{"id":"https://openalex.org/W3208686322","doi":"https://doi.org/10.1109/icsipa52582.2021.9576810","title":"Region Detection Rate: An Applied Measure for Surface Defect Localization","display_name":"Region Detection Rate: An Applied Measure for Surface Defect Localization","publication_year":2021,"publication_date":"2021-09-13","ids":{"openalex":"https://openalex.org/W3208686322","doi":"https://doi.org/10.1109/icsipa52582.2021.9576810","mag":"3208686322"},"language":"en","primary_location":{"id":"doi:10.1109/icsipa52582.2021.9576810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsipa52582.2021.9576810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Signal and Image Processing Applications (ICSIPA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017813376","display_name":"Tamino Huxohl","orcid":"https://orcid.org/0000-0001-8865-2895"},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Tamino Huxohl","raw_affiliation_strings":["CoR-Lab, Bielefeld University, Bielefeld, Germany"],"affiliations":[{"raw_affiliation_string":"CoR-Lab, Bielefeld University, Bielefeld, Germany","institution_ids":["https://openalex.org/I20121455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024425658","display_name":"Franz K\u00fcmmert","orcid":"https://orcid.org/0009-0009-0941-3825"},"institutions":[{"id":"https://openalex.org/I20121455","display_name":"Bielefeld University","ror":"https://ror.org/02hpadn98","country_code":"DE","type":"education","lineage":["https://openalex.org/I20121455"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Franz Kummert","raw_affiliation_strings":["CoR-Lab, Bielefeld University, Bielefeld, Germany"],"affiliations":[{"raw_affiliation_string":"CoR-Lab, Bielefeld University, Bielefeld, Germany","institution_ids":["https://openalex.org/I20121455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5017813376"],"corresponding_institution_ids":["https://openalex.org/I20121455"],"apc_list":null,"apc_paid":null,"fwci":0.3011,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.6591487,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"36","issue":null,"first_page":"111","last_page":"116"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11605","display_name":"Visual Attention and Saliency Detection","score":0.9811999797821045,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.8454272747039795},{"id":"https://openalex.org/keywords/usability","display_name":"Usability","score":0.7574259042739868},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6595625281333923},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.6302703022956848},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5766185522079468},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5692718625068665},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.47650662064552307},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4448859989643097},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.423471063375473},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41467198729515076},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3419896960258484},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1584542989730835},{"id":"https://openalex.org/keywords/human\u2013computer-interaction","display_name":"Human\u2013computer interaction","score":0.1547607183456421},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1256524920463562},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.05392560362815857}],"concepts":[{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.8454272747039795},{"id":"https://openalex.org/C170130773","wikidata":"https://www.wikidata.org/wiki/Q216378","display_name":"Usability","level":2,"score":0.7574259042739868},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6595625281333923},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.6302703022956848},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5766185522079468},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5692718625068665},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.47650662064552307},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4448859989643097},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.423471063375473},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41467198729515076},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3419896960258484},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1584542989730835},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.1547607183456421},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1256524920463562},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.05392560362815857},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsipa52582.2021.9576810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsipa52582.2021.9576810","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Signal and Image Processing Applications (ICSIPA)","raw_type":"proceedings-article"},{"id":"pmh:oai:pub.uni-bielefeld.de:2957119","is_oa":false,"landing_page_url":"https://pub.uni-bielefeld.de/record/2957119","pdf_url":null,"source":{"id":"https://openalex.org/S4306401670","display_name":"PUB \u2013 Publications at Bielefeld University (Bielefeld University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I20121455","host_organization_name":"Bielefeld University","host_organization_lineage":["https://openalex.org/I20121455"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"http://purl.org/coar/resource_type/c_5794"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6299999952316284,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1575677815","https://openalex.org/W1965123412","https://openalex.org/W1966631307","https://openalex.org/W1988299413","https://openalex.org/W1994922096","https://openalex.org/W1999736642","https://openalex.org/W2012496675","https://openalex.org/W2018143002","https://openalex.org/W2037954058","https://openalex.org/W2048632148","https://openalex.org/W2056518953","https://openalex.org/W2100470808","https://openalex.org/W2124351162","https://openalex.org/W2171378720","https://openalex.org/W2175342987","https://openalex.org/W2202633017","https://openalex.org/W2231369266","https://openalex.org/W2344428106","https://openalex.org/W2417254599","https://openalex.org/W2589306531","https://openalex.org/W2599765304","https://openalex.org/W2795647708","https://openalex.org/W2802469369","https://openalex.org/W2804610335","https://openalex.org/W2888407265","https://openalex.org/W2944303778","https://openalex.org/W2963150697","https://openalex.org/W2963529609","https://openalex.org/W2963868681","https://openalex.org/W3010334993","https://openalex.org/W3023224696","https://openalex.org/W4239147634","https://openalex.org/W4248635988","https://openalex.org/W6634296514","https://openalex.org/W6688995908","https://openalex.org/W6762859143"],"related_works":["https://openalex.org/W4389670110","https://openalex.org/W2187546663","https://openalex.org/W2429057255","https://openalex.org/W148745890","https://openalex.org/W2611942503","https://openalex.org/W4315621326","https://openalex.org/W2899790217","https://openalex.org/W1576092969","https://openalex.org/W2598865957","https://openalex.org/W2524154428"],"abstract_inverted_index":{"The":[0,103],"automatic":[1,23,139],"localization":[2,46,69,142],"and":[3,34,49,95,144],"classification":[4],"of":[5,14,21,82,105,118,125,137,152],"defects":[6],"on":[7,67,111],"surfaces":[8],"helps":[9],"to":[10,43,145,156],"ensure":[11],"the":[12,19,59,86,106,131,135,150],"quality":[13],"industrially":[15],"manufactured":[16],"products.":[17],"For":[18],"development":[20,136],"such":[22],"systems,":[24],"a":[25,31,75,80,90,96,100,147],"measure":[26,41,133],"is":[27,38,65,72,92,98,108],"needed":[28],"that":[29,84,130],"allows":[30],"profound":[32],"optimization":[33],"comparison.":[35],"However,":[36],"there":[37],"currently":[39],"no":[40],"dedicated":[42],"surface":[44,140],"defect":[45,68,91,141],"in":[47,74],"particular":[48],"measures":[50,153],"from":[51,113],"related":[52],"fields":[53],"are":[54],"unsuitable.":[55],"Thus,":[56],"we":[57],"present":[58],"Region":[60],"Detection":[61],"Rate":[62],"(RDR)":[63],"which":[64,89,119],"specialized":[66],"since":[70],"it":[71],"evaluated":[73],"defect-wise":[76],"manner.":[77],"It":[78],"entails":[79],"set":[81],"rules":[83],"define":[85],"circumstances":[87],"under":[88],"considered":[93,99],"detected":[94],"prediction":[97],"false":[101],"positive.":[102],"usability":[104],"RDR":[107],"qualitatively":[109],"demonstrated":[110],"examples":[112],"three":[114],"different":[115],"datasets,":[116],"one":[117],"has":[120],"been":[121],"annotated":[122],"as":[123],"part":[124],"this":[126,157],"work.":[127],"We":[128],"hope":[129],"new":[132],"supports":[134],"future":[138],"systems":[143],"raise":[146],"discussion":[148],"about":[149],"suitability":[151],"with":[154],"regard":[155],"task.":[158]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}