{"id":"https://openalex.org/W7135142356","doi":"https://doi.org/10.1109/icsrs68021.2025.11422108","title":"Bivariate Reliability Evaluation Based on Semi-parametric Method Considering Degradation Dependencies and Random Effect","display_name":"Bivariate Reliability Evaluation Based on Semi-parametric Method Considering Degradation Dependencies and Random Effect","publication_year":2025,"publication_date":"2025-11-26","ids":{"openalex":"https://openalex.org/W7135142356","doi":"https://doi.org/10.1109/icsrs68021.2025.11422108"},"language":null,"primary_location":{"id":"doi:10.1109/icsrs68021.2025.11422108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422108","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008151442","display_name":"Ye Lu","orcid":"https://orcid.org/0000-0003-3698-5596"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yaohui Lu","raw_affiliation_strings":["Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102969716","display_name":"Rentong Chen","orcid":"https://orcid.org/0000-0002-3264-7189"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rentong Chen","raw_affiliation_strings":["Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128876375","display_name":"Chao Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Zhang","raw_affiliation_strings":["Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128909988","display_name":"Shaoping Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaoping Wang","raw_affiliation_strings":["Beihang University,School of Automation Science and Electrical Engineering,Beijing,China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Automation Science and Electrical Engineering,Beijing,China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128833813","display_name":"Jiahui Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105312","display_name":"Shanghai Power Equipment Research Institute","ror":"https://ror.org/01pw44479","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210105312"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiahui Sun","raw_affiliation_strings":["Research Institute,Shanghai Marine Equipment,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Research Institute,Shanghai Marine Equipment,Shanghai,China","institution_ids":["https://openalex.org/I4210105312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089143394","display_name":"S. Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105312","display_name":"Shanghai Power Equipment Research Institute","ror":"https://ror.org/01pw44479","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210105312"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shanjian Liu","raw_affiliation_strings":["Research Institute,Shanghai Marine Equipment,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Research Institute,Shanghai Marine Equipment,Shanghai,China","institution_ids":["https://openalex.org/I4210105312"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5128909954","display_name":"Songjun Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210105312","display_name":"Shanghai Power Equipment Research Institute","ror":"https://ror.org/01pw44479","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210105312"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Songjun Huang","raw_affiliation_strings":["Research Institute,Shanghai Marine Equipment,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Research Institute,Shanghai Marine Equipment,Shanghai,China","institution_ids":["https://openalex.org/I4210105312"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5008151442"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.75025278,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"532","last_page":"537"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.013700000010430813,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.012500000186264515,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/copula","display_name":"Copula (linguistics)","score":0.583899974822998},{"id":"https://openalex.org/keywords/bivariate-analysis","display_name":"Bivariate analysis","score":0.5662999749183655},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5498999953269958},{"id":"https://openalex.org/keywords/extrapolation","display_name":"Extrapolation","score":0.5493000149726868},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5386000275611877},{"id":"https://openalex.org/keywords/kernel-density-estimation","display_name":"Kernel density estimation","score":0.5327000021934509},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.4334999918937683},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.3637999892234802}],"concepts":[{"id":"https://openalex.org/C17618745","wikidata":"https://www.wikidata.org/wiki/Q207509","display_name":"Copula (linguistics)","level":2,"score":0.583899974822998},{"id":"https://openalex.org/C64341305","wikidata":"https://www.wikidata.org/wiki/Q4919225","display_name":"Bivariate