{"id":"https://openalex.org/W2782122562","doi":"https://doi.org/10.1109/icsens.2017.8233996","title":"On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement","display_name":"On the effects of the excess bias of the SPAD on the timing accuracy in time interval measurement","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2782122562","doi":"https://doi.org/10.1109/icsens.2017.8233996","mag":"2782122562"},"language":"en","primary_location":{"id":"doi:10.1109/icsens.2017.8233996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040570330","display_name":"Jan Nissinen","orcid":"https://orcid.org/0000-0002-2920-1370"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"J. Nissinen","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041960912","display_name":"Ilkka Nissinen","orcid":"https://orcid.org/0000-0001-8131-9766"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"I. Nissinen","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061327188","display_name":"Jaakko Huikari","orcid":"https://orcid.org/0000-0001-5067-0385"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"J. Huikari","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012146581","display_name":"Sahba Jahromi","orcid":"https://orcid.org/0000-0002-3480-3085"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"S. Jahromi","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011819477","display_name":"Jussi-Pekka Jansson","orcid":"https://orcid.org/0000-0002-4256-6702"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"J.-P. Jansson","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041576376","display_name":"Juha Kostamovaara","orcid":"https://orcid.org/0000-0002-1004-8951"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"J. Kostamovaara","raw_affiliation_strings":["University of Oulu, Circuits and Systems Research Unit, Oulu, Finland"],"affiliations":[{"raw_affiliation_string":"University of Oulu, Circuits and Systems Research Unit, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5040570330"],"corresponding_institution_ids":["https://openalex.org/I98381234"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.13359375,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13869","display_name":"Ocular and Laser Science Research","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2731","display_name":"Ophthalmology"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8147774934768677},{"id":"https://openalex.org/keywords/single-photon-avalanche-diode","display_name":"Single-photon avalanche diode","score":0.6320230960845947},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5308963656425476},{"id":"https://openalex.org/keywords/full-width-at-half-maximum","display_name":"Full width at half maximum","score":0.5247188806533813},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5242612361907959},{"id":"https://openalex.org/keywords/avalanche-diode","display_name":"Avalanche diode","score":0.5242519378662109},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5098022818565369},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5016019344329834},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4703785479068756},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.430508553981781},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4291721284389496},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.427301287651062},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.38460445404052734},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.36760544776916504},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.299504816532135},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.17732468247413635},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15341868996620178},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.12639838457107544}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8147774934768677},{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.6320230960845947},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5308963656425476},{"id":"https://openalex.org/C108649604","wikidata":"https://www.wikidata.org/wiki/Q1065170","display_name":"Full width at half maximum","level":2,"score":0.5247188806533813},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5242612361907959},{"id":"https://openalex.org/C95341827","wikidata":"https://www.wikidata.org/wiki/Q175898","display_name":"Avalanche diode","level":4,"score":0.5242519378662109},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5098022818565369},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5016019344329834},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4703785479068756},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.430508553981781},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4291721284389496},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.427301287651062},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.38460445404052734},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.36760544776916504},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.299504816532135},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17732468247413635},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15341868996620178},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.12639838457107544},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsens.2017.8233996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233996","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"},{"id":"pmh:oai:oulu.fi:nbnfi-fe2018121350847","is_oa":false,"landing_page_url":"http://urn.fi/urn:nbn:fi-fe2018121350847","pdf_url":null,"source":{"id":"https://openalex.org/S4306400284","display_name":"University of Oulu Repository (University of Oulu)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98381234","host_organization_name":"University of Oulu","host_organization_lineage":["https://openalex.org/I98381234"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1989917143","https://openalex.org/W1998984636","https://openalex.org/W2053326076","https://openalex.org/W2058662614","https://openalex.org/W2095054925","https://openalex.org/W2099552383","https://openalex.org/W2161265472","https://openalex.org/W2165158946","https://openalex.org/W2295224159"],"related_works":["https://openalex.org/W2324745772","https://openalex.org/W2189181247","https://openalex.org/W2041021839","https://openalex.org/W2089087979","https://openalex.org/W1975934348","https://openalex.org/W3156845399","https://openalex.org/W3175785822","https://openalex.org/W4229921238","https://openalex.org/W1977159673","https://openalex.org/W2029938807"],"abstract_inverted_index":{"The":[0,20,48,67],"timing":[1,49],"accuracy":[2],"of":[3,16,22,36,63],"a":[4,14,43],"single-photon":[5],"avalanche":[6],"diode":[7],"(SPAD)":[8],"based":[9],"receiver":[10,40],"is":[11],"analyzed":[12],"as":[13],"function":[15],"excess":[17,59],"bias":[18,60],"voltage.":[19],"width":[21],"the":[23,34,37,58],"used":[24,38],"optical":[25],"pulse":[26],"was":[27,51],"100":[28],"ps,":[29],"which":[30],"matches":[31],"well":[32],"with":[33],"jitter":[35],"SPAD":[39],"fabricated":[41],"in":[42],"0.35":[44],"pm":[45],"HVCMOS":[46],"technology.":[47],"error":[50],"measured":[52],"to":[53,74],"be":[54],"900":[55],"ps":[56,73,76],"within":[57],"voltage":[61],"range":[62],"~1.25":[64],"V-3.25":[65],"V.":[66],"single-shot":[68],"resolution":[69],"changes":[70],"from":[71],"420":[72],"160":[75],"(FWHM),":[77],"respectively.":[78]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}