{"id":"https://openalex.org/W2991289888","doi":"https://doi.org/10.1109/icsengt.2019.8906414","title":"Electrical Potential Study of Single and Segmented Excitation for Planar Electrical Capacitance Tomography","display_name":"Electrical Potential Study of Single and Segmented Excitation for Planar Electrical Capacitance Tomography","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2991289888","doi":"https://doi.org/10.1109/icsengt.2019.8906414","mag":"2991289888"},"language":"en","primary_location":{"id":"doi:10.1109/icsengt.2019.8906414","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsengt.2019.8906414","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 9th International Conference on System Engineering and Technology (ICSET)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079770410","display_name":"Shahrulnizahani Mohammad Din","orcid":"https://orcid.org/0000-0003-3237-5336"},"institutions":[{"id":"https://openalex.org/I4576418","display_name":"University of Technology Malaysia","ror":"https://ror.org/026w31v75","country_code":"MY","type":"education","lineage":["https://openalex.org/I4576418"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"Shahrulnizahani Mohammad Din","raw_affiliation_strings":["School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia","institution_ids":["https://openalex.org/I4576418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070975510","display_name":"Pei Ling Leow","orcid":"https://orcid.org/0000-0001-7930-4717"},"institutions":[{"id":"https://openalex.org/I4576418","display_name":"University of Technology Malaysia","ror":"https://ror.org/026w31v75","country_code":"MY","type":"education","lineage":["https://openalex.org/I4576418"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Pei Ling Leow","raw_affiliation_strings":["School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia","institution_ids":["https://openalex.org/I4576418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090501908","display_name":"Xian Feng Hor","orcid":"https://orcid.org/0000-0002-6076-0525"},"institutions":[{"id":"https://openalex.org/I4576418","display_name":"University of Technology Malaysia","ror":"https://ror.org/026w31v75","country_code":"MY","type":"education","lineage":["https://openalex.org/I4576418"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Xian Feng Hor","raw_affiliation_strings":["School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia","institution_ids":["https://openalex.org/I4576418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010837880","display_name":"Jaysuman Pusppanathan","orcid":"https://orcid.org/0000-0001-8685-2084"},"institutions":[{"id":"https://openalex.org/I4576418","display_name":"University of Technology Malaysia","ror":"https://ror.org/026w31v75","country_code":"MY","type":"education","lineage":["https://openalex.org/I4576418"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Jaysuman Pusppanathan","raw_affiliation_strings":["School of Biomedical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia"],"affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia","institution_ids":["https://openalex.org/I4576418"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033452072","display_name":"Nur Amirah Zulkifli","orcid":null},"institutions":[{"id":"https://openalex.org/I4576418","display_name":"University of Technology Malaysia","ror":"https://ror.org/026w31v75","country_code":"MY","type":"education","lineage":["https://openalex.org/I4576418"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nur Amirah Zulkifli","raw_affiliation_strings":["School of Biomedical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia"],"affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering Faculty of Engineering, Universiti Teknologi Malaysia, Johor, Malaysia","institution_ids":["https://openalex.org/I4576418"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108964589","display_name":"Ruzairi Abdul Rahim","orcid":null},"institutions":[{"id":"https://openalex.org/I930072361","display_name":"Tun Hussein Onn University of Malaysia","ror":"https://ror.org/01c5wha71","country_code":"MY","type":"education","lineage":["https://openalex.org/I930072361"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Ruzairi Abdul Rahim","raw_affiliation_strings":["Faculty of Electrical and Electronic Engineering, Univerisit Tun Hussein Onn Malaysia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Electronic Engineering, Univerisit Tun Hussein Onn Malaysia","institution_ids":["https://openalex.org/I930072361"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5079770410"],"corresponding_institution_ids":["https://openalex.org/I4576418"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.13061832,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"55","issue":null,"first_page":"68","last_page":"73"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.72072434425354},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.7110066413879395},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6471754312515259},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.6257452368736267},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.6056070327758789},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6027902364730835},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.570401668548584