analysis","level":2,"score":0.5662999749183655},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5498999953269958},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.5493000149726868},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5386000275611877},{"id":"https://openalex.org/C71134354","wikidata":"https://www.wikidata.org/wiki/Q458825","display_name":"Kernel density estimation","level":3,"score":0.5327000021934509},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4562000036239624},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4530999958515167},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.4334999918937683},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.3637999892234802},{"id":"https://openalex.org/C18653775","wikidata":"https://www.wikidata.org/wiki/Q1333358","display_name":"Joint probability distribution","level":2,"score":0.351500004529953},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3131999969482422},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.30970001220703125},{"id":"https://openalex.org/C79495835","wikidata":"https://www.wikidata.org/wiki/Q5520315","display_name":"Gamma process","level":2,"score":0.2919999957084656},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.28450000286102295},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2840000092983246},{"id":"https://openalex.org/C168743327","wikidata":"https://www.wikidata.org/wiki/Q1826427","display_name":"Random effects model","level":3,"score":0.28209999203681946},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.27079999446868896},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2662000060081482},{"id":"https://openalex.org/C43555835","wikidata":"https://www.wikidata.org/wiki/Q2300258","display_name":"Conditional probability distribution","level":2,"score":0.2547999918460846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs68021.2025.11422108","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs68021.2025.11422108","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 9th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2972010667","https://openalex.org/W3083869288","https://openalex.org/W3164921741","https://openalex.org/W3200726017","https://openalex.org/W4286001569","https://openalex.org/W4398248577","https://openalex.org/W4399558738","https://openalex.org/W4399915467","https://openalex.org/W4401880138","https://openalex.org/W4406268601","https://openalex.org/W4409579290","https://openalex.org/W4410255855"],"related_works":[],"abstract_inverted_index":{"Accurate":[0],"reliability":[1,52,121,194],"evaluation":[2,53,122],"is":[3,88,111,124,152,162],"a":[4,67,118,143,189],"crucial":[5],"prerequisite":[6],"for":[7,148,192],"the":[8,14,20,30,44,50,92,95,100,105,128,132,138,155,166,171,178,182],"development":[9],"of":[10,16,32,38,43,94,108,159,170],"maintenance":[11,17],"strategies":[12],"and":[13,35,41,57,75,99,131,168],"reduction":[15],"costs.":[18],"However,":[19],"traditional":[21],"parametric":[22],"degradation":[23,39,55,70,73,96,109,198],"modeling":[24],"methods":[25],"are":[26,135],"difficult":[27],"to":[28,90,164],"address":[29,61,91],"challenges":[31],"unknown,":[33],"complex":[34,197],"time-varying":[36],"distribution":[37,98],"increments,":[40],"most":[42],"studies":[45],"have":[46],"not":[47],"fully":[48],"considered":[49],"bivariate":[51,120],"with":[54,72,196],"dependencies":[56,74],"unit-to-unit":[58],"variability.":[59],"To":[60],"above":[62],"issues,":[63],"this":[64],"paper":[65],"proposes":[66],"novel":[68],"semi-parametric":[69,119],"model":[71,123],"random":[76,133],"effect.":[77],"Firstly,":[78],"an":[79],"improved":[80],"log-change":[81],"adaptive":[82],"kernel":[83],"density":[84],"estimation":[85,102,151],"(AKDE)":[86],"method":[87,147,180,187],"developed":[89],"uncertainty":[93],"increment":[97],"boundary":[101],"bias.":[103],"Secondly,":[104],"extrapolation":[106],"prediction":[107,195],"states":[110],"constructed":[112],"based":[113,126],"on":[114,127],"two-dimensional":[115],"AKDE.":[116],"Furthermore,":[117],"established":[125],"copula":[129,139],"function,":[130],"effects":[134],"introduced":[136],"into":[137],"function.":[140],"In":[141],"addition,":[142],"two-stage":[144],"statistical":[145],"inference":[146],"unknown":[149],"parameters":[150],"developed.":[153],"Finally,":[154],"wet-heat":[156],"aging":[157],"experiment":[158],"O-ring":[160],"seals":[161],"used":[163],"verify":[165],"validity":[167],"accuracy":[169],"proposed":[172,179,186],"model.":[173],"The":[174,185],"results":[175],"show":[176],"that":[177],"outperforms":[181],"existing":[183],"models.":[184],"provides":[188],"new":[190],"idea":[191],"component":[193],"mechanisms.":[199]},"counts_by_year":[],"updated_date":"2026-03-13T14:25:03.468858","created_date":"2026-03-13T00:00:00"}