{"id":"https://openalex.org/W7135053772","doi":"https://doi.org/10.1109/icsrs68021.2025.11422269","title":"Uncertainty-Aware Online Remaining Useful Lifetime Estimation for Power Electronics","display_name":"Uncertainty-Aware Online Remaining Useful Lifetime Estimation for Power Electronics","publication_year":2025,"publication_date":"2025-11-26","ids":{"openalex":"https://openalex.org/W7135053772","doi":"https://doi.org/10.1109/icsrs68021.2025.11422269"},"language":null,"primary_location":{"id":"doi:10.1109/icsrs68021.2025.11422269","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422269","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5128916097","display_name":"Kirill Ivanov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166741","display_name":"University of Klagenfurt","ror":"https://ror.org/05q9m0937","country_code":"AT","type":"education","lineage":["https://openalex.org/I4210166741"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Kirill Ivanov","raw_affiliation_strings":["Informatics Alpen-Adria Universität Klagenfurt,Villach,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Informatics Alpen-Adria Universität Klagenfurt,Villach,Austria","institution_ids":["https://openalex.org/I4210166741"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053273322","display_name":"Horst Lewitschnig","orcid":"https://orcid.org/0000-0002-5752-429X"},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Horst Lewitschnig","raw_affiliation_strings":["Infineon Technologies Austria AG,Villach,Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies Austria AG,Villach,Austria","institution_ids":["https://openalex.org/I4210131793"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.56314303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"157","last_page":"162"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.3416000008583069,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.3416000008583069,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.29100000858306885,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.1031000018119812,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"Uncertainty quantification","score":0.7340999841690063},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.6759999990463257},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5286999940872192},{"id":"https://openalex.org/keywords/heteroscedasticity","display_name":"Heteroscedasticity","score":0.46880000829696655},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4296000003814697},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"Uncertainty analysis","score":0.42669999599456787},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.39879998564720154},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.39640000462532043}],"concepts":[{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.7340999841690063},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.6759999990463257},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.560699999332428},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5317000150680542},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5286999940872192},{"id":"https://openalex.org/C101104100","wikidata":"https://www.wikidata.org/wiki/Q1063540","display_name":"Heteroscedasticity","level":2,"score":0.46880000829696655},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4296000003814697},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.42669999599456787},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.414900004863739},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.39879998564720154},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.39640000462532043},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.38609999418258667},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.3644999861717224},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.34850001335144043},{"id":"https://openalex.org/C103402496","wikidata":"https://www.wikidata.org/wiki/Q1106171","display_name":"Prediction interval","level":2,"score":0.31709998846054077},{"id":"https://openalex.org/C94361409","wikidata":"https://www.wikidata.org/wiki/Q7882500","display_name":"Uncertainty reduction theory","level":2,"score":0.29670000076293945},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.29249998927116394},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.28839999437332153},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.2791999876499176},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.26030001044273376},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2538999915122986}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs68021.2025.11422269","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422269","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1641947315","https://openalex.org/W2033800551","https://openalex.org/W2045186954","https://openalex.org/W2055873761","https://openalex.org/W2064323378","https://openalex.org/W2096904991","https://openalex.org/W2108776657","https://openalex.org/W2155848441","https://openalex.org/W2487340486","https://openalex.org/W2617137613","https://openalex.org/W2768148617","https://openalex.org/W2791694051","https://openalex.org/W2964059111","https://openalex.org/W3106889297","https://openalex.org/W3139170465","https://openalex.org/W4247848308","https://openalex.org/W4248681815","https://openalex.org/W4415042256"],"related_works":[],"abstract_inverted_index":{"Reliable":[0],"uncertainty":[1,21,45,61,69,103,116,151],"quantification":[2,104],"is":[3,66],"essential":[4],"for":[5,154],"remaining":[6],"useful":[7],"lifetime":[8],"(RUL)":[9],"estimation":[10,22],"in":[11,59],"safety-critical":[12],"power":[13,109],"electronics":[14],"applications.":[15],"This":[16],"paper":[17],"presents":[18],"a":[19,32,92],"comprehensive":[20],"framework":[23,141],"that":[24,35,81,114,128],"adapts":[25],"throughout":[26],"the":[27,83],"components":[28],"lifetimes.":[29],"We":[30,90],"propose":[31],"novel":[33],"approach":[34],"combines":[36],"heteroscedastic":[37],"variance":[38,72,98],"modeling,":[39],"adaptive":[40],"prediction":[41,126],"intervals,":[42],"and":[43,51,77,101,134,149],"asymmetric":[44,79],"bounds":[46,80,117],"to":[47,96],"capture":[48],"both":[49],"aleatory":[50],"epistemic":[52],"uncertainties.":[53],"Our":[54],"method":[55],"addresses":[56],"critical":[57],"challenges":[58],"quantifying":[60],"when":[62],"limited":[63],"degradation":[64,111],"data":[65,112],"available,":[67],"adapting":[68],"estimates":[70,152],"as":[71,136],"patterns":[73],"change":[74],"during":[75,131],"degradation,":[76],"providing":[78,147],"reflect":[82],"higher":[84],"risk":[85],"of":[86],"late":[87],"failure":[88],"predictions.":[89],"introduce":[91],"changepoint":[93],"detection":[94],"mechanism":[95],"identify":[97],"regime":[99],"transitions":[100],"adjust":[102],"accordingly.":[105],"Experimental":[106],"validation":[107],"on":[108],"MOSFET":[110],"demonstrates":[113],"our":[115],"achieve":[118],"$94.3":[119],"\\%$":[120],"coverage":[121],"while":[122],"maintaining":[123],"tightness,":[124],"with":[125],"intervals":[127],"appropriately":[129],"widen":[130],"high-uncertainty":[132],"periods":[133],"narrow":[135],"confidence":[137],"increases.":[138],"The":[139],"proposed":[140],"enables":[142],"risk-informed":[143],"maintenance":[144],"decisions":[145],"by":[146],"interpretable":[148],"reliable":[150],"suitable":[153],"edge":[155],"deployment.":[156]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-03-13T00:00:00"}