},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.49256378412246704},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.35406064987182617},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34194570779800415},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2692505121231079},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2416897714138031},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1278429627418518},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.12556138634681702}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.72072434425354},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.7110066413879395},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6471754312515259},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6257452368736267},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.6056070327758789},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6027902364730835},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.570401668548584},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.49256378412246704},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.35406064987182617},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34194570779800415},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2692505121231079},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2416897714138031},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1278429627418518},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.12556138634681702},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsengt.2019.8906414","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsengt.2019.8906414","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 9th International Conference on System Engineering and Technology (ICSET)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W99385433","https://openalex.org/W406560571","https://openalex.org/W1546412308","https://openalex.org/W1556811949","https://openalex.org/W1617478568","https://openalex.org/W1969049028","https://openalex.org/W1971385663","https://openalex.org/W1978470696","https://openalex.org/W1986710124","https://openalex.org/W1987296684","https://openalex.org/W2015552167","https://openalex.org/W2047590775","https://openalex.org/W2054694377","https://openalex.org/W2125717952","https://openalex.org/W2129735586","https://openalex.org/W2133743845","https://openalex.org/W2144022218","https://openalex.org/W2145644540","https://openalex.org/W2159184259","https://openalex.org/W2160501566","https://openalex.org/W2164378195","https://openalex.org/W2164413137","https://openalex.org/W2283874103","https://openalex.org/W2738615740","https://openalex.org/W2790661584","https://openalex.org/W2897470861","https://openalex.org/W2912255446","https://openalex.org/W3155956143","https://openalex.org/W6645206051"],"related_works":["https://openalex.org/W2065013354","https://openalex.org/W1974831921","https://openalex.org/W2362942457","https://openalex.org/W2056641994","https://openalex.org/W2364971604","https://openalex.org/W2009640073","https://openalex.org/W1971900134","https://openalex.org/W1973400749","https://openalex.org/W1969121263","https://openalex.org/W2393881606"],"abstract_inverted_index":{"Electrical":[0],"Capacitance":[1],"Tomography":[2],"(ECT)":[3],"is":[4,98,146,180,187],"an":[5,168],"imaging":[6],"modality":[7],"that":[8,176],"can":[9],"produce":[10],"image":[11,136],"reconstruction":[12],"for":[13,78,85,127],"the":[14,19,23,30,56,59,70,73,82,90,94,119,123,141,152,178,183,195],"closed":[15],"region,":[16],"by":[17,100],"measuring":[18],"permittivity":[20],"value":[21,145,163],"in":[22,118,133,143,194],"inspected":[24],"area.":[25,198],"This":[26],"paper":[27],"investigates":[28],"numerically":[29],"characteristics":[31],"of":[32,58,67,72,93,115,122,135,137,171,191],"planar":[33,62,86],"ECT":[34,48],"configuration":[35,87],"with":[36,167],"single":[37,105],"and":[38,84,106,111,139,150],"segmented":[39,107],"excitation.":[40],"Simulations":[41],"analysis":[42,153],"were":[43],"carried":[44,154],"out":[45],"using":[46],"8-electrode":[47],"system.":[49],"The":[50,61],"copper":[51],"electrodes":[52],"are":[53,125],"fabricated":[54],"at":[55],"bottom":[57],"chamber.":[60,95],"model":[63],"has":[64],"a":[65,159,188],"risk":[66],"detection":[68],"where":[69],"sensitivity":[71],"electrical":[74,161,192],"field":[75,129],"becomes":[76],"weaker":[77],"areas":[79],"away":[80],"from":[81,151],"electrode,":[83],"it":[88],"involves":[89],"upper":[91,120],"area":[92,121],"Simulation":[96],"study":[97],"conducted":[99],"comparing":[101],"different":[102],"type":[103],"excitation;":[104],"excitation":[108,138],"(Protocols":[109],"1":[110,166],"2).":[112],"Three":[113],"points":[114],"voltage":[116,144],"values":[117],"chamber":[124,196],"extracted":[126],"electric":[128],"strength":[130],"study.":[131],"Comparison":[132],"terms":[134],"also":[140,174],"difference":[142,170],"taken":[147],"into":[148],"account,":[149],"out,":[155],"Protocol":[156,165],"2":[157],"provides":[158],"better":[160],"potential":[162,193],"than":[164],"average":[169],"0.63V.":[172],"Observation":[173],"found":[175],"if":[177],"electrode":[179],"excite":[181],"near":[182],"wall":[184],"chamber,":[185],"there":[186],"higher":[189],"concentration":[190],"edge":[197]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}