{"id":"https://openalex.org/W4310717053","doi":"https://doi.org/10.1109/icta56932.2022.9963054","title":"A statistics-based background capacitor mismatch calibration algorithm for SAR ADC","display_name":"A statistics-based background capacitor mismatch calibration algorithm for SAR ADC","publication_year":2022,"publication_date":"2022-10-28","ids":{"openalex":"https://openalex.org/W4310717053","doi":"https://doi.org/10.1109/icta56932.2022.9963054"},"language":"en","primary_location":{"id":"doi:10.1109/icta56932.2022.9963054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963054","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079463657","display_name":"Zhiqiang Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhiqiang Luo","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University,Beijing,China","School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University,Beijing,China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100396043","display_name":"Peng Wang","orcid":"https://orcid.org/0000-0002-5578-3626"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Wang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University,Beijing,China","School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University,Beijing,China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084959547","display_name":"Fule Li","orcid":"https://orcid.org/0000-0002-7341-7240"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fule Li","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University,Beijing,China","School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University,Beijing,China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115594767","display_name":"Chun Zhang","orcid":"https://orcid.org/0000-0001-7041-6958"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Zhang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University,Beijing,China","School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University,Beijing,China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100356864","display_name":"Zhihua Wang","orcid":"https://orcid.org/0000-0001-6567-0759"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihua Wang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University,Beijing,China","School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University,Beijing,China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5079463657"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22299336,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"55","issue":null,"first_page":"60","last_page":"61"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9725852608680725},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.753186821937561},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6990795135498047},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.638451874256134},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6297036409378052},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"Differential nonlinearity","score":0.5519975423812866},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5451681613922119},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5148550868034363},{"id":"https://openalex.org/keywords/spurious-relationship","display_name":"Spurious relationship","score":0.4954580068588257},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.44981649518013},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.41822558641433716},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4007111191749573},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.3846561312675476},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2837945818901062},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2695966958999634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13981929421424866},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13626253604888916},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.13114282488822937},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12334424257278442},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.11242985725402832},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09645941853523254},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.09403494000434875}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9725852608680725},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.753186821937561},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6990795135498047},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.638451874256134},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6297036409378052},{"id":"https://openalex.org/C71217194","wikidata":"https://www.wikidata.org/wiki/Q575958","display_name":"Differential nonlinearity","level":3,"score":0.5519975423812866},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5451681613922119},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5148550868034363},{"id":"https://openalex.org/C97256817","wikidata":"https://www.wikidata.org/wiki/Q1462316","display_name":"Spurious relationship","level":2,"score":0.4954580068588257},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.44981649518013},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.41822558641433716},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4007111191749573},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.3846561312675476},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2837945818901062},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2695966958999634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13981929421424866},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13626253604888916},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.13114282488822937},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12334424257278442},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.11242985725402832},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09645941853523254},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.09403494000434875},{"id":"https://openalex.org/C4305246","wikidata":"https://www.wikidata.org/wiki/Q3885225","display_name":"Least significant bit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icta56932.2022.9963054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta56932.2022.9963054","pdf_url":null,"source":{"id":"https://openalex.org/S4363608577","display_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2161493898","https://openalex.org/W2171146006","https://openalex.org/W2535745143","https://openalex.org/W2782303535","https://openalex.org/W2793785159","https://openalex.org/W2985840259","https://openalex.org/W6769746175"],"related_works":["https://openalex.org/W2896282852","https://openalex.org/W2139520010","https://openalex.org/W4391183296","https://openalex.org/W2904640696","https://openalex.org/W2207354743","https://openalex.org/W2897165762","https://openalex.org/W2416586275","https://openalex.org/W3116897448","https://openalex.org/W1515901614","https://openalex.org/W2790666456"],"abstract_inverted_index":{"This":[0,46],"paper":[1],"presents":[2],"a":[3],"statistics-based":[4],"background":[5],"capacitor":[6,25],"mismatch":[7,26],"calibration":[8,19,47],"algorithm":[9,20],"for":[10],"successive":[11],"approximation":[12],"register":[13],"(SAR)":[14],"analog-to-digital":[15],"converter":[16],"(ADC).":[17],"The":[18,65],"is":[21,35],"capable":[22],"of":[23],"detecting":[24],"errors":[27],"based":[28],"on":[29],"statistical":[30],"principles":[31],"and":[32,57,70,76],"signal":[33],"correlation":[34],"eliminated":[36],"by":[37],"introducing":[38],"additional":[39],"dummy":[40],"capacitors,":[41],"leading":[42],"to":[43,55],"fast":[44],"convergence.":[45],"increases":[48],"the":[49],"signal-to-noise-and-distortion":[50],"ratio":[51],"(SNDR)":[52],"from":[53],"64.57dB":[54],"82.03dB":[56],"achieves":[58],"29dB":[59],"spurious-free":[60],"dynamic":[61],"range":[62],"(SFDR)":[63],"improvement.":[64],"simulated":[66],"differential":[67],"nonlinearity":[68,72],"(DNL)":[69],"integral":[71],"(INL)":[73],"are":[74],"+0.17/-0.13LSB":[75],"+0.36/-0.38LSB":[77],"respectively.":[78]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}