{"id":"https://openalex.org/W4390678156","doi":"https://doi.org/10.1109/icsrs59833.2023.10381378","title":"Reliability Rereasch of a MEMS Flow Sensor with Accelerated Degradation Testing","display_name":"Reliability Rereasch of a MEMS Flow Sensor with Accelerated Degradation Testing","publication_year":2023,"publication_date":"2023-11-22","ids":{"openalex":"https://openalex.org/W4390678156","doi":"https://doi.org/10.1109/icsrs59833.2023.10381378"},"language":"en","primary_location":{"id":"doi:10.1109/icsrs59833.2023.10381378","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs59833.2023.10381378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 7th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011354541","display_name":"Qiaoqiao Kang","orcid":"https://orcid.org/0000-0002-1582-8666"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]},{"id":"https://openalex.org/I1327237609","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934","country_code":"CN","type":"funder","lineage":["https://openalex.org/I1327237609","https://openalex.org/I4210127390"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiaoqiao Kang","raw_affiliation_strings":["Shandong University,Key Laboratory of Laser & Infrared System Ministry of Education,Qingdao,China,266237"],"affiliations":[{"raw_affiliation_string":"Shandong University,Key Laboratory of Laser & Infrared System Ministry of Education,Qingdao,China,266237","institution_ids":["https://openalex.org/I1327237609","https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113482502","display_name":"Yuzhe Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuzhe Lin","raw_affiliation_strings":["School of Information Science and Engineering, Shandong University,Qingdao,China,266237"],"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Shandong University,Qingdao,China,266237","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063350660","display_name":"Jifang Tao","orcid":"https://orcid.org/0000-0003-3706-5599"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jifang Tao","raw_affiliation_strings":["Shandong University, School of Information Science and Engineering, Shandong University,Key Laboratory of Laser & Infrared System Ministry of Education,Qingdao,China,266237"],"affiliations":[{"raw_affiliation_string":"Shandong University, School of Information Science and Engineering, Shandong University,Key Laboratory of Laser & Infrared System Ministry of Education,Qingdao,China,266237","institution_ids":["https://openalex.org/I154099455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011354541"],"corresponding_institution_ids":["https://openalex.org/I1327237609","https://openalex.org/I154099455"],"apc_list":null,"apc_paid":null,"fwci":0.1876,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52151267,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"33","issue":null,"first_page":"88","last_page":"93"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.97079998254776,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9686999917030334,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7772344350814819},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6744405031204224},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.6588868498802185},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5954417586326599},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4811457395553589},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3846726417541504},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20236298441886902},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.11149007081985474},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06175965070724487}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7772344350814819},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6744405031204224},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.6588868498802185},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5954417586326599},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4811457395553589},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3846726417541504},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20236298441886902},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11149007081985474},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06175965070724487},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs59833.2023.10381378","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs59833.2023.10381378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 7th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1963792675","https://openalex.org/W2003848342","https://openalex.org/W2011679445","https://openalex.org/W2039427767","https://openalex.org/W2044430831","https://openalex.org/W2103562298","https://openalex.org/W2113143073","https://openalex.org/W2132401965","https://openalex.org/W2140448201","https://openalex.org/W2146746218","https://openalex.org/W2169820559","https://openalex.org/W2564546022","https://openalex.org/W2736979856","https://openalex.org/W2930990154","https://openalex.org/W3035903860","https://openalex.org/W4206079786","https://openalex.org/W4233010740","https://openalex.org/W4239218596","https://openalex.org/W4285080688","https://openalex.org/W4319225541","https://openalex.org/W4380079548","https://openalex.org/W6788476585"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W1815542355","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"Ensuring":[0],"reliability":[1,28,37,58,195,211],"is":[2,114,186],"a":[3,41,191,210],"key":[4],"aspect":[5],"of":[6,12,40,60,73,94,104,131,159,178,197],"sensor":[7,47,75,124,181],"quality.":[8],"With":[9],"the":[10,27,36,57,85,92,99,111,118,122,129,132,134,140,156,160,173],"advancement":[11],"accelerated":[13,50,183],"degradation":[14,51,184],"testing,":[15],"it":[16],"has":[17],"been":[18],"widely":[19],"applied":[20],"as":[21],"an":[22],"efficient":[23],"strategy":[24],"to":[25,97,102,116],"obtain":[26],"(life)":[29],"information":[30],"on":[31,49,203],"assets.":[32],"In":[33,109],"this":[34,61,83,179,214],"article,":[35],"test":[38],"results":[39],"Micro":[42],"Electro":[43],"Mechanical":[44],"System":[45],"flow":[46,62,74,123,180,215],"based":[48],"testing":[52,185],"are":[53,67,79],"researched.":[54],"Aiming":[55],"at":[56],"problem":[59],"sensor's":[63],"lifetime,":[64],"temperature":[65],"stress":[66],"considered":[68],"accelerating":[69],"conditions.":[70,108],"The":[71,143],"drifts":[72],"chip":[76],"with":[77,182],"and":[78,148,164],"obtained,":[80],"respectively.":[81],"On":[82],"basis,":[84],"Arrhenius":[86],"model":[87,177],"was":[88,168],"used":[89,154],"by":[90],"calculating":[91],"drift":[93],"characteristic":[95],"parameters":[96],"acquire":[98],"mean":[100],"time":[101],"failure)":[103],"assets":[105],"in":[106],"various":[107],"addition,":[110],"Weibull":[112],"Distribution":[113],"proved":[115,171],"be":[117],"better":[119],"mode":[120],"for":[121,194,213],"acceleration":[125],"life.":[126],"To":[127],"verify":[128],"rationality":[130],"distribution,":[133],"Goodness-of-fit":[135],"tests":[136],"were":[137,153],"performed":[138],"using":[139],"residual":[141,145,150,162,166],"method.":[142],"Standard":[144,161],"error":[146,151,163,167],"method":[147,152],"Cox-Snell":[149,165],"separately,":[155],"Anderson-Darling\u201d.":[157],"value":[158],"1.728.":[169],"It":[170],"that":[172],"selected":[174],"life":[175],"distribution":[176],"befitting.":[187],"This":[188],"research":[189],"provides":[190],"good":[192],"way":[193],"analysis":[196],"thermal":[198],"mass":[199],"flowmeter":[200],"units.":[201],"Based":[202],"those":[204],"results,":[205],"we":[206],"could":[207],"set":[208],"up":[209],"database":[212],"sensor.":[216]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}