{"id":"https://openalex.org/W4310581268","doi":"https://doi.org/10.1109/icta56932.2022.9963063","title":"Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation","display_name":"Improve the Robustness of Diffusive Memristor based True Random Number Generator via Voltage-to-Time Transformation","publication_year":2022,"publication_date":"2022-10-28","ids":{"openalex":"https://openalex.org/W4310581268","doi":"https://doi.org/10.1109/icta56932.2022.9963063"},"language":"en","primary_location":{"id":"doi:10.1109/icta56932.2022.9963063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963063","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100369538","display_name":"Haoyang Li","orcid":"https://orcid.org/0000-0002-4816-4325"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haoyang Li","raw_affiliation_strings":["School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028829537","display_name":"Yuyang Fu","orcid":"https://orcid.org/0000-0002-2972-4729"},"institutions":[{"id":"https://openalex.org/I75900474","display_name":"Hubei University","ror":"https://ror.org/03a60m280","country_code":"CN","type":"education","lineage":["https://openalex.org/I75900474"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuyang Fu","raw_affiliation_strings":["School of Microelectronics, Hubei University,Wuhan,China,430062"],"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hubei University,Wuhan,China,430062","institution_ids":["https://openalex.org/I75900474"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051730609","display_name":"Tianqing Wan","orcid":"https://orcid.org/0000-0002-3817-6437"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianqing Wan","raw_affiliation_strings":["School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039484973","display_name":"Yifan Lu","orcid":"https://orcid.org/0000-0001-6184-6200"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yifan Lu","raw_affiliation_strings":["School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086310230","display_name":"Ling Yang","orcid":"https://orcid.org/0000-0002-5727-688X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Yang","raw_affiliation_strings":["School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100421744","display_name":"Yi Li","orcid":"https://orcid.org/0000-0003-1930-8550"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Li","raw_affiliation_strings":["School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Huazhong University of Science and Technology,Wuhan,China,430074","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100369538"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.6448,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60250868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"58","last_page":"59"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8356670141220093},{"id":"https://openalex.org/keywords/random-number-generation","display_name":"Random number generation","score":0.5656954646110535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5591896772384644},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5395724773406982},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4746086001396179},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.47072139382362366},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.44777390360832214},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4137190878391266},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3618484437465668},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32696533203125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1798870861530304},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.179203599691391},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12871593236923218},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09867662191390991}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8356670141220093},{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.5656954646110535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5591896772384644},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5395724773406982},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4746086001396179},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.47072139382362366},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.44777390360832214},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4137190878391266},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3618484437465668},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32696533203125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1798870861530304},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.179203599691391},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12871593236923218},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09867662191390991},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icta56932.2022.9963063","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963063","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5799999833106995}],"awards":[{"id":"https://openalex.org/G6199362114","display_name":null,"funder_award_id":"92064012","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2010205010","https://openalex.org/W2121908414","https://openalex.org/W2595356178","https://openalex.org/W2762731122","https://openalex.org/W2768152971","https://openalex.org/W2777189444","https://openalex.org/W2799167959","https://openalex.org/W2896152186","https://openalex.org/W2909731512","https://openalex.org/W2921639329","https://openalex.org/W2946946742","https://openalex.org/W2949224578","https://openalex.org/W2994814893","https://openalex.org/W2995368757","https://openalex.org/W3009107341"],"related_works":["https://openalex.org/W4229452466","https://openalex.org/W2966276069","https://openalex.org/W2304829496","https://openalex.org/W2358307108","https://openalex.org/W3031124155","https://openalex.org/W2463286374","https://openalex.org/W2052332160","https://openalex.org/W2204001882","https://openalex.org/W190448578","https://openalex.org/W2377121108"],"abstract_inverted_index":{"Fluctuations":[0],"in":[1,43,76,87,97],"Vth":[2,82],"distribution":[3,54],"can":[4,46],"pose":[5],"reliability":[6,29],"problems":[7],"for":[8,22,71],"true":[9],"random":[10,61],"number":[11],"generators":[12],"(TRNGs).":[13],"Here,":[14],"we":[15],"propose":[16],"an":[17],"explanation":[18],"of":[19,30,35,60],"the":[20,28,58,98],"mechanism":[21],"voltage-to-time":[23,77],"transformation":[24,78],"scheme,":[25,79],"which":[26,80],"improve":[27],"TRNGs":[31],"by":[32],"fine-grained":[33],"segmentation":[34],"time.":[36],"Compared":[37],"with":[38],"conventional":[39],"schemes,":[40],"test":[41],"scheme":[42],"this":[44],"work":[45,64],"tolerate":[47],"50%":[48],"cycle-to-cycle":[49],"(C2C)":[50],"and":[51,56,68,90,94],"device-to-device":[52],"(D2D)":[53],"shift":[55],"ensure":[57],"independence":[59],"bits.":[62],"This":[63],"provides":[65],"a":[66],"distinct":[67],"reliable":[69],"evidence":[70],"tolerating":[72],"frequent":[73],"parameter":[74],"shifts":[75],"increase":[81],"robustness,":[83],"reduce":[84],"device":[85],"requirements":[86],"practical":[88],"use,":[89],"avoid":[91],"redundant":[92],"measurements":[93],"extra":[95],"calibration":[96],"test.":[99]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}