{"id":"https://openalex.org/W4310614819","doi":"https://doi.org/10.1109/icta56932.2022.9963082","title":"An Analytical Model for doping effect in charge-plasma-based TFET","display_name":"An Analytical Model for doping effect in charge-plasma-based TFET","publication_year":2022,"publication_date":"2022-10-28","ids":{"openalex":"https://openalex.org/W4310614819","doi":"https://doi.org/10.1109/icta56932.2022.9963082"},"language":"en","primary_location":{"id":"doi:10.1109/icta56932.2022.9963082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963082","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101852536","display_name":"Wenbo Li","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenbo Li","raw_affiliation_strings":["University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082326455","display_name":"Qian Xie","orcid":"https://orcid.org/0000-0002-5232-0298"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Xie","raw_affiliation_strings":["University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100401098","display_name":"Zheng Wang","orcid":"https://orcid.org/0000-0002-3994-0652"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Wang","raw_affiliation_strings":["University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101852536"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18555756,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"186","last_page":"187"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.8127826452255249},{"id":"https://openalex.org/keywords/poissons-equation","display_name":"Poisson's equation","score":0.741759181022644},{"id":"https://openalex.org/keywords/electrostatics","display_name":"Electrostatics","score":0.6825243234634399},{"id":"https://openalex.org/keywords/plasma","display_name":"Plasma","score":0.6442402005195618},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.6210687756538391},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.6209644079208374},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5486921668052673},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5306462645530701},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4770909249782562},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.4350033700466156},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39657244086265564},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2537970542907715},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.10934695601463318}],"concepts":[{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.8127826452255249},{"id":"https://openalex.org/C96716743","wikidata":"https://www.wikidata.org/wiki/Q827688","display_name":"Poisson's equation","level":2,"score":0.741759181022644},{"id":"https://openalex.org/C117626034","wikidata":"https://www.wikidata.org/wiki/Q26336","display_name":"Electrostatics","level":2,"score":0.6825243234634399},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.6442402005195618},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.6210687756538391},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6209644079208374},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5486921668052673},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5306462645530701},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4770909249782562},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.4350033700466156},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39657244086265564},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2537970542907715},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.10934695601463318},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icta56932.2022.9963082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963082","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1661368752","https://openalex.org/W2132841962","https://openalex.org/W3036422995","https://openalex.org/W3106708241"],"related_works":["https://openalex.org/W2164198674","https://openalex.org/W1986109963","https://openalex.org/W3013205429","https://openalex.org/W1965591751","https://openalex.org/W1599308342","https://openalex.org/W2011188029","https://openalex.org/W4245642471","https://openalex.org/W1986910690","https://openalex.org/W62629892","https://openalex.org/W2005979103"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"an":[3],"analytical":[4],"model":[5],"for":[6],"electrostatic":[7,32,56],"doping":[8,33,57],"effect":[9],"in":[10,35],"the":[11,22,40,43,62,68],"charge-plasma-based":[12],"TFET":[13],"(CP-TFET)":[14],"is":[15],"proposed":[16],"by":[17],"solving":[18],"Poisson's":[19],"equation":[20],"incorporating":[21],"mobile":[23],"charge":[24],"term.":[25],"Closed":[26],"forms":[27],"of":[28,42,67],"vertical":[29],"potential":[30],"and":[31,47],"concentration":[34,58],"CP-TFETs":[36],"are":[37,52],"developed.":[38],"Meanwhile,":[39],"impacts":[41],"electrode":[44],"work":[45],"functions":[46],"substrate":[48],"thicknesses":[49],"on":[50],"them":[51],"analyzed.":[53],"This":[54],"predicted":[55],"agrees":[59],"well":[60],"with":[61],"Sentaurus":[63],"TCAD":[64],"simulation":[65],"results":[66],"CP-TFET.":[69]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}