{"id":"https://openalex.org/W3005815010","doi":"https://doi.org/10.1109/icsrs48664.2019.8987723","title":"Natural Reliability Growth Trend Test Application on Electromechanical System","display_name":"Natural Reliability Growth Trend Test Application on Electromechanical System","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3005815010","doi":"https://doi.org/10.1109/icsrs48664.2019.8987723","mag":"3005815010"},"language":"en","primary_location":{"id":"doi:10.1109/icsrs48664.2019.8987723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs48664.2019.8987723","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100375520","display_name":"Xiaobing Li","orcid":"https://orcid.org/0000-0001-9105-6365"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaobing Li","raw_affiliation_strings":["Reliability and Environmental Engineering Center, China Electrionic Product Reliability and Environment, Tseting Research Institute, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Reliability and Environmental Engineering Center, China Electrionic Product Reliability and Environment, Tseting Research Institute, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047299277","display_name":"Mingxi Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxi Cai","raw_affiliation_strings":["Reliability and Environmental Engineering Center, China Electrionic Product Reliability and Environment, Tseting Research Institute, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Reliability and Environmental Engineering Center, China Electrionic Product Reliability and Environment, Tseting Research Institute, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103795594","display_name":"Jingyan Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyan Guo","raw_affiliation_strings":["College of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Aerospace Engineering, Jilin University, Changchun, China","institution_ids":["https://openalex.org/I194450716"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108973453","display_name":"Xiaocui Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I194450716","display_name":"Jilin University","ror":"https://ror.org/00js3aw79","country_code":"CN","type":"education","lineage":["https://openalex.org/I194450716"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaocui Zhu","raw_affiliation_strings":["College of Mechanical and Aerospace Engineering, Jilin University, Changchun, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Aerospace Engineering, Jilin University, Changchun, China","institution_ids":["https://openalex.org/I194450716"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100375520"],"corresponding_institution_ids":["https://openalex.org/I4210113818"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27007459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"35","issue":null,"first_page":"441","last_page":"445"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","score":0.9495000243186951,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14474","display_name":"Industrial Technology and Control Systems","score":0.9455999732017517,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7255113124847412},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5686004161834717},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5583291053771973},{"id":"https://openalex.org/keywords/laplace-transform","display_name":"Laplace transform","score":0.5356734395027161},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5158345103263855},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4528749883174896},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.265362024307251},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1788579821586609},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09048795700073242}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7255113124847412},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5686004161834717},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5583291053771973},{"id":"https://openalex.org/C97937538","wikidata":"https://www.wikidata.org/wiki/Q199691","display_name":"Laplace transform","level":2,"score":0.5356734395027161},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5158345103263855},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4528749883174896},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.265362024307251},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1788579821586609},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09048795700073242},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs48664.2019.8987723","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs48664.2019.8987723","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1970744281","https://openalex.org/W2010007205","https://openalex.org/W2079433789","https://openalex.org/W2099637351","https://openalex.org/W2372114151","https://openalex.org/W2381157177","https://openalex.org/W2564543893","https://openalex.org/W2892109785","https://openalex.org/W4230363894","https://openalex.org/W6708605713"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Aiming":[0],"at":[1],"the":[2,9,17,29,34,37,42,59,62,68,71,75,80,85,88],"problem":[3],"of":[4,13,23,61,70,84,87],"reliability":[5,86],"growth":[6,25,82],"trend":[7,83],"in":[8],"early":[10],"use":[11],"stage":[12],"complex":[14],"electromechanical":[15,89],"systems,":[16,33],"graphical":[18],"method":[19,22,40,46,73,77],"and":[20,31,41,74],"analytical":[21,76],"natural":[24,81],"are":[26,47],"analyzed.":[27],"For":[28],"single":[30],"multiple":[32],"graphic":[35,72],"method,":[36,64],"Laplace":[38],"test":[39,45,63,79],"Duane":[43],"model":[44],"analyzed":[48],"respectively.":[49],"At":[50],"last,":[51],"he":[52],"case":[53],"example":[54],"is":[55],"given":[56],"to":[57],"verify":[58],"application":[60],"which":[65],"shows":[66],"that":[67],"combination":[69],"can":[78],"system":[90],"effectively.":[91]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}