{"id":"https://openalex.org/W2162757301","doi":"https://doi.org/10.1109/icse-companion.2009.5070969","title":"Automatic GUI test generation for smartphone applications - an evaluation","display_name":"Automatic GUI test generation for smartphone applications - an evaluation","publication_year":2009,"publication_date":"2009-01-01","ids":{"openalex":"https://openalex.org/W2162757301","doi":"https://doi.org/10.1109/icse-companion.2009.5070969","mag":"2162757301"},"language":"en","primary_location":{"id":"doi:10.1109/icse-companion.2009.5070969","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icse-companion.2009.5070969","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 31st International Conference on Software Engineering - Companion Volume","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078152101","display_name":"Antti J\u00e4\u00e4skel\u00e4inen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Antti Jaaskelainen","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059462561","display_name":"Mika Katara","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Mika Katara","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037122269","display_name":"Antti Kervinen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Antti Kervinen","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050786589","display_name":"Mika Maunumaa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Mika Maunumaa","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040531371","display_name":"Tuula P\u00e4\u00e4kk\u00f6nen","orcid":"https://orcid.org/0000-0003-3958-9732"},"institutions":[{"id":"https://openalex.org/I2738502077","display_name":"Nokia (Finland)","ror":"https://ror.org/04pkc8m17","country_code":"FI","type":"company","lineage":["https://openalex.org/I2738502077"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tuula Paakkonen","raw_affiliation_strings":["Nokia Devices Research and Development, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nokia Devices Research and Development, Tampere, Finland","institution_ids":["https://openalex.org/I2738502077"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033606554","display_name":"Tommi Takala","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tommi Takala","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071227005","display_name":"Heikki Virtanen","orcid":"https://orcid.org/0000-0001-8978-6633"},"institutions":[{"id":"https://openalex.org/I4210133110","display_name":"Tampere University","ror":null,"country_code":"FI","type":null,"lineage":["https://openalex.org/I4210133110"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Heikki Virtanen","raw_affiliation_strings":["Department of Software Systems, Tampere University of Technology, Tampere, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Software Systems, Tampere University of Technology, Tampere, Finland","institution_ids":["https://openalex.org/I4210133110"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.1624,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.96674538,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"112","last_page":"122"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8142695426940918},{"id":"https://openalex.org/keywords/graphical-user-interface","display_name":"Graphical user interface","score":0.7978353500366211},{"id":"https://openalex.org/keywords/graphical-user-interface-testing","display_name":"Graphical user interface testing","score":0.707086980342865},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6160258054733276},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5808160305023193},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5466315746307373},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.5349881052970886},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5125331878662109},{"id":"https://openalex.org/keywords/user-interface","display_name":"User interface","score":0.49350249767303467},{"id":"https://openalex.org/keywords/keyword-driven-testing","display_name":"Keyword-driven testing","score":0.46236613392829895},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4529421031475067},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4324844479560852},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.4300248622894287},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4142361879348755},{"id":"https://openalex.org/keywords/human\u2013computer-interaction","display_name":"Human\u2013computer interaction","score":0.3703721761703491},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32770001888275146},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.31359609961509705},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2167806625366211},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2081841230392456},{"id":"https://openalex.org/keywords/user-interface-design","display_name":"User interface design","score":0.18754079937934875},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1575801968574524},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10284999012947083},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.09888795018196106}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8142695426940918},{"id":"https://openalex.org/C37789001","wikidata":"https://www.wikidata.org/wiki/Q782543","display_name":"Graphical