{"id":"https://openalex.org/W3005885173","doi":"https://doi.org/10.1109/icsrs48664.2019.8987614","title":"Reliability of Systems with Simultaneous and Consecutive Failures","display_name":"Reliability of Systems with Simultaneous and Consecutive Failures","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3005885173","doi":"https://doi.org/10.1109/icsrs48664.2019.8987614","mag":"3005885173"},"language":"en","primary_location":{"id":"doi:10.1109/icsrs48664.2019.8987614","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs48664.2019.8987614","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109348901","display_name":"Tetsushi Yuge","orcid":null},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tetsushi Yuge","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, National Defense Academy, Yokosuka, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109348901"],"corresponding_institution_ids":["https://openalex.org/I443798"],"apc_list":null,"apc_paid":null,"fwci":0.4345,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66656703,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"102","last_page":"106"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7921433448791504},{"id":"https://openalex.org/keywords/homogeneous","display_name":"Homogeneous","score":0.6848846673965454},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6359405517578125},{"id":"https://openalex.org/keywords/shock","display_name":"Shock (circulatory)","score":0.6229773163795471},{"id":"https://openalex.org/keywords/common-cause-failure","display_name":"Common cause failure","score":0.6049820780754089},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5846588611602783},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43945837020874023},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4367353618144989},{"id":"https://openalex.org/keywords/common-cause-and-special-cause","display_name":"Common cause and special cause","score":0.3270341753959656},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2437131106853485},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2369753122329712},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.1914220154285431},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1507645845413208},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14086374640464783},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.12241899967193604},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.05451151728630066}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7921433448791504},{"id":"https://openalex.org/C66882249","wikidata":"https://www.wikidata.org/wiki/Q169336","display_name":"Homogeneous","level":2,"score":0.6848846673965454},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6359405517578125},{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.6229773163795471},{"id":"https://openalex.org/C2987613727","wikidata":"https://www.wikidata.org/wiki/Q280951","display_name":"Common cause failure","level":3,"score":0.6049820780754089},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5846588611602783},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43945837020874023},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4367353618144989},{"id":"https://openalex.org/C14396502","wikidata":"https://www.wikidata.org/wiki/Q280951","display_name":"Common cause and special cause","level":2,"score":0.3270341753959656},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2437131106853485},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2369753122329712},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.1914220154285431},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1507645845413208},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14086374640464783},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.12241899967193604},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.05451151728630066},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsrs48664.2019.8987614","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsrs48664.2019.8987614","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 4th International Conference on System Reliability and Safety (ICSRS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1760712508","https://openalex.org/W1984663815","https://openalex.org/W2014061024","https://openalex.org/W2023252602","https://openalex.org/W2030694062","https://openalex.org/W2072430699","https://openalex.org/W2079978318","https://openalex.org/W2125697860","https://openalex.org/W2138020242","https://openalex.org/W2146354455","https://openalex.org/W2518056206","https://openalex.org/W2772831224","https://openalex.org/W4255988776"],"related_works":["https://openalex.org/W1569775171","https://openalex.org/W1995562756","https://openalex.org/W1998088117","https://openalex.org/W2349930626","https://openalex.org/W75249056","https://openalex.org/W2152803417","https://openalex.org/W2026715393","https://openalex.org/W4229727575","https://openalex.org/W2165581543","https://openalex.org/W4241298660"],"abstract_inverted_index":{"A":[0],"new":[1],"non-homogeneous":[2],"shock":[3,29],"model":[4,103],"for":[5],"common-cause":[6,40,59],"failure":[7],"analysis":[8],"is":[9,83,95],"proposed":[10],"in":[11,104],"this":[12],"paper.":[13],"The":[14,80,93],"reliability":[15,94],"of":[16,49,52,75,88,99],"a":[17,22,89],"k-out-of-":[18,24,90],"n":[19,25,91],"system":[20,26],"and":[21,30,70],"consecutive":[23,71],"subjected":[27],"to":[28,44,85,97],"considering":[31],"the":[32,47,50,56,63,73,86,100],"simultaneous":[33],"failures":[34,38,41,60],"are":[35,42,78],"discussed.":[36],"Component":[37],"including":[39],"assumed":[43],"occur":[45,61],"as":[46],"result":[48],"occurrence":[51],"external":[53],"shocks.":[54],"With":[55],"assumption":[57],"that":[58,98],"within":[62],"components":[64],"located":[65],"close":[66],"each":[67],"other":[68],"(simultaneous":[69],"failure),":[72],"reliabilities":[74],"redundant":[76],"systems":[77],"derived.":[79],"signed":[81],"domination":[82],"applied":[84],"formulation":[87],"system.":[92],"compared":[96],"conventional":[101],"homogeneous":[102],"numerical":[105],"example.":[106]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-25T21:42:39.735039","created_date":"2025-10-10T00:00:00"}