{"id":"https://openalex.org/W2308038739","doi":"https://doi.org/10.1109/icsenst.2015.7438394","title":"Infrared multispectral imaging with silicon-based multiband pass filter and infrared focal plane array","display_name":"Infrared multispectral imaging with silicon-based multiband pass filter and infrared focal plane array","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2308038739","doi":"https://doi.org/10.1109/icsenst.2015.7438394","mag":"2308038739"},"language":"en","primary_location":{"id":"doi:10.1109/icsenst.2015.7438394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsenst.2015.7438394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 9th International Conference on Sensing Technology (ICST)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059445967","display_name":"Risako Ueno","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"R. Ueno","raw_affiliation_strings":["Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076059408","display_name":"Kouichi Ishii","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Ishii","raw_affiliation_strings":["Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100756213","display_name":"Koji Suzuki","orcid":"https://orcid.org/0000-0001-5354-1044"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Suzuki","raw_affiliation_strings":["Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044079510","display_name":"Hisashi Honda","orcid":"https://orcid.org/0000-0002-3820-4979"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Honda","raw_affiliation_strings":["Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113090593","display_name":"H. Funaki","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Funaki","raw_affiliation_strings":["Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Corporate Research & Development Center Toshiba Corporation, Kawasaki, Japan","institution_ids":["https://openalex.org/I1292669757"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1292669757"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.23668639,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"10","issue":null,"first_page":"211","last_page":"214"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microbolometer","display_name":"Microbolometer","score":0.8519350290298462},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.6695747971534729},{"id":"https://openalex.org/keywords/mercury-cadmium-telluride","display_name":"Mercury cadmium telluride","score":0.6067070960998535},{"id":"https://openalex.org/keywords/cardinal-point","display_name":"Cardinal point","score":0.6054500937461853},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5654526948928833},{"id":"https://openalex.org/keywords/infrared-spectroscopy","display_name":"Infrared spectroscopy","score":0.5407474040985107},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5258023142814636},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.500718355178833},{"id":"https://openalex.org/keywords/multispectral-image","display_name":"Multispectral image","score":0.4861257076263428},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.4400826692581177},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4106464385986328},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2846616506576538},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.27029868960380554},{"id":"https://openalex.org/keywords/bolometer","display_name":"Bolometer","score":0.26630085706710815},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1734185516834259}],"concepts":[{"id":"https://openalex.org/C2776111576","wikidata":"https://www.wikidata.org/wiki/Q495462","display_name":"Microbolometer","level":4,"score":0.8519350290298462},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6695747971534729},{"id":"https://openalex.org/C2778959120","wikidata":"https://www.wikidata.org/wiki/Q422717","display_name":"Mercury cadmium telluride","level":3,"score":0.6067070960998535},{"id":"https://openalex.org/C138395690","wikidata":"https://www.wikidata.org/wiki/Q376733","display_name":"Cardinal point","level":2,"score":0.6054500937461853},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5654526948928833},{"id":"https://openalex.org/C153642686","wikidata":"https://www.wikidata.org/wiki/Q70906","display_name":"Infrared