{"id":"https://openalex.org/W4310150258","doi":"https://doi.org/10.1109/icsc57768.2022.9993909","title":"A Bayesian-based optimization approach for accelerated degradation test plan of a LED component with self-heating impact","display_name":"A Bayesian-based optimization approach for accelerated degradation test plan of a LED component with self-heating impact","publication_year":2022,"publication_date":"2022-11-23","ids":{"openalex":"https://openalex.org/W4310150258","doi":"https://doi.org/10.1109/icsc57768.2022.9993909"},"language":"en","primary_location":{"id":"doi:10.1109/icsc57768.2022.9993909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsc57768.2022.9993909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 10th International Conference on Systems and Control (ICSC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019937210","display_name":"Minh-Tuan Truong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110792","display_name":"Centre de Recherche en Automatique de Nancy","ror":"https://ror.org/022r5hc56","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210099203","https://openalex.org/I4210100260","https://openalex.org/I4210110792","https://openalex.org/I4210159245","https://openalex.org/I90183372"]},{"id":"https://openalex.org/I90183372","display_name":"Universit\u00e9 de Lorraine","ror":"https://ror.org/04vfs2w97","country_code":"FR","type":"education","lineage":["https://openalex.org/I90183372"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Minh-Tuan Truong","raw_affiliation_strings":["Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506","institution_ids":["https://openalex.org/I4210110792","https://openalex.org/I90183372"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010854199","display_name":"Phuc Do","orcid":"https://orcid.org/0000-0003-4113-5895"},"institutions":[{"id":"https://openalex.org/I4210110792","display_name":"Centre de Recherche en Automatique de Nancy","ror":"https://ror.org/022r5hc56","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210099203","https://openalex.org/I4210100260","https://openalex.org/I4210110792","https://openalex.org/I4210159245","https://openalex.org/I90183372"]},{"id":"https://openalex.org/I90183372","display_name":"Universit\u00e9 de Lorraine","ror":"https://ror.org/04vfs2w97","country_code":"FR","type":"education","lineage":["https://openalex.org/I90183372"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Phuc Do","raw_affiliation_strings":["Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506","institution_ids":["https://openalex.org/I4210110792","https://openalex.org/I90183372"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108556966","display_name":"Laurent Mendizabal","orcid":null},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Laurent Mendizabal","raw_affiliation_strings":["CEA Leti,Grenoble,France,F-38000"],"affiliations":[{"raw_affiliation_string":"CEA Leti,Grenoble,France,F-38000","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I2738703131"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074443282","display_name":"Beno\u00eet Iung","orcid":"https://orcid.org/0000-0001-5560-4096"},"institutions":[{"id":"https://openalex.org/I4210110792","display_name":"Centre de Recherche en Automatique de Nancy","ror":"https://ror.org/022r5hc56","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210099203","https://openalex.org/I4210100260","https://openalex.org/I4210110792","https://openalex.org/I4210159245","https://openalex.org/I90183372"]},{"id":"https://openalex.org/I90183372","display_name":"Universit\u00e9 de Lorraine","ror":"https://ror.org/04vfs2w97","country_code":"FR","type":"education","lineage":["https://openalex.org/I90183372"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Benoit Iung","raw_affiliation_strings":["Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E9; de Lorraine, CRAN, UMR 7039,Vandoeuvreles-Nancy,France,54506","institution_ids":["https://openalex.org/I4210110792","https://openalex.org/I90183372"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5019937210"],"corresponding_institution_ids":["https://openalex.org/I4210110792","https://openalex.org/I90183372"],"apc_list":null,"apc_paid":null,"fwci":0.1551,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48592826,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"96","last_page":"101"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.6978424191474915},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.6929925084114075},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6685662865638733},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6612874269485474},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.556152880191803},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.5383442640304565},{"id":"https://openalex.org/keywords/bayesian-optimization","display_name":"Bayesian optimization","score":0.5372331738471985},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.446077823638916},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4136219620704651},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3876294493675232},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3647693991661072},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3539152145385742},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.34719377756118774},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30626338720321655},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1844978928565979},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14523395895957947},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09445962309837341}],"concepts":[{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.6978424191474915},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.6929925084114075},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6685662865638733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6612874269485474},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.556152880191803},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.5383442640304565},{"id":"https://openalex.org/C2778049539","wikidata":"https://www.wikidata.org/wiki/Q17002908","display_name":"Bayesian optimization","level":2,"score":0.5372331738471985},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.446077823638916},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4136219620704651},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3876294493675232},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3647693991661072},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3539152145385742},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.34719377756118774},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30626338720321655},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1844978928565979},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14523395895957947},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09445962309837341},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsc57768.2022.9993909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsc57768.2022.9993909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 10th International Conference on Systems and Control (ICSC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03874523v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03874523","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"10th International Conference on Systems and Control, ICSC'2022, Nov 2022, Marseille, France","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1539851785","https://openalex.org/W1935477768","https://openalex.org/W1968656346","https://openalex.org/W2014018052","https://openalex.org/W2077464341","https://openalex.org/W2096656058","https://openalex.org/W2124539209","https://openalex.org/W2142218574","https://openalex.org/W2166604047","https://openalex.org/W2219278657","https://openalex.org/W2487244463","https://openalex.org/W3215237930","https://openalex.org/W4240945186"],"related_works":["https://openalex.org/W3106461837","https://openalex.org/W4283700523","https://openalex.org/W3168182983","https://openalex.org/W4401858220","https://openalex.org/W4281966776","https://openalex.org/W4309225765","https://openalex.org/W1984753221","https://openalex.org/W3148030776","https://openalex.org/W2341589024","https://openalex.org/W2113435641"],"abstract_inverted_index":{"Constant-stress":[0],"Accelerated":[1],"Degradation":[2],"Testing":[3],"(ADT)":[4],"has":[5],"become":[6],"a":[7,37,62,70,84],"common":[8],"method":[9,38],"to":[10,20,51,87],"get":[11],"degradation":[12],"data":[13,47,97],"of":[14,39,69,113],"components/systems.":[15],"The":[16,105],"ADT":[17,24,67,91],"design":[18,35],"aims":[19],"build":[21],"an":[22],"optimal":[23,34,54,90],"plan":[25,68,92],"under":[26,42,93],"specific":[27],"constraints,":[28],"e.g.,":[29],"limited":[30,94],"test":[31,55],"resources.":[32,95],"Bayesian":[33],"is":[36,81],"decision":[40],"theory":[41],"uncertainty,":[43],"which":[44],"uses":[45],"historical":[46],"and":[48,111],"expert":[49],"information":[50],"find":[52,88],"the":[53,74,89,102,109,114],"plan.":[56],"In":[57,77],"this":[58],"paper,":[59],"we":[60],"develop":[61],"Bayesian-based":[63],"approach":[64],"for":[65],"optimizing":[66],"LED":[71,99],"component":[72],"considering":[73],"self-heating":[75],"phenomenon.":[76],"that":[78],"way,":[79],"D-optimal":[80],"used":[82],"as":[83],"main":[85],"criterion":[86],"Experimental":[96],"from":[98],"components":[100],"demonstrate":[101],"proposed":[103,115],"method.":[104],"obtained":[106],"results":[107],"highlight":[108],"robustness":[110],"performance":[112],"approach.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}
