{"id":"https://openalex.org/W7130558693","doi":"https://doi.org/10.1109/ictc66702.2025.11388367","title":"LPIPS-Based Visual Quality Inspection for Irregular-Shaped Products in Additive Manufacturing Post-Processing","display_name":"LPIPS-Based Visual Quality Inspection for Irregular-Shaped Products in Additive Manufacturing Post-Processing","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W7130558693","doi":"https://doi.org/10.1109/ictc66702.2025.11388367"},"language":null,"primary_location":{"id":"doi:10.1109/ictc66702.2025.11388367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc66702.2025.11388367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 16th International Conference on Information and Communication Technology Convergence (ICTC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101239740","display_name":"Hyunchul Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Chul Kang","raw_affiliation_strings":["Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112065651","display_name":"Chang-Beom Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chang-Beom Kim","raw_affiliation_strings":["Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078446748","display_name":"Min Gi Kim","orcid":"https://orcid.org/0000-0001-7375-5605"},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min-Gi Kim","raw_affiliation_strings":["Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111260774","display_name":"Eun Seo Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eun Seo Lee","raw_affiliation_strings":["Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea","institution_ids":["https://openalex.org/I142401562"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025207878","display_name":"J. Y. Son","orcid":null},"institutions":[{"id":"https://openalex.org/I142401562","display_name":"Electronics and Telecommunications Research Institute","ror":"https://ror.org/03ysstz10","country_code":"KR","type":"facility","lineage":["https://openalex.org/I142401562","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ji-Yeon Son","raw_affiliation_strings":["Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics and Telecommunications Research Institute,ICT-enabled Intelligent Manufacturing Research Section,Daejeon,Korea","institution_ids":["https://openalex.org/I142401562"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142401562"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"176","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.5685999989509583,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.5685999989509583,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.08919999748468399,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.06840000301599503,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.7178000211715698},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.6010000109672546},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.559499979019165},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5329999923706055},{"id":"https://openalex.org/keywords/perception","display_name":"Perception","score":0.4884999990463257},{"id":"https://openalex.org/keywords/visual-perception","display_name":"Visual perception","score":0.37279999256134033},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.3720000088214874}],"concepts":[{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.7178000211715698},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6538000106811523},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.6010000109672546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5618000030517578},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.559499979019165},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5329999923706055},{"id":"https://openalex.org/C26760741","wikidata":"https://www.wikidata.org/wiki/Q160402","display_name":"Perception","level":2,"score":0.4884999990463257},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.48410001397132874},{"id":"https://openalex.org/C178253425","wikidata":"https://www.wikidata.org/wiki/Q162668","display_name":"Visual perception","level":3,"score":0.37279999256134033},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.3720000088214874},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.3614000082015991},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3610999882221222},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.35010001063346863},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.32440000772476196},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3003000020980835},{"id":"https://openalex.org/C19351080","wikidata":"https://www.wikidata.org/wiki/Q1395034","display_name":"New product development","level":2,"score":0.28119999170303345},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2768000066280365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2759999930858612},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.2639999985694885},{"id":"https://openalex.org/C143271835","wikidata":"https://www.wikidata.org/wiki/Q254515","display_name":"Similitude","level":2,"score":0.2599000036716461},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.2556999921798706}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ictc66702.2025.11388367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc66702.2025.11388367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 16th International Conference on Information and Communication Technology Convergence (ICTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4033566117286682}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2133665775","https://openalex.org/W2741574707","https://openalex.org/W2948982773","https://openalex.org/W2962785568","https://openalex.org/W3194640387","https://openalex.org/W4313433600","https://openalex.org/W4382449995"],"related_works":[],"abstract_inverted_index":{"Additive":[0],"Manufacturing":[1],"(AM)":[2],"enables":[3],"the":[4,61,104,114,138],"production":[5],"of":[6,117,124],"parts":[7],"with":[8,85],"irregular":[9,118],"shapes,":[10],"where":[11],"variations":[12],"in":[13],"geometry,":[14],"size,":[15],"material,":[16],"and":[17,40,45,73,95,129],"color":[18],"make":[19],"it":[20],"difficult":[21],"to":[22],"perform":[23],"consistent":[24],"quality":[25,131],"inspection":[26,54],"using":[27],"conventional":[28],"rule-based":[29],"methods.":[30],"In":[31],"particular,":[32],"each":[33],"product":[34,135],"often":[35],"requires":[36],"a":[37],"different":[38],"baseline,":[39],"repeated":[41,79],"data":[42],"collection,":[43],"labeling,":[44],"training":[46],"are":[47],"needed":[48],"posing":[49],"significant":[50],"limitations":[51],"for":[52,140],"real-time":[53],"systems.":[55],"To":[56],"address":[57],"this,":[58],"we":[59],"apply":[60],"Learned":[62],"Perceptual":[63],"Image":[64],"Patch":[65],"Similarity":[66,92],"(LPIPS),":[67],"which":[68],"models":[69],"human":[70],"visual":[71],"perception":[72],"can":[74,108],"identify":[75],"perceptual":[76,111],"differences":[77,112],"without":[78,120,137],"learning.":[80],"We":[81],"compare":[82],"its":[83],"performance":[84],"traditional":[86],"similarity":[87],"metrics":[88],"such":[89],"as":[90],"Structural":[91],"Index":[93],"(SSIM)":[94],"Peak":[96],"Signal-to-Noise":[97],"Ratio":[98],"(PSNR).":[99],"Experimental":[100],"results":[101],"show":[102],"that":[103],"proposed":[105],"LPIPS-based":[106],"method":[107],"effectively":[109],"detect":[110],"across":[113,133],"entire":[115],"image":[116],"products":[119],"requiring":[121],"predefined":[122],"Regions":[123],"Interest":[125],"(ROI),":[126],"enabling":[127],"flexible":[128],"reliable":[130],"evaluation":[132],"various":[134],"types":[136],"need":[139],"additional":[141],"retraining.":[142]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-02-20T00:00:00"}