{"id":"https://openalex.org/W3128693357","doi":"https://doi.org/10.1109/icta50426.2020.9332055","title":"A Compact On-chip Analog Memory Cell for Storing TOF Image Signal in CMOS Process","display_name":"A Compact On-chip Analog Memory Cell for Storing TOF Image Signal in CMOS Process","publication_year":2020,"publication_date":"2020-11-23","ids":{"openalex":"https://openalex.org/W3128693357","doi":"https://doi.org/10.1109/icta50426.2020.9332055","mag":"3128693357"},"language":"en","primary_location":{"id":"doi:10.1109/icta50426.2020.9332055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta50426.2020.9332055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102223920","display_name":"Zhenhua Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenhua Guo","raw_affiliation_strings":["School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007819355","display_name":"Chao Gu","orcid":"https://orcid.org/0000-0002-9183-7820"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Gu","raw_affiliation_strings":["State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029342902","display_name":"Shuangming Yu","orcid":"https://orcid.org/0000-0001-6678-3886"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuangming Yu","raw_affiliation_strings":["State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100657035","display_name":"Liyuan Liu","orcid":"https://orcid.org/0000-0003-2585-323X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyuan Liu","raw_affiliation_strings":["Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101790217","display_name":"Liu Jian","orcid":"https://orcid.org/0000-0003-2542-3336"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Liu","raw_affiliation_strings":["Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001300641","display_name":"Peng Feng","orcid":"https://orcid.org/0000-0002-7420-2161"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Feng","raw_affiliation_strings":["Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110665174","display_name":"Nanjian Wu","orcid":"https://orcid.org/0000-0001-8022-0262"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nanjian Wu","raw_affiliation_strings":["Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China","State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.24866071,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"84"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.8597022294998169},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6663644909858704},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6538693308830261},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4816074073314667},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.442261278629303},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43464431166648865},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4279305636882782},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4081767797470093},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3651360869407654},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15782177448272705},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12611904740333557}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.8597022294998169},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6663644909858704},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6538693308830261},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4816074073314667},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.442261278629303},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43464431166648865},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4279305636882782},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4081767797470093},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3651360869407654},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15782177448272705},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12611904740333557},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icta50426.2020.9332055","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icta50426.2020.9332055","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309618","display_name":"Ministry of Science and Technology","ror":"https://ror.org/02b207r52"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2007873071","https://openalex.org/W2120067191","https://openalex.org/W2128756882","https://openalex.org/W2997346195"],"related_works":["https://openalex.org/W2730314563","https://openalex.org/W4400386354","https://openalex.org/W2058541779","https://openalex.org/W2120538654","https://openalex.org/W1632369502","https://openalex.org/W2971786152","https://openalex.org/W2288945810","https://openalex.org/W1980639873","https://openalex.org/W2104615293","https://openalex.org/W1557535892"],"abstract_inverted_index":{"This":[0,112],"paper":[1],"designed":[2],"and":[3,41,96,122],"realized":[4,46],"a":[5,48,59,107,119],"3":[6],"<sup":[7,11,72,76],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[8,12,73,77],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">H</sup>":[9,74],"\u00d73":[10],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">V</sup>":[13,78],"CMOS":[14,62],"analog":[15,86,103],"memory":[16,68,93,113],"for":[17],"storing":[18],"TOF":[19],"image":[20],"signal":[21,87,104],"on":[22],"chip.":[23,126],"In":[24],"order":[25],"to":[26,37,118],"achieve":[27],"high-density":[28],"integration,":[29],"NMOS":[30,50],"transistor":[31],"with":[32,47,106],"minimum":[33],"size":[34,65],"is":[35,45,70],"employed":[36],"be":[38,89,116],"the":[39,42,67,85,92,97,101],"switch":[40],"storage":[43],"capacitor":[44],"1.8V":[49],"transistor.":[51],"The":[52,64,80],"prototype":[53],"chip":[54],"has":[55],"been":[56],"fabricated":[57],"in":[58,94],"standard":[60],"0.18\u03bcm":[61],"process.":[63],"of":[66,110],"cell":[69,114],"4\u03bcm":[71],"\u00d74\u03bcm":[75],".":[79],"measurement":[81],"results":[82],"show":[83],"that":[84],"can":[88,115],"written":[90],"into":[91,124],"20ns,":[95],"leakage":[98],"current":[99],"causes":[100],"stored":[102],"reducing":[105],"speed":[108],"value":[109],"0.33mV/ms.":[111],"expanded":[117],"larger":[120],"array":[121],"integrated":[123],"sensor":[125]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}