{"id":"https://openalex.org/W4390337319","doi":"https://doi.org/10.1109/icta60488.2023.10364272","title":"A 128\u00d7128 15\u00b5m-Pitch DROIC with Pixel-Level 14-Bit ADC","display_name":"A 128\u00d7128 15\u00b5m-Pitch DROIC with Pixel-Level 14-Bit ADC","publication_year":2023,"publication_date":"2023-10-27","ids":{"openalex":"https://openalex.org/W4390337319","doi":"https://doi.org/10.1109/icta60488.2023.10364272"},"language":"en","primary_location":{"id":"doi:10.1109/icta60488.2023.10364272","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icta60488.2023.10364272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030446168","display_name":"Huanhui Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huanhui Zhang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100612870","display_name":"Xu Yang","orcid":"https://orcid.org/0000-0003-0292-5659"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Yang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101881791","display_name":"Zhe Wang","orcid":"https://orcid.org/0000-0002-2752-9970"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Wang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029342902","display_name":"Shuangming Yu","orcid":"https://orcid.org/0000-0001-6678-3886"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangming Yu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001300641","display_name":"Peng Feng","orcid":"https://orcid.org/0000-0002-7420-2161"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Feng","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100414628","display_name":"Jian Liu","orcid":"https://orcid.org/0000-0001-8057-2444"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Liu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110665174","display_name":"Nanjian Wu","orcid":"https://orcid.org/0000-0001-8022-0262"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nanjian Wu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050537094","display_name":"Runjiang Dou","orcid":"https://orcid.org/0000-0002-8674-1285"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runjiang Dou","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100657035","display_name":"Liyuan Liu","orcid":"https://orcid.org/0000-0003-2585-323X"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyuan Liu","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences,State Key Laboratory of Superlattices and Microstructures,Beijing,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5030446168"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211","https://openalex.org/I4210165038"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16953898,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"7834","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9825999736785889,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9799000024795532,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7792811393737793},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.6668765544891357},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6470794081687927},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5745168924331665},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5584549307823181},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5171024799346924},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.4959324300289154},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.48600897192955017},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4771682322025299},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4471016824245453},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.4431122839450836},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3896300196647644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3600103259086609},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27203041315078735},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.27051448822021484},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19713619351387024},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15569525957107544},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.15082529187202454}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7792811393737793},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6668765544891357},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6470794081687927},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5745168924331665},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5584549307823181},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5171024799346924},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.4959324300289154},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.48600897192955017},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4771682322025299},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4471016824245453},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.4431122839450836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3896300196647644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3600103259086609},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27203041315078735},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.27051448822021484},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19713619351387024},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15569525957107544},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.15082529187202454},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icta60488.2023.10364272","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icta60488.2023.10364272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1702316531","display_name":null,"funder_award_id":"U21A20504","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2051812308","https://openalex.org/W2610461438","https://openalex.org/W4214658493"],"related_works":["https://openalex.org/W4280522623","https://openalex.org/W2789062182","https://openalex.org/W2144928230","https://openalex.org/W2000009697","https://openalex.org/W2143811721","https://openalex.org/W2122002357","https://openalex.org/W1983384614","https://openalex.org/W3140967215","https://openalex.org/W2139664782","https://openalex.org/W1493129690"],"abstract_inverted_index":{"Digital":[0],"readout":[1],"integrated":[2],"circuits":[3],"(DROIC)":[4],"show":[5],"advantages":[6],"in":[7,25],"infrared":[8],"imaging":[9],"scenarios":[10],"with":[11],"large":[12],"charge":[13,89],"capacity":[14,91],"and":[15,69,87],"wide":[16],"dynamic":[17],"range.":[18],"In":[19],"this":[20],"paper,":[21],"a":[22],"128\u00d7128":[23],"DROIC":[24],"15\u00b5m":[26],"pitch":[27],"size":[28,49],"is":[29,40,50,59,85,92],"proposed,":[30],"which":[31],"implements":[32],"14bit":[33],"pixel-level":[34],"analog-to-digital":[35],"converter":[36],"(ADC).":[37],"The":[38,47,77],"design":[39],"based":[41],"on":[42],"65nm":[43],"1P9M":[44],"CMOS":[45],"process.":[46],"chip":[48],"2.6mm\u00d73.2mm.":[51],"According":[52],"to":[53,67],"the":[54,57,65,82,88],"simulation":[55],"results,":[56],"non-linearity":[58],"0.6%.":[60],"At":[61],"frequency":[62],"of":[63,73,81],"100\u00d77/128,":[64],"signal":[66],"noise":[68],"distortion":[70],"ratio":[71],"(SNDR)":[72],"pixel":[74],"achieves":[75],"50dB.":[76],"typical":[78],"power":[79],"consumption":[80],"proposed":[83],"array":[84],"33mW":[86],"handling":[90],"4.6Ge<sup":[93],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup>.":[95]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}