26],"Fibonacci":[29],"linear":[30],"feedback":[31],"shift":[32],"register":[33],"to":[34,67,96],"introduce":[35],"errors":[36],"into":[37],"application":[39],"program":[40],"status":[41],"register.":[42],"efficacy":[44],"is":[50,65,76,105],"assessed":[51],"and":[52,69,83,87,124],"validated":[53],"employing":[58],"Xilinx":[59],"XCKU115.":[60],"Additionally,":[61],"user":[63],"interface":[64],"created":[66],"configure":[68],"test":[70],"error-injection":[72],"system.":[73],"capable":[77],"simulating":[79],"both":[80],"single-event":[81,84],"transient":[82],"upset":[85],"errors,":[86],"it":[88],"can":[89],"determine":[90],"duration":[93],"before":[94],"returning":[95],"previous":[98],"error-free":[99],"state.":[100],"valuable":[107],"tool":[108],"for":[109],"evaluating":[110],"dependability":[112],"embedded":[114],"systems":[115],"used":[116],"in":[117],"industries":[118],"such":[119],"as":[120],"automotive,":[121],"industrial":[122],"control,":[123],"consumer":[125],"electronics.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}