{"id":"https://openalex.org/W2576229960","doi":"https://doi.org/10.1109/icsens.2016.7808675","title":"Irradiation of on-chip chalcogenide glass waveguide mid-infrared gas sensor","display_name":"Irradiation of on-chip chalcogenide glass waveguide mid-infrared gas sensor","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2576229960","doi":"https://doi.org/10.1109/icsens.2016.7808675","mag":"2576229960"},"language":"en","primary_location":{"id":"doi:10.1109/icsens.2016.7808675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2016.7808675","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE SENSORS","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/scopus2015/6911","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065462861","display_name":"Peter Su","orcid":"https://orcid.org/0000-0002-7208-7921"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter Su","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102286546","display_name":"Zhaohong Han","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhaohong Han","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036155779","display_name":"Derek Kita","orcid":"https://orcid.org/0000-0003-0740-1344"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Derek Kita","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029671824","display_name":"Vivek Singh","orcid":"https://orcid.org/0000-0003-3958-5635"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vivek Singh","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038065556","display_name":"Qingyang Du","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qingyang Du","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063412518","display_name":"Lionel C. Kimerling","orcid":"https://orcid.org/0000-0002-3913-6189"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lionel Kimerling","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111985787","display_name":"Juejun Hu","orcid":"https://orcid.org/0000-0002-7233-3918"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Juejun Hu","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091609101","display_name":"Anu Agarwal","orcid":"https://orcid.org/0000-0001-5264-1123"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anu Agarwal","raw_affiliation_strings":["Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051006109","display_name":"Pao Tai Lin","orcid":"https://orcid.org/0000-0002-5417-6920"},"institutions":[{"id":"https://openalex.org/I2801502816","display_name":"Texas College","ror":"https://ror.org/04fsb1973","country_code":"US","type":"education","lineage":["https://openalex.org/I2801502816"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pao Tai Lin","raw_affiliation_strings":["Electrical and Computer Engineering, College Station, Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, College Station, Texas, USA","institution_ids":["https://openalex.org/I2801502816"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034189303","display_name":"Kathleen Richardson","orcid":"https://orcid.org/0000-0002-2960-6714"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kathleen Richardson","raw_affiliation_strings":["CREOL, University of Central Florida, Orlando, Florida, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREOL, University of Central Florida, Orlando, Florida, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041988519","display_name":"Dawn T. H. Tan","orcid":"https://orcid.org/0000-0002-7111-1125"},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Dawn T. H. Tan","raw_affiliation_strings":["Photonics Devices and Systems Group, Singapore University of Technology and Design Singapore, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Photonics Devices and Systems Group, Singapore University of Technology and Design Singapore, Singapore","institution_ids":["https://openalex.org/I152815399"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0998749,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7665888071060181},{"id":"https://openalex.org/keywords/chalcogenide-glass","display_name":"Chalcogenide glass","score":0.7502902150154114},{"id":"https://openalex.org/keywords/chalcogenide","display_name":"Chalcogenide","score":0.7178951501846313},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.6265761256217957},{"id":"https://openalex.org/keywords/transmittance","display_name":"Transmittance","score":0.573814868927002},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.5116484761238098},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5114454030990601},{"id":"https://openalex.org/keywords/lithography","display_name":"Lithography","score":0.4901672303676605},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.4509243667125702},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.44265249371528625},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4190616011619568}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7665888071060181},{"id":"https://openalex.org/C112234648","wikidata":"https://www.wikidata.org/wiki/Q5068626","display_name":"Chalcogenide glass","level":3,"score":0.7502902150154114},{"id":"https://openalex.org/C2778177714","wikidata":"https://www.wikidata.org/wiki/Q898920","display_name":"Chalcogenide","level":2,"score":0.7178951501846313},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6265761256217957},{"id":"https://openalex.org/C150493377","wikidata":"https://www.wikidata.org/wiki/Q1427863","display_name":"Transmittance","level":2,"score":0.573814868927002},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5116484761238098},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5114454030990601},{"id":"https://openalex.org/C204223013","wikidata":"https://www.wikidata.org/wiki/Q133036","display_name":"Lithography","level":2,"score":0.4901672303676605},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.4509243667125702},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.44265249371528625},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4190616011619568},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsens.2016.7808675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsens.2016.7808675","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE SENSORS","raw_type":"proceedings-article"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-7910","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/6911","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:scopus2015-7910","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2015/6911","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2015-2019","raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2119942537","https://openalex.org/W2133653396","https://openalex.org/W2143308799","https://openalex.org/W2148068557","https://openalex.org/W2157477209","https://openalex.org/W2165684532","https://openalex.org/W2326280823"],"related_works":["https://openalex.org/W589840713","https://openalex.org/W4210342135","https://openalex.org/W1485395888","https://openalex.org/W647748641","https://openalex.org/W2374200147","https://openalex.org/W2095363637","https://openalex.org/W574024483","https://openalex.org/W3088751286","https://openalex.org/W2130683785","https://openalex.org/W2730113340"],"abstract_inverted_index":{"We":[0,41],"measure":[1,42],"the":[2,43,47],"effect":[3],"of":[4,34,46,52,57],"radiation":[5],"damage":[6],"on":[7],"an":[8],"on-chip":[9],"mid-infrared":[10],"methane":[11,53],"gas":[12],"sensor":[13,22,48],"made":[14],"using":[15,25,37],"a":[16,29,38],"spiral":[17],"chalcogenide":[18,35],"glass":[19,36],"waveguide.":[20],"The":[21],"is":[23],"fabricated":[24],"UV":[26],"lithography":[27],"and":[28],"lift-off":[30],"process":[31],"after":[32,54],"deposition":[33],"thermal":[39],"evaporator.":[40],"transmittance":[44],"change":[45],"at":[49],"varying":[50,55],"concentrations":[51],"doses":[56],"irradiation.":[58]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}