{"id":"https://openalex.org/W4405907476","doi":"https://doi.org/10.1109/icspis63676.2024.10812636","title":"Performance Evaluation of Deep Learning Models for Real-Time Trash Classification on Embedded Devices","display_name":"Performance Evaluation of Deep Learning Models for Real-Time Trash Classification on Embedded Devices","publication_year":2024,"publication_date":"2024-11-12","ids":{"openalex":"https://openalex.org/W4405907476","doi":"https://doi.org/10.1109/icspis63676.2024.10812636"},"language":"en","primary_location":{"id":"doi:10.1109/icspis63676.2024.10812636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icspis63676.2024.10812636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 7th International Conference on Signal Processing and Information Security (ICSPIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Abduselam Ahmed","orcid":null},"institutions":[{"id":"https://openalex.org/I119744171","display_name":"Higher Colleges of Technology","ror":"https://ror.org/00qmy9z88","country_code":"AE","type":"education","lineage":["https://openalex.org/I119744171"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Abduselam Ahmed","raw_affiliation_strings":["Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE","institution_ids":["https://openalex.org/I119744171"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fanuel Petros","orcid":null},"institutions":[{"id":"https://openalex.org/I119744171","display_name":"Higher Colleges of Technology","ror":"https://ror.org/00qmy9z88","country_code":"AE","type":"education","lineage":["https://openalex.org/I119744171"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Fanuel Petros","raw_affiliation_strings":["Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE","institution_ids":["https://openalex.org/I119744171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5115709714","display_name":"Tomas Yemane","orcid":null},"institutions":[{"id":"https://openalex.org/I119744171","display_name":"Higher Colleges of Technology","ror":"https://ror.org/00qmy9z88","country_code":"AE","type":"education","lineage":["https://openalex.org/I119744171"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Tomas Yemane","raw_affiliation_strings":["Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE","institution_ids":["https://openalex.org/I119744171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030240114","display_name":"Farid Flitti","orcid":"https://orcid.org/0000-0002-2480-2580"},"institutions":[{"id":"https://openalex.org/I119744171","display_name":"Higher Colleges of Technology","ror":"https://ror.org/00qmy9z88","country_code":"AE","type":"education","lineage":["https://openalex.org/I119744171"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Farid Flitti","raw_affiliation_strings":["Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE","institution_ids":["https://openalex.org/I119744171"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114525847","display_name":"Yassine Benachour","orcid":null},"institutions":[{"id":"https://openalex.org/I119744171","display_name":"Higher Colleges of Technology","ror":"https://ror.org/00qmy9z88","country_code":"AE","type":"education","lineage":["https://openalex.org/I119744171"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Yassine Benachour","raw_affiliation_strings":["Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Higher Colleges of Technology,Faculty of Engineering,Fujairah,UAE","institution_ids":["https://openalex.org/I119744171"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2207,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.82791363,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6304000020027161,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6304000020027161,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.5597000122070312,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.531000018119812,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.7192566990852356},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6876500844955444},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6185581088066101},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.455021470785141}],"concepts":[{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.7192566990852356},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6876500844955444},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6185581088066101},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.455021470785141}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icspis63676.2024.10812636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icspis63676.2024.10812636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 7th International Conference on Signal Processing and Information Security (ICSPIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2194775991","https://openalex.org/W2913865807","https://openalex.org/W2946948417","https://openalex.org/W2963163009","https://openalex.org/W2963446712","https://openalex.org/W2969580507","https://openalex.org/W3169624626","https://openalex.org/W3199194340","https://openalex.org/W4392111897"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W2961085424","https://openalex.org/W3215138031","https://openalex.org/W4306674287","https://openalex.org/W3009238340","https://openalex.org/W4360585206","https://openalex.org/W4321369474","https://openalex.org/W4285208911","https://openalex.org/W4387369504","https://openalex.org/W3046775127"],"abstract_inverted_index":{"Trash":[0],"classification":[1,47,111],"represents":[2],"a":[3,72,98,151,166],"significant":[4],"challenge":[5],"in":[6,188],"waste":[7,80],"recycling":[8],"industry,":[9],"leading":[10],"often":[11],"to":[12,15,78,184],"contamination":[13],"due":[14],"manual":[16],"misclassification":[17],"of":[18,118,123,169],"recyclable":[19],"and":[20,31,53,87,95,105,115,206],"non-recyclable":[21],"items.":[22],"This":[23,69],"arises":[24],"because":[25],"human":[26],"judgment":[27],"relies":[28],"on":[29,35,50,64,97,145,180],"experience":[30],"knowledge":[32],"rather":[33],"than":[34],"objective":[36],"criteria.":[37],"To":[38],"address":[39],"this":[40,189],"issue":[41],"many":[42],"scholars":[43],"have":[44,60],"proposed":[45],"automated":[46],"systems":[48],"based":[49,144],"machine":[51],"learning":[52,55],"deep":[54],"(DL).":[56],"All":[57],"these":[58,124],"works":[59],"not":[61],"been":[62],"tested":[63],"real":[65,215],"time":[66,114,216],"embedded":[67,181],"systems.":[68],"paper":[70],"proposes":[71],"comparison":[73],"between":[74],"several":[75],"DL":[76,91],"models":[77,125,174],"categorize":[79],"into":[81],"cardboard,":[82],"plastic,":[83],"glass,":[84],"metal,":[85],"paper,":[86],"general":[88],"trash.":[89],"Several":[90],"architectures":[92],"were":[93,126,175],"retrained":[94],"implemented":[96],"Raspberry":[99],"Pi,":[100],"i.e.,":[101,110],"MobileNet,":[102],"ResNet,":[103],"EfficientNet,":[104],"DenseNet":[106,159],"models.":[107],"The":[108,133],"performance,":[109],"accuracy,":[112],"inference":[113],"maximum":[116],"number":[117],"frames":[119],"per":[120],"second":[121],"(FPS)":[122],"evaluated":[127,176],"using":[128],"the":[129,141,161,173,185,193,201,211],"TrashNet":[130],"dataset":[131],"[4].":[132],"obtained":[134],"results":[135],"demonstrate":[136],"that":[137],"EfficientNet":[138,198,208],"B3":[139,209],"achieved":[140,160],"best":[142,212],"performance":[143,163,179],"compared":[146],"parameters":[147,164],"as":[148,150],"well":[149],"testing":[152],"accuracy":[153,168,205],"at":[154,195],"about":[155],"$86":[156],"\\%$,":[157],"while":[158,197],"lowest":[162],"with":[165],"low":[167],"$79":[170],"\\%$.":[171],"Additionally,":[172],"for":[177,214],"their":[178],"devices.":[182],"According":[183],"experiment":[186],"conducted":[187],"work,":[190],"MobileNetV2":[191],"was":[192,200],"fastest":[194],"classification,":[196],"B7":[199],"slowest.":[202],"Considering":[203],"both":[204],"speed,":[207],"is":[210],"model":[213],"applications.":[217]},"counts_by_year":[{"year":2025,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}