{"id":"https://openalex.org/W1993124123","doi":"https://doi.org/10.1109/icsmc.2010.5641839","title":"Software reliability analysis with optimal release problems based on hazard rate model for an embedded OSS","display_name":"Software reliability analysis with optimal release problems based on hazard rate model for an embedded OSS","publication_year":2010,"publication_date":"2010-10-01","ids":{"openalex":"https://openalex.org/W1993124123","doi":"https://doi.org/10.1109/icsmc.2010.5641839","mag":"1993124123"},"language":"en","primary_location":{"id":"doi:10.1109/icsmc.2010.5641839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsmc.2010.5641839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Systems, Man and Cybernetics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003626021","display_name":"Yoshinobu Tamura","orcid":"https://orcid.org/0000-0001-7665-5765"},"institutions":[{"id":"https://openalex.org/I173915773","display_name":"Yamaguchi University","ror":"https://ror.org/03cxys317","country_code":"JP","type":"education","lineage":["https://openalex.org/I173915773"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yoshinobu Tamura","raw_affiliation_strings":["Graduate School of Science and Engineering, Yamaguchi University, Ube, Japan","Graduate School of Science and Engineering, Yamaguchi University, Tokiwadai 2-16-1, Ube-shi 755-8611, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science and Engineering, Yamaguchi University, Ube, Japan","institution_ids":["https://openalex.org/I173915773"]},{"raw_affiliation_string":"Graduate School of Science and Engineering, Yamaguchi University, Tokiwadai 2-16-1, Ube-shi 755-8611, Japan","institution_ids":["https://openalex.org/I173915773"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036005891","display_name":"Shigeru Yamada","orcid":"https://orcid.org/0000-0001-9998-6938"},"institutions":[{"id":"https://openalex.org/I4588055","display_name":"Tottori University","ror":"https://ror.org/024yc3q36","country_code":"JP","type":"education","lineage":["https://openalex.org/I4588055"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeru Yamada","raw_affiliation_strings":["Graduate School of Engineering, Tottori University, Tottori, Japan","Graduate School of Engineering, Tottori University, Minami 4\u2010101, Koyama, Tottori\u2010shi 680\u20108552, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Tottori University, Tottori, Japan","institution_ids":["https://openalex.org/I4588055"]},{"raw_affiliation_string":"Graduate School of Engineering, Tottori University, Minami 4\u2010101, Koyama, Tottori\u2010shi 680\u20108552, Japan","institution_ids":["https://openalex.org/I4588055"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5003626021"],"corresponding_institution_ids":["https://openalex.org/I173915773"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.14659492,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"720","last_page":"726"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.742485761642456},{"id":"https://openalex.org/keywords/porting","display_name":"Porting","score":0.7278940677642822},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.706305742263794},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6124457120895386},{"id":"https://openalex.org/keywords/android","display_name":"Android (operating system)","score":0.5650233626365662},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.5460500717163086},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.519723653793335},{"id":"https://openalex.org/keywords/software-portability","display_name":"Software portability","score":0.5083464980125427},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4813862144947052},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.4340013861656189},{"id":"https://openalex.org/keywords/avionics-software","display_name":"Avionics software","score":0.4184283912181854},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39128395915031433},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.36991459131240845},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.35403385758399963},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.28812175989151},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16420775651931763}],"concepts":[{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.742485761642456},{"id":"https://openalex.org/C106251023","wikidata":"https://www.wikidata.org/wiki/Q851989","display_name":"Porting","level":3,"score":0.7278940677642822},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.706305742263794},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6124457120895386},{"id":"https://openalex.org/C557433098","wikidata":"https://www.wikidata.org/wiki/Q94","display_name":"Android (operating system)","level":2,"score":0.5650233626365662},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.5460500717163086},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.519723653793335},{"id":"https://openalex.org/C63000827","wikidata":"https://www.wikidata.org/wiki/Q3080428","display_name":"Software portability","level":2,"score":0.5083464980125427},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4813862144947052},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.4340013861656189},{"id":"https://openalex.org/C109905503","wikidata":"https://www.wikidata.org/wiki/Q4828920","display_name":"Avionics software","level":5,"score":0.4184283912181854},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39128395915031433},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.36991459131240845},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.35403385758399963},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.28812175989151},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16420775651931763},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsmc.2010.5641839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsmc.2010.5641839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Systems, Man and Cybernetics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1554758995","https://openalex.org/W1987476382","https://openalex.org/W1987944138","https://openalex.org/W2005227631","https://openalex.org/W2047942970","https://openalex.org/W2050014515","https://openalex.org/W2077433817","https://openalex.org/W2078259272","https://openalex.org/W2112961043","https://openalex.org/W2124503071","https://openalex.org/W2128109125","https://openalex.org/W2153242493","https://openalex.org/W3199869338","https://openalex.org/W6801525357"],"related_works":["https://openalex.org/W1820309981","https://openalex.org/W3124707092","https://openalex.org/W2375332572","https://openalex.org/W28826848","https://openalex.org/W3123383020","https://openalex.org/W2912579397","https://openalex.org/W2152694830","https://openalex.org/W2366100312","https://openalex.org/W2011536307","https://openalex.org/W1496649379"],"abstract_inverted_index":{"An":[0],"OSS":[1,18,67],"(open":[2],"source":[3],"software)":[4],"system":[5,30],"is":[6,55],"frequently":[7],"applied":[8],"as":[9],"server":[10],"use,":[11],"instead":[12],"of":[13,25,41,50,65,83,93,129],"client":[14],"use.":[15],"Especially,":[16],"embedded":[17,29,51,66,84,105,135],"systems":[19],"have":[20],"been":[21],"gaining":[22],"a":[23,69,91,99],"lot":[24],"attention":[26],"in":[27],"the":[28,38,48,61,81,104,115,134,140,146,150],"area,":[31],"i.e.,":[32],"Android,":[33],"BusyBox,":[34],"TRON,":[35],"etc.":[36],"However,":[37],"poor":[39],"handling":[40],"quality":[42],"problem":[43,144],"and":[44,63],"customer":[45],"support":[46],"prohibit":[47,80],"progress":[49,82],"OSS.":[52,85,106,136],"Also,":[53,117],"it":[54],"difficult":[56],"for":[57,103,133,145],"developers":[58],"to":[59,125],"assess":[60],"reliability":[62,95,131],"portability":[64],"on":[68,74,98,149],"single-board":[70],"computer.":[71],"We":[72],"focus":[73],"software":[75,94,121,130,142,153],"quality/reliability":[76],"problems":[77],"that":[78],"can":[79],"In":[86,107],"this":[87],"paper,":[88],"we":[89,109,118,138],"propose":[90],"method":[92],"assessment":[96,112,132],"based":[97,148],"hazard":[100],"rate":[101],"model":[102],"particular,":[108],"derive":[110],"several":[111],"measures":[113],"from":[114],"model.":[116],"analyze":[119],"actual":[120],"failure-occurrence":[122],"time-interval":[123],"data":[124],"show":[126],"numerical":[127],"examples":[128],"Moreover,":[137],"discuss":[139],"optimal":[141],"release":[143],"porting-phase":[147],"total":[151],"expected":[152],"maintenance":[154],"cost.":[155]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}