{"id":"https://openalex.org/W4392408254","doi":"https://doi.org/10.1109/icsc58660.2023.10449740","title":"Texture Features Extraction Using Wavelet-Based CLBP for Surface Defects Retrieval of Hot Rolled Steel Strip","display_name":"Texture Features Extraction Using Wavelet-Based CLBP for Surface Defects Retrieval of Hot Rolled Steel Strip","publication_year":2023,"publication_date":"2023-12-18","ids":{"openalex":"https://openalex.org/W4392408254","doi":"https://doi.org/10.1109/icsc58660.2023.10449740"},"language":"en","primary_location":{"id":"doi:10.1109/icsc58660.2023.10449740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsc58660.2023.10449740","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 11th International Conference on Systems and Control (ICSC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015511241","display_name":"Fatma Zohra Boudani","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086178","display_name":"Research Center in Industrial Technologies","ror":"https://ror.org/00qhvgf79","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210086178"]},{"id":"https://openalex.org/I157169809","display_name":"University of Sciences and Technology Houari Boumediene","ror":"https://ror.org/02kb89c09","country_code":"DZ","type":"education","lineage":["https://openalex.org/I157169809"]}],"countries":["DZ"],"is_corresponding":true,"raw_author_name":"Fatma Zohra Boudani","raw_affiliation_strings":["Echahid Mohammed ABASSI,Research Center in Industrial Technologies CRTI,Algiers,Algeria,16014","Faculty of Electrical Engineering, University of Science and Technology Houari Boumediene (USTHB), Algiers, Algeria"],"affiliations":[{"raw_affiliation_string":"Echahid Mohammed ABASSI,Research Center in Industrial Technologies CRTI,Algiers,Algeria,16014","institution_ids":["https://openalex.org/I4210086178"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, University of Science and Technology Houari Boumediene (USTHB), Algiers, Algeria","institution_ids":["https://openalex.org/I157169809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090627178","display_name":"Nafa\u00e2 Nacereddine","orcid":"https://orcid.org/0000-0003-1351-2200"},"institutions":[{"id":"https://openalex.org/I4210086178","display_name":"Research Center in Industrial Technologies","ror":"https://ror.org/00qhvgf79","country_code":"DZ","type":"facility","lineage":["https://openalex.org/I4210086178"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Nafaa Nacereddine","raw_affiliation_strings":["Echahid Mohammed ABASSI,Research Center in Industrial Technologies CRTI,Algiers,Algeria,16014"],"affiliations":[{"raw_affiliation_string":"Echahid Mohammed ABASSI,Research Center in Industrial Technologies CRTI,Algiers,Algeria,16014","institution_ids":["https://openalex.org/I4210086178"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004969950","display_name":"Nac\u00e9ra Laiche","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107086","display_name":"University of Algiers 3","ror":"https://ror.org/01pynjp12","country_code":"DZ","type":"education","lineage":["https://openalex.org/I4210107086"]}],"countries":["DZ"],"is_corresponding":false,"raw_author_name":"Nac\u00e9ra Laiche","raw_affiliation_strings":["Faculty of Computer Science,Algiers,Algeria,16111"],"affiliations":[{"raw_affiliation_string":"Faculty of Computer Science,Algiers,Algeria,16111","institution_ids":["https://openalex.org/I4210107086"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015511241"],"corresponding_institution_ids":["https://openalex.org/I157169809","https://openalex.org/I4210086178"],"apc_list":null,"apc_paid":null,"fwci":0.6515,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.75456607,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"849","last_page":"854"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9455999732017517,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6069462895393372},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.552203893661499},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.5181711912155151},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5157985687255859},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49651771783828735},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4895406663417816},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.4872378408908844},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.48568639159202576},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4461284875869751},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39745116233825684},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.10525450110435486}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6069462895393372},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.552203893661499},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.5181711912155151},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5157985687255859},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49651771783828735},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4895406663417816},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4872378408908844},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.48568639159202576},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4461284875869751},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39745116233825684},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.10525450110435486},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsc58660.2023.10449740","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsc58660.2023.10449740","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 11th International Conference on Systems and Control (ICSC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W185774103","https://openalex.org/W1497695402","https://openalex.org/W2031476339","https://openalex.org/W2039051707","https://openalex.org/W2071897443","https://openalex.org/W2092072518","https://openalex.org/W2097946161","https://openalex.org/W2116988482","https://openalex.org/W2147141800","https://openalex.org/W2155903085","https://openalex.org/W2807520932","https://openalex.org/W2913953110","https://openalex.org/W2945708832","https://openalex.org/W2980098587","https://openalex.org/W2998291476","https://openalex.org/W3009836556","https://openalex.org/W3093228337","https://openalex.org/W3139690853","https://openalex.org/W3211250798","https://openalex.org/W4210657921","https://openalex.org/W4221141433","https://openalex.org/W4226127034","https://openalex.org/W4300167559"],"related_works":["https://openalex.org/W2382174632","https://openalex.org/W2129959498","https://openalex.org/W2784060934","https://openalex.org/W2902714807","https://openalex.org/W2537489131","https://openalex.org/W2394084632","https://openalex.org/W2358293514","https://openalex.org/W2046633342","https://openalex.org/W2059273319","https://openalex.org/W2077021924"],"abstract_inverted_index":{"This":[0,20,53],"paper":[1],"addresses":[2],"the":[3,23,47,68,93],"effective":[4],"content-based":[5],"image":[6],"retrieval":[7,90],"(CBIR)":[8],"system":[9,21,35],"specifically":[10],"designed":[11],"for":[12],"identifying":[13],"surface":[14,85],"defects":[15,28,86],"of":[16,92],"hot-rolled":[17],"steel":[18],"strips.":[19],"allows":[22],"expert":[24],"to":[25],"separate":[26],"serious":[27],"from":[29,46],"others":[30],"automatically.":[31],"The":[32,80],"proposed":[33],"CBIR":[34],"is":[36],"based":[37],"on":[38,83],"extracting":[39],"completed":[40],"local":[41],"binary":[42],"patterns":[43],"(CLBP)":[44],"features":[45,60],"discrete":[48],"wavelet":[49,71,73],"transform":[50],"(DWT)":[51],"coefficients.":[52],"DWCLBP":[54,94],"descriptor":[55],"extracts":[56],"highly":[57],"discriminative":[58],"texture":[59],"at":[61],"different":[62],"scales":[63],"and":[64,72],"orientations.":[65],"We":[66],"select":[67],"optimal":[69],"mother":[70],"decomposition":[74],"levels":[75],"by":[76],"making":[77],"extensive":[78],"comparisons.":[79],"experimental":[81],"results":[82],"NEU":[84],"database":[87],"demonstrate":[88],"promising":[89],"performance":[91],"features.":[95]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}