{"id":"https://openalex.org/W4392945052","doi":"https://doi.org/10.1109/icst59744.2023.10460805","title":"Self-Controlled Robust Digital Readout Circuit for Resistance Measurement: Enhancing Immunity to Circuit Nonidealities","display_name":"Self-Controlled Robust Digital Readout Circuit for Resistance Measurement: Enhancing Immunity to Circuit Nonidealities","publication_year":2023,"publication_date":"2023-12-17","ids":{"openalex":"https://openalex.org/W4392945052","doi":"https://doi.org/10.1109/icst59744.2023.10460805"},"language":"en","primary_location":{"id":"doi:10.1109/icst59744.2023.10460805","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icst59744.2023.10460805","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 16th International Conference on Sensing Technology (ICST)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018627363","display_name":"K Elangovan","orcid":null},"institutions":[{"id":"https://openalex.org/I158338959","display_name":"University of Kerala","ror":"https://ror.org/05tqa9940","country_code":"IN","type":"education","lineage":["https://openalex.org/I158338959"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Elangovan K","raw_affiliation_strings":["Digital University Kerala,School of Electronic Systems and Automation,Thiruvananthapuram,India","School of Electronic Systems and Automation, Digital University Kerala, Thiruvananthapuram, India"],"affiliations":[{"raw_affiliation_string":"Digital University Kerala,School of Electronic Systems and Automation,Thiruvananthapuram,India","institution_ids":["https://openalex.org/I158338959"]},{"raw_affiliation_string":"School of Electronic Systems and Automation, Digital University Kerala, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I158338959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5018627363"],"corresponding_institution_ids":["https://openalex.org/I158338959"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20685317,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9690999984741211,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9613999724388123,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.49445652961730957},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47775545716285706},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.43342190980911255},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42166972160339355},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3677244782447815},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.34921300411224365},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.278353750705719},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11708399653434753}],"concepts":[{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.49445652961730957},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47775545716285706},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.43342190980911255},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42166972160339355},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3677244782447815},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.34921300411224365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.278353750705719},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11708399653434753}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icst59744.2023.10460805","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icst59744.2023.10460805","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 16th International Conference on Sensing Technology (ICST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1038327613","https://openalex.org/W2167287281","https://openalex.org/W2416832952","https://openalex.org/W2725064640","https://openalex.org/W2956435558","https://openalex.org/W2996591577","https://openalex.org/W3004471187","https://openalex.org/W3004543376","https://openalex.org/W3094341528","https://openalex.org/W3120379067","https://openalex.org/W3129173984","https://openalex.org/W4312779272"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2542439796","https://openalex.org/W2356048238","https://openalex.org/W2796521923","https://openalex.org/W4241196849","https://openalex.org/W95651076","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W23143985","https://openalex.org/W2157850428"],"abstract_inverted_index":{"This":[0],"paper":[1,43],"proposes":[2],"a":[3,28,31,65,72,83,121],"self-controlled":[4],"digital":[5,103],"readout":[6,104],"circuit":[7,12,20,52,98,115,125],"for":[8,27,78,129],"resistance":[9],"measurement.":[10],"The":[11,48,62],"offers":[13],"numerous":[14],"advantages,":[15],"such":[16],"as":[17],"independence":[18],"from":[19],"nonidealities,":[21],"the":[22,25,42,51,79,90,96,113,117,123],"elimination":[23],"of":[24,34,50,68,75,95,101],"need":[26],"control":[29],"unit,":[30],"wide":[32],"range":[33],"measurements,":[35],"etc.":[36],"Mathematical":[37],"proofs":[38],"are":[39],"provided":[40],"within":[41],"to":[44,88],"demonstrate":[45],"these":[46],"benefits.":[47],"performance":[49],"is":[53,86,110,126],"validated":[54],"through":[55],"simulation":[56],"and":[57,71,92],"an":[58],"extensive":[59],"experimental":[60],"study.":[61],"results":[63,91],"reveal":[64],"maximum":[66],"nonlinearity":[67],"0.2":[69],"%":[70,77],"relative":[73],"error":[74],"0.4":[76],"proposed":[80,97,114,124],"circuit.":[81],"Additionally,":[82],"comparative":[84],"study":[85],"conducted":[87],"compare":[89],"advantageous":[93],"features":[94],"with":[99],"those":[100],"existing":[102,118],"circuits.":[105],"Through":[106],"various":[107],"analyses,":[108],"it":[109],"determined":[111],"that":[112],"outperforms":[116],"alternatives.":[119],"As":[120],"result,":[122],"highly":[127],"recommended":[128],"near-sensor":[130],"applications.":[131]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}