{"id":"https://openalex.org/W2781750455","doi":"https://doi.org/10.1109/icsens.2017.8233914","title":"Effect of pseudo collisions on plasma diagnostics","display_name":"Effect of pseudo collisions on plasma diagnostics","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2781750455","doi":"https://doi.org/10.1109/icsens.2017.8233914","mag":"2781750455"},"language":"en","primary_location":{"id":"doi:10.1109/icsens.2017.8233914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000022000","display_name":"Christian Schulz","orcid":"https://orcid.org/0000-0002-2708-0632"},"institutions":[{"id":"https://openalex.org/I904495901","display_name":"Ruhr University Bochum","ror":"https://ror.org/04tsk2644","country_code":"DE","type":"education","lineage":["https://openalex.org/I904495901"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Schulz","raw_affiliation_strings":["Institute of Microwave Systems, Ruhr-University Bochum, Bochum, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microwave Systems, Ruhr-University Bochum, Bochum, Germany","institution_ids":["https://openalex.org/I904495901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046336938","display_name":"Ilona Rolfes","orcid":"https://orcid.org/0000-0001-8195-4786"},"institutions":[{"id":"https://openalex.org/I904495901","display_name":"Ruhr University Bochum","ror":"https://ror.org/04tsk2644","country_code":"DE","type":"education","lineage":["https://openalex.org/I904495901"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ilona Rolfes","raw_affiliation_strings":["Institute of Microwave Systems, Ruhr-University Bochum, Bochum, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microwave Systems, Ruhr-University Bochum, Bochum, Germany","institution_ids":["https://openalex.org/I904495901"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I904495901"],"apc_list":null,"apc_paid":null,"fwci":0.7584,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67208435,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11603","display_name":"Dust and Plasma Wave Phenomena","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/collision-frequency","display_name":"Collision frequency","score":0.7758548259735107},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.653401255607605},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.6506446003913879},{"id":"https://openalex.org/keywords/plasma","display_name":"Plasma","score":0.6405544281005859},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.6045968532562256},{"id":"https://openalex.org/keywords/collision","display_name":"Collision","score":0.5654482245445251},{"id":"https://openalex.org/keywords/argon","display_name":"Argon","score":0.515361487865448},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.4472784996032715},{"id":"https://openalex.org/keywords/plasma-diagnostics","display_name":"Plasma diagnostics","score":0.4324345886707306},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4209919571876526},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.4117478132247925},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.09885689616203308},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.0786094069480896}],"concepts":[{"id":"https://openalex.org/C112951337","wikidata":"https://www.wikidata.org/wiki/Q5147502","display_name":"Collision frequency","level":3,"score":0.7758548259735107},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.653401255607605},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.6506446003913879},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.6405544281005859},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.6045968532562256},{"id":"https://openalex.org/C121704057","wikidata":"https://www.wikidata.org/wiki/Q352070","display_name":"Collision","level":2,"score":0.5654482245445251},{"id":"https://openalex.org/C547737533","wikidata":"https://www.wikidata.org/wiki/Q696","display_name":"Argon","level":2,"score":0.515361487865448},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4472784996032715},{"id":"https://openalex.org/C43503373","wikidata":"https://www.wikidata.org/wiki/Q7201771","display_name":"Plasma diagnostics","level":3,"score":0.4324345886707306},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4209919571876526},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.4117478132247925},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.09885689616203308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0786094069480896},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsens.2017.8233914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2017.8233914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE SENSORS","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1480160699","https://openalex.org/W1978765653","https://openalex.org/W2330535772","https://openalex.org/W2493880907","https://openalex.org/W2574281397"],"related_works":["https://openalex.org/W1992220684","https://openalex.org/W2018889208","https://openalex.org/W2019427646","https://openalex.org/W2000751913","https://openalex.org/W650625605","https://openalex.org/W2367483024","https://openalex.org/W1609504922","https://openalex.org/W132513953","https://openalex.org/W2071319411","https://openalex.org/W2036056054"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"basic":[3],"interrelations":[4],"between":[5,42],"low-pressure":[6],"plasmas":[7],"and":[8,44,47,73,94,113],"an":[9,59,63,116],"optimized":[10],"probe,":[11],"based":[12],"on":[13,67],"active":[14],"plasma":[15,118],"resonance":[16,70,79,92,107],"spectroscopy.":[17],"Special":[18],"attention":[19],"is":[20],"paid":[21],"to":[22],"the":[23,26,36,40,48,54,68,91,95,102,105,120,123],"determination":[24],"of":[25,39,56,62,104,122,127],"collision":[27,37,50,96],"frequency,":[28,51],"which":[29,52],"can":[30,81,87,98],"be":[31,82,88,99],"separated":[32],"into":[33],"two":[34],"types:":[35],"frequency":[38,93,97],"momentum":[41],"electrons":[43,57],"neutral":[45],"particles":[46],"pseudo":[49],"describes":[53],"deflection":[55],"by":[58],"electromagnetic":[60,110],"field":[61,111],"inserted":[64],"probe.":[65],"Based":[66],"multipole":[69],"probe":[71],"(MRP)":[72],"in-situ":[74],"reflection":[75],"measurements":[76,114],"a":[77],"specific":[78],"behaviour":[80],"evaluated.":[83],"The":[84],"electron":[85],"density":[86],"calculated":[89,100],"via":[90,101],"width":[103],"corresponding":[106],"peak.":[108],"3D":[109],"simulations":[112],"in":[115],"argon-oxygen":[117],"confirm":[119],"suitability":[121],"presented":[124],"simultaneous":[125],"evaluation":[126],"all":[128],"critical":[129],"parameters.":[130]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}