spectroscopy","level":2,"score":0.5407474040985107},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5258023142814636},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.500718355178833},{"id":"https://openalex.org/C173163844","wikidata":"https://www.wikidata.org/wiki/Q1761440","display_name":"Multispectral image","level":2,"score":0.4861257076263428},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.4400826692581177},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4106464385986328},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2846616506576538},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.27029868960380554},{"id":"https://openalex.org/C21028948","wikidata":"https://www.wikidata.org/wiki/Q852212","display_name":"Bolometer","level":3,"score":0.26630085706710815},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1734185516834259},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsenst.2015.7438394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsenst.2015.7438394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 9th International Conference on Sensing Technology (ICST)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W865390269","https://openalex.org/W1560624019","https://openalex.org/W1983466871","https://openalex.org/W2030468241","https://openalex.org/W2038448355","https://openalex.org/W2089031544","https://openalex.org/W2115684663","https://openalex.org/W4248931071","https://openalex.org/W6623726055"],"related_works":["https://openalex.org/W2106534606","https://openalex.org/W2047230293","https://openalex.org/W2034504083","https://openalex.org/W2598469068","https://openalex.org/W2977811741","https://openalex.org/W2944160806","https://openalex.org/W2050833092","https://openalex.org/W2582747525","https://openalex.org/W2990104753","https://openalex.org/W4236980066"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"the":[3,29,45,79,82,94,120,168,182,192,198,202,218],"implementation":[4],"of":[5,24,96,107,137,150,160,167,185,210],"a":[6,40,52,60,125,142,165],"silicon-based":[7],"infrared":[8],"(IR)":[9],"multiband":[10,123],"pass":[11],"filter":[12,129,212],"(BPF)":[13],"on":[14,141],"an":[15],"uncooled":[16],"microbolometer":[17,70],"IR":[18,33,128],"focal":[19],"plane":[20],"array":[21,155],"(IR-FPA),":[22],"both":[23],"which":[25,90],"are":[26,117,156,179],"fabricated":[27,131],"by":[28,132],"standard":[30],"CMOS":[31],"process.":[32],"spectroscopy":[34],"has":[35,51],"been":[36],"widely":[37],"used":[38],"as":[39,101,111,164],"sample":[41],"identification":[42],"technique,":[43],"exploiting":[44],"fact":[46],"that":[47],"each":[48,211],"molecule":[49],"structure":[50],"unique":[53],"spectral":[54,74],"feature.":[55],"Using":[56],"IR-BPF":[57],"and":[58,62,114,152,176,188],"IR-FPA,":[59],"low-cost":[61],"compact":[63],"IR-spectral":[64],"imaging":[65],"system":[66],"is":[67,91,130,213],"realized.":[68],"The":[69,172,205],"IR-FPA":[71],"exhibits":[72],"broad":[73],"response":[75],"sufficient":[76],"to":[77,86],"cover":[78],"IR-region":[80],"from":[81],"mid-infrared":[83],"(3":[84],"\u03bcm)":[85],"far-infrared":[87],"(8":[88],"\u03bcm~),":[89],"broader":[92],"than":[93],"coverage":[95],"conventional":[97],"non-silicon-based":[98],"photodetectors":[99],"such":[100,110],"mercury":[102],"cadmium":[103],"telluride.":[104],"Single-band":[105],"images":[106],"invisible":[108],"gases":[109],"ethanol":[112],"vapor":[113],"CO2in":[115],"breath":[116],"obtained":[118,180],"with":[119,158],"IR-FPA.":[121],"For":[122],"imaging,":[124],"guided-mode":[126],"resonance":[127],"patterning":[133],"aluminum":[134],"(Al)":[135],"layer":[136],"100":[138],"nm":[139,216,223],"thickness":[140],"silicon-on-insulator":[143],"wafer.":[144],"Measured":[145],"peak":[146],"transmittance":[147],"wavelengths":[148],"(\u03bbc)":[149],"square":[151,193],"hexagonal":[153,203],"Al":[154,169],"compared":[157],"results":[159],"rigorous":[161],"coupled-wave":[162],"analysis,":[163],"function":[166],"pattern":[170,183],"period.":[171],"\u03bbcof":[173,219,225],"3.3,":[174],"3.9,":[175],"4.4":[177,220],"\u03bcm":[178,190],"at":[181,207],"period":[184],"1.8,":[186],"2.4,":[187],"2.8":[189],"for":[191,201,217,224],"array.":[194,204],"In":[195],"all":[196],"cases,":[197],"\u03bbcslightly":[199],"decreases":[200],"full-width":[206],"half-maximum":[208],"(FWHM)":[209],"approximately":[214],"200":[215],"\u03bcm,":[221],"400":[222],"3.3":[226],"\u03bcm.":[227]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}