{"id":"https://openalex.org/W1964370704","doi":"https://doi.org/10.1109/icsm.2007.4362646","title":"Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction","display_name":"Fault Detection Probability Analysis for Coverage-Based Test Suite Reduction","publication_year":2007,"publication_date":"2007-10-01","ids":{"openalex":"https://openalex.org/W1964370704","doi":"https://doi.org/10.1109/icsm.2007.4362646","mag":"1964370704"},"language":"en","primary_location":{"id":"doi:10.1109/icsm.2007.4362646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsm.2007.4362646","pdf_url":null,"source":{"id":"https://openalex.org/S4210174939","display_name":"Proceedings/Proceedings - Conference on Software Maintenance","issn_l":"1063-6773","issn":["1063-6773","2576-3148"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Conference on Software Maintenance","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035549102","display_name":"Scott McMaster","orcid":null},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Scott McMaster","raw_affiliation_strings":["University of Maryland, College Park, MD, USA","University of Maryland, College Park"],"affiliations":[{"raw_affiliation_string":"University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"University of Maryland, College Park","institution_ids":["https://openalex.org/I66946132"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103489081","display_name":"Atif M. Memon","orcid":null},"institutions":[{"id":"https://openalex.org/I66946132","display_name":"University of Maryland, College Park","ror":"https://ror.org/047s2c258","country_code":"US","type":"education","lineage":["https://openalex.org/I66946132"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Atif Memon","raw_affiliation_strings":["University of Maryland, College Park, MD, USA","University of Maryland, College Park"],"affiliations":[{"raw_affiliation_string":"University of Maryland, College Park, MD, USA","institution_ids":["https://openalex.org/I66946132"]},{"raw_affiliation_string":"University of Maryland, College Park","institution_ids":["https://openalex.org/I66946132"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5035549102"],"corresponding_institution_ids":["https://openalex.org/I66946132"],"apc_list":null,"apc_paid":null,"fwci":2.92771903,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.90545362,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.8973562717437744},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7093031406402588},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6529058218002319},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6234312653541565},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.5776330828666687},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5763407945632935},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.5690532326698303},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5076326131820679},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.49097493290901184},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4735240936279297},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4454685151576996},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4156869053840637},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.41061803698539734},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.401673823595047},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.36038637161254883},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25278952717781067},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.18338903784751892},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1832086741924286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15713709592819214},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15434938669204712}],"concepts":[{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.8973562717437744},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7093031406402588},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6529058218002319},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6234312653541565},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.5776330828666687},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5763407945632935},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.5690532326698303},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5076326131820679},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.49097493290901184},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4735240936279297},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4454685151576996},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4156869053840637},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.41061803698539734},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.401673823595047},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.36038637161254883},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25278952717781067},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.18338903784751892},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1832086741924286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15713709592819214},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15434938669204712},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsm.2007.4362646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsm.2007.4362646","pdf_url":null,"source":{"id":"https://openalex.org/S4210174939","display_name":"Proceedings/Proceedings - Conference on Software Maintenance","issn_l":"1063-6773","issn":["1063-6773","2576-3148"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Conference on Software Maintenance","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W157798378","https://openalex.org/W1493688518","https://openalex.org/W1510251747","https://openalex.org/W1985551847","https://openalex.org/W1992987499","https://openalex.org/W2013159836","https://openalex.org/W2023027674","https://openalex.org/W2091587497","https://openalex.org/W2095710561","https://openalex.org/W2100300194","https://openalex.org/W2102139879","https://openalex.org/W2102383851","https://openalex.org/W2110068396","https://openalex.org/W2117799048","https://openalex.org/W2138059712","https://openalex.org/W2138784804","https://openalex.org/W2152949369","https://openalex.org/W2165446001","https://openalex.org/W2172081876","https://openalex.org/W4232038577","https://openalex.org/W4256285596","https://openalex.org/W6648346141","https://openalex.org/W6656130244","https://openalex.org/W6675373646","https://openalex.org/W6685195280"],"related_works":["https://openalex.org/W4295918990","https://openalex.org/W4313447549","https://openalex.org/W2067499928","https://openalex.org/W2028796071","https://openalex.org/W1888619389","https://openalex.org/W2991649730","https://openalex.org/W2030553922","https://openalex.org/W3022870375","https://openalex.org/W2794522096","https://openalex.org/W1968494916"],"abstract_inverted_index":{"Test":[0],"suite":[1,14,55,180],"reduction":[2,56,85,116],"seeks":[3],"to":[4,29,42,113,117],"reduce":[5],"the":[6,21,68,107,145,162],"number":[7,135],"of":[8,20,48,63,79,93,109,136,149,165],"test":[9,13,36,54,72,97,119,156,179],"cases":[10,37,120],"in":[11,53,153],"a":[12,17,77,134,140,151,154],"while":[15],"retaining":[16],"high":[18],"percentage":[19,83,88],"original":[22],"suite's":[23],"fault":[24,89,168],"detection":[25,90],"effectiveness.":[26],"Most":[27],"approaches":[28],"this":[30,126],"problem":[31],"are":[32,39],"based":[33,59,143],"on":[34,60,144],"eliminating":[35],"that":[38,121,161,175],"redundant":[40],"relative":[41],"some":[43],"coverage":[44,51,98,111,138,173],"criterion.":[45],"The":[46],"effectiveness":[47],"applying":[49],"various":[50,110],"criteria":[52,112,174],"is":[57],"traditionally":[58],"empirical":[61],"comparison":[62],"two":[64],"metrics":[65],"derived":[66],"from":[67],"full":[69],"and":[70,74,86,130],"reduced":[71,155],"suites":[73],"information":[75],"about":[76],"set":[78],"known":[80],"faults:":[81],"(1)":[82],"size":[84],"(2)":[87],"reduction,":[91],"neither":[92],"which":[94],"quantitatively":[95],"takes":[96],"data":[99],"into":[100],"account.":[101],"Consequently,":[102],"no":[103],"existing":[104],"measure":[105],"expresses":[106],"likelihood":[108],"force":[114],"coverage-based":[115],"retain":[118],"expose":[122],"specific":[123],"faults.":[124],"In":[125],"paper,":[127],"we":[128],"develop":[129],"empirically":[131],"evaluate,":[132],"using":[133],"different":[137],"criteria,":[139],"new":[141],"metric":[142],"\"average":[146],"expected":[147],"probability":[148,164],"finding":[150],"fault\"":[152],"suite.":[157],"Our":[158],"results":[159],"indicate":[160],"average":[163],"detecting":[166],"each":[167],"shows":[169],"promise":[170],"for":[171,178],"identifying":[172],"work":[176],"well":[177],"reduction.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}