{"id":"https://openalex.org/W1986312492","doi":"https://doi.org/10.1109/ictc.2013.6675444","title":"Reliability comparison of various regenerating codes for cloud services","display_name":"Reliability comparison of various regenerating codes for cloud services","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W1986312492","doi":"https://doi.org/10.1109/ictc.2013.6675444","mag":"1986312492"},"language":"en","primary_location":{"id":"doi:10.1109/ictc.2013.6675444","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc.2013.6675444","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Conference on ICT Convergence (ICTC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111704912","display_name":"Jung-Hyun Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jung-Hyun Kim","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100713839","display_name":"Jin\u2010Soo Park","orcid":"https://orcid.org/0000-0003-4487-946X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Soo Park","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004654299","display_name":"Ki-Hyeon Park","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki-Hyeon Park","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066677695","display_name":"Inseon Kim","orcid":"https://orcid.org/0000-0001-8389-1627"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Inseon Kim","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109990730","display_name":"Mi-Young Nam","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mi-Young Nam","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049042666","display_name":"Hong\u2010Yeop Song","orcid":"https://orcid.org/0000-0001-8764-9424"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hong-Yeop Song","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Yonsei University Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea]","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5111704912"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.09546981,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2010","issue":null,"first_page":"649","last_page":"653"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6895951628684998},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6805291175842285},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6777796149253845},{"id":"https://openalex.org/keywords/cloud-computing","display_name":"Cloud computing","score":0.6647636890411377},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49365171790122986},{"id":"https://openalex.org/keywords/cloud-storage","display_name":"Cloud storage","score":0.4267272651195526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17614108324050903},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12316569685935974}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6895951628684998},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6805291175842285},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6777796149253845},{"id":"https://openalex.org/C79974875","wikidata":"https://www.wikidata.org/wiki/Q483639","display_name":"Cloud computing","level":2,"score":0.6647636890411377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49365171790122986},{"id":"https://openalex.org/C2777059624","wikidata":"https://www.wikidata.org/wiki/Q914359","display_name":"Cloud storage","level":3,"score":0.4267272651195526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17614108324050903},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12316569685935974},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ictc.2013.6675444","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ictc.2013.6675444","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Conference on ICT Convergence (ICTC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W154253821","https://openalex.org/W1236737278","https://openalex.org/W1536930200","https://openalex.org/W1601517519","https://openalex.org/W1993830711","https://openalex.org/W1996042140","https://openalex.org/W2056826630","https://openalex.org/W2090637674","https://openalex.org/W2099837838","https://openalex.org/W2105185344","https://openalex.org/W2108897603","https://openalex.org/W2119565742","https://openalex.org/W2130531694","https://openalex.org/W2138744797","https://openalex.org/W2148575324","https://openalex.org/W2153704625","https://openalex.org/W2163775180","https://openalex.org/W2166589659","https://openalex.org/W2296125569","https://openalex.org/W2949925098","https://openalex.org/W3106482607","https://openalex.org/W4237064274","https://openalex.org/W4238465620","https://openalex.org/W4239670432","https://openalex.org/W4249823756","https://openalex.org/W6606324823","https://openalex.org/W6628128319","https://openalex.org/W6763717565"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,17],"consider":[4],"the":[5,19,59],"reliability":[6],"comparison":[7],"of":[8,21,39],"various":[9],"regenerating":[10,23,35],"codes":[11,24],"for":[12],"cloud":[13],"services.":[14],"By":[15],"simulations,":[16],"compare":[18],"performance":[20],"such":[22],"as":[25],"MBR":[26],"codes,":[27,29,32,36],"MSR":[28],"local":[30],"reconstruction":[31],"and":[33,45],"LT":[34],"in":[37,58],"terms":[38],"storage":[40],"overhead,":[41],"repair":[42,46],"read":[43],"cost,":[44],"failure":[47],"probability.":[48],"We":[49],"give":[50],"some":[51],"discussions":[52],"on":[53],"what":[54],"must":[55],"be":[56],"done":[57],"near":[60],"future.":[61]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}