{"id":"https://openalex.org/W7135064527","doi":"https://doi.org/10.1109/icsrs68021.2025.11422171","title":"Belief Reliability Modeling and Analysis for Motion Accuracy of the UHV DC Disconnector Mechanism","display_name":"Belief Reliability Modeling and Analysis for Motion Accuracy of the UHV DC Disconnector Mechanism","publication_year":2025,"publication_date":"2025-11-26","ids":{"openalex":"https://openalex.org/W7135064527","doi":"https://doi.org/10.1109/icsrs68021.2025.11422171"},"language":null,"primary_location":{"id":"doi:10.1109/icsrs68021.2025.11422171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422171","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030296824","display_name":"Peng Zhou","orcid":"https://orcid.org/0000-0003-1686-6354"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengxiang Zhou","raw_affiliation_strings":["State Grid Corporation of China,DC Technology Center,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Corporation of China,DC Technology Center,Beijing,China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128801739","display_name":"Lechao Hao","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lechao Hao","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051643704","display_name":"Lindong Chai","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lindong Chai","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128817811","display_name":"Shiwei Li","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiwei Li","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128853282","display_name":"Wenhua Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I918919364","display_name":"Switch","ror":"https://ror.org/02yw51758","country_code":"CH","type":"nonprofit","lineage":["https://openalex.org/I918919364"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Wenhua Deng","raw_affiliation_strings":["Hunan changgao high voltage switchgear Co., Ltd.,Technical Department,Changsha,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan changgao high voltage switchgear Co., Ltd.,Technical Department,Changsha,China","institution_ids":["https://openalex.org/I918919364"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5128905686","display_name":"Wei Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["Beihang University,School of Reliability and Systems Engineering,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University,School of Reliability and Systems Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"220","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.5626999735832214,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.5626999735832214,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.17599999904632568,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.052799999713897705,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8208000063896179},{"id":"https://openalex.org/keywords/disconnector","display_name":"Disconnector","score":0.7105000019073486},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.5717999935150146},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5228999853134155},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.47119998931884766},{"id":"https://openalex.org/keywords/motion","display_name":"Motion (physics)","score":0.45329999923706055}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8208000063896179},{"id":"https://openalex.org/C66325886","wikidata":"https://www.wikidata.org/wiki/Q10860300","display_name":"Disconnector","level":3,"score":0.7105000019073486},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.578000009059906},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.5717999935150146},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5228999853134155},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4814000129699707},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.47119998931884766},{"id":"https://openalex.org/C104114177","wikidata":"https://www.wikidata.org/wiki/Q79782","display_name":"Motion (physics)","level":2,"score":0.45329999923706055},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39329999685287476},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.3828999996185303},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3571999967098236},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.31189998984336853},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2728999853134155},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.266400009393692},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.2619999945163727}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs68021.2025.11422171","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422171","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W108774479","https://openalex.org/W2009090842","https://openalex.org/W2030554196","https://openalex.org/W2890424265","https://openalex.org/W3083797856","https://openalex.org/W3173517881"],"related_works":[],"abstract_inverted_index":{"Insufficient":[0],"motion":[1,59,76,118],"accuracy":[2,60,77,119],"in":[3],"the":[4,22,58,75,94,117,121,134,147,159],"operating":[5,124],"mechanism":[6,125,131],"of":[7,61,98,120,165],"an":[8],"Ultra-High":[9],"Voltage":[10],"Direct":[11],"Current":[12],"(UHV":[13],"DC)":[14],"disconnector":[15,123],"can":[16,150],"readily":[17],"lead":[18],"to":[19],"deviations":[20],"from":[21],"intended":[23],"opening/closing":[24],"positions,":[25],"potentially":[26],"triggering":[27],"operational":[28],"failures.":[29],"The":[30,143],"uncertainties":[31,99],"and":[32,39,90,96,103,138,155,162],"performance":[33],"degradation":[34],"prevalent":[35],"during":[36],"both":[37],"manufacturing":[38],"service":[40],"significantly":[41],"impact":[42],"its":[43],"reliability.":[44],"To":[45],"address":[46],"this,":[47],"this":[48],"paper":[49],"proposes":[50],"a":[51,70,113,129,152],"belief":[52],"reliability":[53,114,137,163],"modeling":[54],"method":[55,149],"specifically":[56],"for":[57,73,116,158],"such":[62],"mechanisms,":[63],"based":[64],"on":[65],"Belief":[66],"Reliability":[67],"theory.":[68],"Firstly,":[69],"theoretical":[71,153],"model":[72,115,132],"calculating":[74],"margin":[78],"is":[79,126],"established,":[80],"comprehensively":[81],"considering":[82],"wear,":[83],"dimensional":[84],"errors,":[85],"fitting":[86],"clearances,":[87],"thermal":[88],"deformation,":[89],"elastic":[91],"deformation.":[92],"Secondly,":[93],"sources":[95],"characteristics":[97],"are":[100,107,141],"systematically":[101],"analyzed,":[102],"various":[104],"uncertainty":[105],"factors":[106],"quantified":[108],"using":[109],"probability":[110],"distributions.":[111],"Finally,":[112],"DC":[122,166],"constructed.":[127],"Taking":[128],"specific":[130],"as":[133],"research":[135],"object,":[136],"sensitivity":[139],"analyses":[140],"conducted.":[142],"results":[144],"demonstrate":[145],"that":[146],"proposed":[148],"provide":[151],"basis":[154],"engineering":[156],"guidance":[157],"reliability-forward":[160],"design":[161],"improvement":[164],"isolation":[167],"switches.":[168]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-03-13T00:00:00"}