user interface","level":2,"score":0.7978353500366211},{"id":"https://openalex.org/C66153210","wikidata":"https://www.wikidata.org/wiki/Q5597182","display_name":"Graphical user interface testing","level":4,"score":0.707086980342865},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6160258054733276},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5808160305023193},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5466315746307373},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.5349881052970886},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5125331878662109},{"id":"https://openalex.org/C89505385","wikidata":"https://www.wikidata.org/wiki/Q47146","display_name":"User interface","level":2,"score":0.49350249767303467},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.46236613392829895},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4529421031475067},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4324844479560852},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.4300248622894287},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4142361879348755},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.3703721761703491},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32770001888275146},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.31359609961509705},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2167806625366211},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2081841230392456},{"id":"https://openalex.org/C149229913","wikidata":"https://www.wikidata.org/wiki/Q135707","display_name":"User interface design","level":3,"score":0.18754079937934875},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1575801968574524},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10284999012947083},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.09888795018196106},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icse-companion.2009.5070969","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icse-companion.2009.5070969","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 31st International Conference on Software Engineering - Companion Volume","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321855","display_name":"Tekes","ror":"https://ror.org/02ag8cq23"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W123916425","https://openalex.org/W998289342","https://openalex.org/W1183360046","https://openalex.org/W1495320250","https://openalex.org/W1500002858","https://openalex.org/W1522465028","https://openalex.org/W1541406601","https://openalex.org/W1562173112","https://openalex.org/W1564025144","https://openalex.org/W1568441100","https://openalex.org/W1574570499","https://openalex.org/W1591521007","https://openalex.org/W1598031569","https://openalex.org/W1969671537","https://openalex.org/W2023862309","https://openalex.org/W2024571027","https://openalex.org/W2066515165","https://openalex.org/W2074835004","https://openalex.org/W2074891852","https://openalex.org/W2090313140","https://openalex.org/W2113457891","https://openalex.org/W2114576845","https://openalex.org/W2129384397","https://openalex.org/W2131044856","https://openalex.org/W2147281414","https://openalex.org/W2159267714","https://openalex.org/W2159348178","https://openalex.org/W3008534045","https://openalex.org/W4234386902","https://openalex.org/W4253394499","https://openalex.org/W4285719527","https://openalex.org/W6604960728","https://openalex.org/W6633432383","https://openalex.org/W6634343409","https://openalex.org/W6635783517","https://openalex.org/W6683224893"],"related_works":["https://openalex.org/W57482378","https://openalex.org/W2724840363","https://openalex.org/W115539129","https://openalex.org/W2375658120","https://openalex.org/W3006661330","https://openalex.org/W1498418524","https://openalex.org/W2133879562","https://openalex.org/W175964112","https://openalex.org/W3215931484","https://openalex.org/W4291700435"],"abstract_inverted_index":{"We":[0,104],"present":[1],"the":[2,10,27,32,35,43,80,99,107,112],"results":[3],"of":[4,12,22,29,72],"an":[5,65],"evaluation":[6,44],"where":[7],"we":[8,39,86,109],"studied":[9],"effectiveness":[11],"automatic":[13],"test":[14,36,51,67,81],"generation":[15],"for":[16,42,53,101],"graphical":[17],"user":[18],"interface":[19],"(GUI)":[20],"testing":[21],"smartphone":[23],"applications.":[24],"To":[25],"describe":[26,106],"context":[28],"our":[30,84],"evaluation,":[31,85],"tools":[33,63],"and":[34],"model":[37],"library":[38,49],"have":[40],"developed":[41],"are":[45],"also":[46,105],"presented.":[47],"The":[48,62],"contains":[50],"models":[52],"basic":[54],"S60":[55],"applications,":[56],"such":[57],"as":[58],"camera,":[59],"contacts,":[60],"etc.":[61],"include":[64],"on-line":[66],"generator":[68],"that":[69,95],"produces":[70],"sequences":[71],"so":[73],"called":[74],"keywords":[75],"to":[76,88],"be":[77],"executed":[78],"on":[79,98],"targets.":[82],"In":[83],"managed":[87],"find":[89],"over":[90],"20":[91],"defects":[92],"from":[93],"applications":[94],"had":[96],"been":[97],"market":[100],"several":[102],"months.":[103],"problems":[108],"faced":[110],"during":[111],"evaluation.":[113]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}