{"id":"https://openalex.org/W4312780397","doi":"https://doi.org/10.1109/icspcc55723.2022.9984538","title":"Evaluation Method of Fault Detection Rate of Avionics Equipment Based on Data Fusion","display_name":"Evaluation Method of Fault Detection Rate of Avionics Equipment Based on Data Fusion","publication_year":2022,"publication_date":"2022-10-25","ids":{"openalex":"https://openalex.org/W4312780397","doi":"https://doi.org/10.1109/icspcc55723.2022.9984538"},"language":"en","primary_location":{"id":"doi:10.1109/icspcc55723.2022.9984538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icspcc55723.2022.9984538","pdf_url":null,"source":{"id":"https://openalex.org/S4363608295","display_name":"2022 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055024212","display_name":"Tao Ma","orcid":"https://orcid.org/0000-0001-6248-7174"},"institutions":[{"id":"https://openalex.org/I4210095084","display_name":"Zhongji Test Equipment (China)","ror":"https://ror.org/00p24re17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210095084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Ma","raw_affiliation_strings":["Chinese Flight Test Establishment,Xi'an,China","Chinese Flight Test Establishment, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Flight Test Establishment,Xi'an,China","institution_ids":["https://openalex.org/I4210095084"]},{"raw_affiliation_string":"Chinese Flight Test Establishment, Xi'an, China","institution_ids":["https://openalex.org/I4210095084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030211122","display_name":"Chengyu Ju","orcid":null},"institutions":[{"id":"https://openalex.org/I4210095084","display_name":"Zhongji Test Equipment (China)","ror":"https://ror.org/00p24re17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210095084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengyu Ju","raw_affiliation_strings":["Chinese Flight Test Establishment,Xi'an,China","Chinese Flight Test Establishment, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Flight Test Establishment,Xi'an,China","institution_ids":["https://openalex.org/I4210095084"]},{"raw_affiliation_string":"Chinese Flight Test Establishment, Xi'an, China","institution_ids":["https://openalex.org/I4210095084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022210839","display_name":"Hongjiao Wu","orcid":"https://orcid.org/0000-0002-6088-1941"},"institutions":[{"id":"https://openalex.org/I4210095084","display_name":"Zhongji Test Equipment (China)","ror":"https://ror.org/00p24re17","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210095084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongjiao Wu","raw_affiliation_strings":["Chinese Flight Test Establishment,Xi'an,China","Chinese Flight Test Establishment, Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Flight Test Establishment,Xi'an,China","institution_ids":["https://openalex.org/I4210095084"]},{"raw_affiliation_string":"Chinese Flight Test Establishment, Xi'an, China","institution_ids":["https://openalex.org/I4210095084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210095084"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23616422,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.642799973487854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.642799973487854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.6057000160217285,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.59170001745224,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.9154118895530701},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.9142212271690369},{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.8867926597595215},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.809149980545044},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.584658682346344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47627562284469604},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45203933119773865},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4376530945301056},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4342101216316223},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4276007413864136}],"concepts":[{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.9154118895530701},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.9142212271690369},{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.8867926597595215},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.809149980545044},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.584658682346344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47627562284469604},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45203933119773865},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4376530945301056},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4342101216316223},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4276007413864136},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icspcc55723.2022.9984538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icspcc55723.2022.9984538","pdf_url":null,"source":{"id":"https://openalex.org/S4363608295","display_name":"2022 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2162042417","https://openalex.org/W4252051740","https://openalex.org/W4300462940"],"related_works":["https://openalex.org/W2104432131","https://openalex.org/W2033548904","https://openalex.org/W3037788266","https://openalex.org/W1741888674","https://openalex.org/W2130762699","https://openalex.org/W2020766225","https://openalex.org/W1722990666","https://openalex.org/W2186000603","https://openalex.org/W4311345000","https://openalex.org/W2171363312"],"abstract_inverted_index":{"As":[0],"a":[1],"design":[2],"characteristic":[3],"of":[4,9,27,31,38,76,78,92],"weapon":[5,32],"equipment,":[6],"the":[7,12,28,36,49,59,68,89],"testability":[8,46,77,93],"equipment":[10,80],"has":[11,84],"same":[13],"important":[14,25],"position":[15],"as":[16],"reliability,":[17],"maintainability,":[18],"safety":[19],"and":[20,22,66,70],"supportability,":[21],"is":[23,41,81],"an":[24],"component":[26],"quality":[29],"characteristics":[30],"equipment.":[33],"At":[34],"present,":[35],"accuracy":[37],"evaluation":[39],"results":[40],"affected":[42],"due":[43],"to":[44,57,63],"insufficient":[45],"samples":[47],"in":[48],"flight":[50],"test":[51],"stage.":[52],"Therefore,":[53],"this":[54],"paper":[55],"proposes":[56],"use":[58],"data":[60],"fusion":[61],"method":[62],"comprehensively":[64],"process":[65],"analyze":[67],"internal":[69],"external":[71],"field":[72],"data,":[73],"The":[74],"level":[75],"avionics":[79],"given,":[82],"which":[83],"certain":[85],"significance":[86],"for":[87],"guiding":[88],"subsequent":[90],"development":[91],"indicators.":[94]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}