{"id":"https://openalex.org/W4352981575","doi":"https://doi.org/10.1109/icsrs56243.2022.10067300","title":"Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network","display_name":"Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network","publication_year":2022,"publication_date":"2022-11-23","ids":{"openalex":"https://openalex.org/W4352981575","doi":"https://doi.org/10.1109/icsrs56243.2022.10067300"},"language":"en","primary_location":{"id":"doi:10.1109/icsrs56243.2022.10067300","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs56243.2022.10067300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 6th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058567697","display_name":"Mohammad N. Juybari","orcid":"https://orcid.org/0000-0001-7862-3919"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I170013655","display_name":"Isfahan University of Technology","ror":"https://ror.org/00af3sa43","country_code":"IR","type":"education","lineage":["https://openalex.org/I170013655"]}],"countries":["IR","IT"],"is_corresponding":true,"raw_author_name":"Mohammad N. Juybari","raw_affiliation_strings":["Isfahan University of Technology,Department of Industrial and Systems Engineering,Isfahan,Iran","Department of Industrial and Systems Engineering, Isfahan University of Technology, Isfahan, Iran","Energy Department, Politecnico di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Isfahan University of Technology,Department of Industrial and Systems Engineering,Isfahan,Iran","institution_ids":["https://openalex.org/I170013655"]},{"raw_affiliation_string":"Department of Industrial and Systems Engineering, Isfahan University of Technology, Isfahan, Iran","institution_ids":["https://openalex.org/I170013655"]},{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104081888","display_name":"Ibrahim Ahmed","orcid":"https://orcid.org/0000-0001-7814-5152"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ibrahim Ahmed","raw_affiliation_strings":["Politecnico di Milano,Energy Department,Milan,Italy","Energy Department, Politecnico di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Energy Department,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048799305","display_name":"Piero Baraldi","orcid":"https://orcid.org/0000-0003-4232-4161"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Piero Baraldi","raw_affiliation_strings":["Politecnico di Milano,Energy Department,Milan,Italy","Energy Department, Politecnico di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Energy Department,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050360084","display_name":"Alejandro Del Cueto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alejandro Del Cueto","raw_affiliation_strings":["BSH Electrodomésticos España,Spain"],"affiliations":[{"raw_affiliation_string":"BSH Electrodomésticos España,Spain","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056892539","display_name":"Javier Gil","orcid":"https://orcid.org/0000-0002-9084-8392"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Javier Gil","raw_affiliation_strings":["BSH Electrodomésticos España,Spain"],"affiliations":[{"raw_affiliation_string":"BSH Electrodomésticos España,Spain","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079268462","display_name":"Chenyang Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Chenyang Lai","raw_affiliation_strings":["Politecnico di Milano,Energy Department,Milan,Italy","Energy Department, Politecnico di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Energy Department,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109361758","display_name":"Sergio Llorente","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sergio Llorente","raw_affiliation_strings":["BSH Electrodomésticos España,Spain"],"affiliations":[{"raw_affiliation_string":"BSH Electrodomésticos España,Spain","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012431211","display_name":"Enrico Zio","orcid":"https://orcid.org/0000-0002-7108-637X"},"institutions":[{"id":"https://openalex.org/I4403386560","display_name":"Centre de Recherche sur les Risques et les Crises","ror":"https://ror.org/05p7zpp88","country_code":null,"type":"facility","lineage":["https://openalex.org/I190752583","https://openalex.org/I2746051580","https://openalex.org/I4403386560","https://openalex.org/I70768539"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zio","raw_affiliation_strings":["Politecnico di Milano,Energy Department,Milan,Italy","Energy Department, Politecnico di Milano, Milan, Italy","MINES Paris-PSL, Centre de Recherche sur les Risques et les Crises (CRC), Sophia Antipolis, France"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,Energy Department,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Energy Department, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"MINES Paris-PSL, Centre de Recherche sur les Risques et les Crises (CRC), Sophia