{"id":"https://openalex.org/W2781517386","doi":"https://doi.org/10.1109/icsens.2017.8233954","title":"Investigating the durability of electrochemical sensors for molten salts","display_name":"Investigating the durability of electrochemical sensors for molten salts","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2781517386","doi":"https://doi.org/10.1109/icsens.2017.8233954","mag":"2781517386"},"language":"en","primary_location":{"id":"doi:10.1109/icsens.2017.8233954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233954","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057976217","display_name":"Hannah Levene","orcid":"https://orcid.org/0009-0006-6908-1605"},"institutions":[{"id":"https://openalex.org/I4210087927","display_name":"National Microelectronics Institute","ror":"https://ror.org/003ck6433","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210087927"]},{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Hannah J. Levene","raw_affiliation_strings":["School of Chemistry, University of Edinburgh, Edinburgh, UK","Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Chemistry, University of Edinburgh, Edinburgh, UK","institution_ids":["https://openalex.org/I98677209"]},{"raw_affiliation_string":"Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK","institution_ids":["https://openalex.org/I4210087927"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030454326","display_name":"Ilka Schmueser","orcid":"https://orcid.org/0000-0002-6131-739X"},"institutions":[{"id":"https://openalex.org/I4210087927","display_name":"National Microelectronics Institute","ror":"https://ror.org/003ck6433","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210087927"]},{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ilka Schmueser","raw_affiliation_strings":["School of Chemistry, University of Edinburgh, Edinburgh, UK","Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Chemistry, University of Edinburgh, Edinburgh, UK","institution_ids":["https://openalex.org/I98677209"]},{"raw_affiliation_string":"Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK","institution_ids":["https://openalex.org/I4210087927"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015999013","display_name":"Ewen O. Blair","orcid":"https://orcid.org/0000-0002-1887-8001"},"institutions":[{"id":"https://openalex.org/I4210087927","display_name":"National Microelectronics Institute","ror":"https://ror.org/003ck6433","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210087927"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ewen O. Blair","raw_affiliation_strings":["Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK","institution_ids":["https://openalex.org/I4210087927"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022759027","display_name":"Jonathan G. Terry","orcid":"https://orcid.org/0000-0002-4012-9330"},"institutions":[{"id":"https://openalex.org/I4210087927","display_name":"National Microelectronics Institute","ror":"https://ror.org/003ck6433","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210087927"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jonathan G. Terry","raw_affiliation_strings":["Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK","institution_ids":["https://openalex.org/I4210087927"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029611009","display_name":"Andrew R. Mount","orcid":"https://orcid.org/0000-0003-1237-8206"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Andrew R. Mount","raw_affiliation_strings":["School of Chemistry, University of Edinburgh, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Chemistry, University of Edinburgh, Edinburgh, UK","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056608443","display_name":"A.J. Walton","orcid":"https://orcid.org/0000-0002-8110-2230"},"institutions":[{"id":"https://openalex.org/I4210087927","display_name":"National Microelectronics Institute","ror":"https://ror.org/003ck6433","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210087927"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Anthony J. Walton","raw_affiliation_strings":["Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Scottish Microelectronics Centre, School of Engineering, Edinburgh, UK","institution_ids":["https://openalex.org/I4210087927"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16340478,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11947","display_name":"Molten salt chemistry and electrochemical processes","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1507","display_name":"Fluid Flow and Transfer Processes"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11947","display_name":"Molten salt chemistry and electrochemical processes","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1507","display_name":"Fluid Flow and Transfer Processes"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9735000133514404,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9430999755859375,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectrode","display_name":"Microelectrode","score":0.8686007261276245},{"id":"https://openalex.org/keywords/durability","display_name":"Durability","score":0.7488632798194885},{"id":"https://openalex.org/keywords/molten-salt","display_name":"Molten salt","score":0.7221024036407471},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6502959728240967},{"id":"https://openalex.org/keywords/electrochemistry","display_name":"Electrochemistry","score":0.565000593662262},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.5483841896057129},{"id":"https://openalex.org/keywords/high-fidelity","display_name":"High