{"id":"https://openalex.org/W4390678257","doi":"https://doi.org/10.1109/icsrs59833.2023.10381318","title":"How \u201cProtection System\u201d Reliability Differs from \u201cSystem\u201d Reliability and Why It's Important","display_name":"How \u201cProtection System\u201d Reliability Differs from \u201cSystem\u201d Reliability and Why It's Important","publication_year":2023,"publication_date":"2023-11-22","ids":{"openalex":"https://openalex.org/W4390678257","doi":"https://doi.org/10.1109/icsrs59833.2023.10381318"},"language":"en","primary_location":{"id":"doi:10.1109/icsrs59833.2023.10381318","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs59833.2023.10381318","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 7th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017974312","display_name":"Martin Wortman","orcid":"https://orcid.org/0000-0002-0464-4749"},"institutions":[{"id":"https://openalex.org/I193181351","display_name":"Universidad de Guadalajara","ror":"https://ror.org/043xj7k26","country_code":"MX","type":"education","lineage":["https://openalex.org/I193181351"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Martin Wortman","raw_affiliation_strings":["HazTechRisk.Org,Guadalajara,MX","HazTechRisk.Org, Guadalajara, MX"],"raw_orcid":"https://orcid.org/0000-0002-0464-4749","affiliations":[{"raw_affiliation_string":"HazTechRisk.Org,Guadalajara,MX","institution_ids":["https://openalex.org/I193181351"]},{"raw_affiliation_string":"HazTechRisk.Org, Guadalajara, MX","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052515438","display_name":"Ernie Kee","orcid":"https://orcid.org/0000-0001-9283-064X"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ernie Kee","raw_affiliation_strings":["NPRE (University of Illinois at Urbana Champaign),Katy,USA","NPRE (University of Illinois at Urbana Champaign), Katy, USA"],"raw_orcid":"https://orcid.org/0000-0001-9283-064X","affiliations":[{"raw_affiliation_string":"NPRE (University of Illinois at Urbana Champaign),Katy,USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"NPRE (University of Illinois at Urbana Champaign), Katy, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012661276","display_name":"Pranav Kannan","orcid":"https://orcid.org/0000-0003-0726-4116"},"institutions":[{"id":"https://openalex.org/I4210094823","display_name":"Comtech Telecommunications (United States)","ror":"https://ror.org/00jjd3f53","country_code":"US","type":"company","lineage":["https://openalex.org/I4210094823"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pranav Kannan","raw_affiliation_strings":["HazTechRisk.Org,Stockholm,SE","HazTechRisk.Org, Stockholm, SE"],"raw_orcid":"https://orcid.org/0000-0003-0726-4116","affiliations":[{"raw_affiliation_string":"HazTechRisk.Org,Stockholm,SE","institution_ids":["https://openalex.org/I4210094823"]},{"raw_affiliation_string":"HazTechRisk.Org, Stockholm, SE","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5017974312"],"corresponding_institution_ids":["https://openalex.org/I193181351"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19531575,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"40","issue":null,"first_page":"29","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10243","display_name":"Statistical Methods and Bayesian Inference","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10243","display_name":"Statistical Methods and Bayesian Inference","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9713000059127808,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11720","display_name":"Probability and Risk Models","score":0.9682000279426575,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7145366072654724},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6876842379570007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5457786917686462},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4626646041870117},{"id":"https://openalex.org/keywords/system-integrity","display_name":"System integrity","score":0.4164888262748718},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.40537747740745544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2877015471458435},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.10204407572746277}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7145366072654724},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6876842379570007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5457786917686462},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4626646041870117},{"id":"https://openalex.org/C2777499013","wikidata":"https://www.wikidata.org/wiki/Q7663719","display_name":"System integrity","level":2,"score":0.4164888262748718},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.40537747740745544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2877015471458435},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.10204407572746277},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs59833.2023.10381318","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs59833.2023.10381318","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 7th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W615510159","https://openalex.org/W1582706191","https://openalex.org/W2125569171","https://openalex.org/W3125018083","https://openalex.org/W3161085253","https://openalex.org/W4211215604","https://openalex.org/W4235251642","https://openalex.org/W4287194311","https://openalex.org/W4313621239"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"There":[0],"is":[1,7],"an":[2],"important":[3],"operational":[4],"characteristic":[5],"that":[6,67],"nearly":[8],"unique":[9],"to":[10,18,20,37,44,54],"protection":[11,39,57,74],"systems:":[12],"Protection":[13],"systems":[14,28],"are":[15,29],"specifically":[16],"designed":[17],"respond":[19],"initiating":[21],"events,":[22],"whereas":[23],"most":[24],"other":[25],"types":[26],"of":[27],"not.":[30],"We":[31,42,64],"expose":[32],"some":[33],"analytical":[34],"details":[35],"needed":[36],"characterize":[38],"system":[40,58,75],"reliability.":[41],"appeal":[43],"well":[45],"established":[46],"results":[47],"from":[48],"martingale":[49],"calculus":[50],"for":[51,77],"counting":[52],"processes":[53],"explain":[55],"why":[56],"reliability":[59,76],"often":[60],"defies":[61],"numerical":[62],"quantification.":[63],"will":[65],"conclude":[66],"caution":[68],"must":[69],"be":[70],"exercised":[71],"when":[72],"studying":[73],"regulatory":[78],"and/or":[79],"engineering":[80],"design":[81],"purposes.":[82]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}