Antipolis, France","institution_ids":["https://openalex.org/I4403386560"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5058567697"],"corresponding_institution_ids":["https://openalex.org/I170013655","https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13644553,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"7","issue":null,"first_page":"259","last_page":"263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.9588999152183533},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6671279668807983},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.5918501615524292},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.5871919989585876},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.5706486701965332},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5003316402435303},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47179025411605835},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41622602939605713},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3869575560092926},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.3704068660736084},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2799376845359802},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24406710267066956},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2370801866054535},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19359427690505981},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07657688856124878}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.9588999152183533},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6671279668807983},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.5918501615524292},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.5871919989585876},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.5706486701965332},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5003316402435303},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47179025411605835},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41622602939605713},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3869575560092926},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.3704068660736084},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2799376845359802},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24406710267066956},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2370801866054535},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19359427690505981},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07657688856124878},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsrs56243.2022.10067300","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icsrs56243.2022.10067300","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 6th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1260206","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/10067300","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W140777655","https://openalex.org/W1522301498","https://openalex.org/W2091204867","https://openalex.org/W2098749003","https://openalex.org/W2105464873","https://openalex.org/W2153110463","https://openalex.org/W2163922914","https://openalex.org/W2292795182","https://openalex.org/W2760217853","https://openalex.org/W2893196123","https://openalex.org/W2900529838","https://openalex.org/W2902371880","https://openalex.org/W2982172966","https://openalex.org/W3048593937","https://openalex.org/W3095295241","https://openalex.org/W3171119763","https://openalex.org/W4200222469","https://openalex.org/W4385873176","https://openalex.org/W6631190155"],"related_works":["https://openalex.org/W2941586664","https://openalex.org/W2026438159","https://openalex.org/W2952153532","https://openalex.org/W3211169310","https://openalex.org/W4285161724","https://openalex.org/W2973352049","https://openalex.org/W2894661039","https://openalex.org/W2995312372","https://openalex.org/W2587344013","https://openalex.org/W4386863821"],"abstract_inverted_index":{"One":[0],"of":[1,6,32,74,82,99,110,123,127,139],"the":[2,11,16,29,39,49,53,67,72,75,79,97,124,137],"most":[3],"common":[4],"causes":[5],"failures":[7],"in":[8,56],"inverters":[9,109],"is":[10,35,89,105],"thermal":[12,40],"stress":[13,41],"acting":[14],"on":[15,136],"Insulated":[17],"Gate":[18],"Bipolar":[19],"Transistors":[20],"(IGBT).":[21],"This":[22],"work":[23],"develops":[24],"a":[25,85,93,100,130,140,144],"model":[26,54,104],"to":[27,108],"estimate":[28],"case":[30,68,125],"temperature":[31,69,126],"IGBT,":[33],"which":[34],"directly":[36],"correlated":[37],"with":[38],"and":[42,63,78,143],"can,":[43],"therefore,":[44],"be":[45],"used":[46],"for":[47],"monitoring":[48],"IGBT":[50,128],"degradation.":[51],"Specifically,":[52],"receives":[55],"input":[57],"electric":[58],"signals":[59],"measured":[60,83],"by":[61,91],"sensors":[62],"produces":[64],"as":[65],"output":[66],"estimation.":[70],"Considering":[71],"complexity":[73],"input-output":[76],"relationship":[77],"large":[80],"number":[81],"signals,":[84],"deep":[86],"neural":[87,145],"network":[88],"built":[90],"adding":[92],"classification":[94],"layer":[95],"at":[96],"top":[98],"stacked":[101],"auto-encoder.":[102],"The":[103,113],"successfully":[106],"applied":[107],"industrial":[111],"cooktops.":[112],"obtained":[114],"results":[115],"show":[116],"that":[117],"it":[118],"provides":[119],"more":[120],"accurate":[121],"estimates":[122],"than":[129],"wrapper":[131],"feature":[132],"selection":[133],"method":[134],"based":[135],"combination":[138],"Genetic":[141],"algorithm":[142],"network.":[146]},"counts_by_year":[],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}