fidelity","score":0.46923714876174927},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.3345127999782562},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3321587145328522},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24024173617362976},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.20376214385032654},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.19427552819252014},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.139565110206604},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.11903876066207886},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1016034185886383}],"concepts":[{"id":"https://openalex.org/C111670793","wikidata":"https://www.wikidata.org/wiki/Q16979465","display_name":"Microelectrode","level":3,"score":0.8686007261276245},{"id":"https://openalex.org/C104304963","wikidata":"https://www.wikidata.org/wiki/Q5316114","display_name":"Durability","level":2,"score":0.7488632798194885},{"id":"https://openalex.org/C2778353533","wikidata":"https://www.wikidata.org/wiki/Q1931010","display_name":"Molten salt","level":2,"score":0.7221024036407471},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6502959728240967},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.565000593662262},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5483841896057129},{"id":"https://openalex.org/C113364801","wikidata":"https://www.wikidata.org/wiki/Q26674","display_name":"High fidelity","level":2,"score":0.46923714876174927},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.3345127999782562},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3321587145328522},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24024173617362976},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.20376214385032654},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.19427552819252014},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.139565110206604},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11903876066207886},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1016034185886383},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icsens.2017.8233954","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233954","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.ed.ac.uk:openaire/467eb16e-696b-432d-b4a1-ffc91d1597cc","is_oa":false,"landing_page_url":"https://www.research.ed.ac.uk/en/publications/467eb16e-696b-432d-b4a1-ffc91d1597cc","pdf_url":null,"source":{"id":"https://openalex.org/S4306400321","display_name":"Edinburgh Research Explorer (University of Edinburgh)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98677209","host_organization_name":"University of Edinburgh","host_organization_lineage":["https://openalex.org/I98677209"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Levene, H, Schmueser, I, Blair, E, Terry, J, Mount, A & Walton, A 2017, 'Investigating the Durability of Electrochemical Sensors for Molten Salts', Paper presented at IEEE SENSORS 2017 , Glasgow, United Kingdom, 30/10/17 - 1/11/17.","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:pure.ed.ac.uk:ec_fundedresources/467eb16e-696b-432d-b4a1-ffc91d1597cc","is_oa":false,"landing_page_url":"https://www.research.ed.ac.uk/portal/en/publications/investigating-the-durability-of-electrochemical-sensors-for-molten-salts(467eb16e-696b-432d-b4a1-ffc91d1597cc).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400321","display_name":"Edinburgh Research Explorer (University of Edinburgh)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98677209","host_organization_name":"University of Edinburgh","host_organization_lineage":["https://openalex.org/I98677209"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8553734130","display_name":null,"funder_award_id":"EP/J000779/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W237589183","https://openalex.org/W1979663410","https://openalex.org/W1993519757","https://openalex.org/W2008154911","https://openalex.org/W2012970471","https://openalex.org/W2029177016","https://openalex.org/W2046632984","https://openalex.org/W2049267715","https://openalex.org/W2102445313","https://openalex.org/W2257891431","https://openalex.org/W2300449201","https://openalex.org/W2325797499","https://openalex.org/W2610755602"],"related_works":["https://openalex.org/W2352180411","https://openalex.org/W2380892508","https://openalex.org/W2386194254","https://openalex.org/W1567463853","https://openalex.org/W159888992","https://openalex.org/W2161251670","https://openalex.org/W1458806294","https://openalex.org/W2366942712","https://openalex.org/W2371713266","https://openalex.org/W2394295166"],"abstract_inverted_index":{"Molten":[0],"salt":[1],"is":[2,9],"a":[3],"corrosive,":[4],"high":[5,19],"temperature":[6],"environment":[7],"which":[8],"extremely":[10],"challenging":[11],"for":[12],"sensing":[13],"technologies.":[14],"Microelectrodes":[15],"are":[16],"well-positioned":[17],"as":[18],"fidelity":[20],"electrochemical":[21],"sensors":[22,40],"and":[23],"previous":[24],"work":[25,44],"has":[26],"delivered":[27],"microelectrodes":[28],"capable":[29],"of":[30,38,48],"operating":[31],"in":[32],"such":[33],"conditions.":[34],"However,":[35],"the":[36,46],"lifetime":[37],"these":[39],"requires":[41],"improvement.":[42],"This":[43],"investigates":[45],"origins":[47],"device":[49],"failure.":[50]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}