{"id":"https://openalex.org/W3009678820","doi":"https://doi.org/10.1109/icsai48974.2019.9010170","title":"Multi-pass Object Detection Method for Flaw Inspection of Ammeters","display_name":"Multi-pass Object Detection Method for Flaw Inspection of Ammeters","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3009678820","doi":"https://doi.org/10.1109/icsai48974.2019.9010170","mag":"3009678820"},"language":"en","primary_location":{"id":"doi:10.1109/icsai48974.2019.9010170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai48974.2019.9010170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 6th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101932685","display_name":"Guang Shen","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Guang Shen","raw_affiliation_strings":["State Grid Zhejiang Electric Power Co., LTD, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Zhejiang Electric Power Co., LTD, Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011740545","display_name":"Zhiqiang Jiao","orcid":"https://orcid.org/0000-0003-3610-2351"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqiang Jiao","raw_affiliation_strings":["College of Computer Science, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer Science, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005273053","display_name":"Huajiang Yan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Huajiang Yan","raw_affiliation_strings":["Electric Power Research Institute, State Grid Zhejiang Electric Power Co., LTD, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electric Power Research Institute, State Grid Zhejiang Electric Power Co., LTD, Hangzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367039","display_name":"Qiang Wang","orcid":"https://orcid.org/0000-0002-9782-6575"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Wang","raw_affiliation_strings":["College of Computer Science, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer Science, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102662564","display_name":"Chuanzi Xu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chuanzi Xu","raw_affiliation_strings":["State Grid Zhejiang Hangzhou Fuyang District Power Supply Co., LTD, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Zhejiang Hangzhou Fuyang District Power Supply Co., LTD, Hangzhou, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109474600","display_name":"Wen An","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"An Wen","raw_affiliation_strings":["Zhejiang Huayun Information Technology Co., Ltd, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang Huayun Information Technology Co., Ltd, Hangzhou, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.272441,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":null,"first_page":"1600","last_page":"1604"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7717496156692505},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.7505148649215698},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6856749057769775},{"id":"https://openalex.org/keywords/recall-rate","display_name":"Recall rate","score":0.6629955172538757},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6371850967407227},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5230059027671814},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.5210175514221191},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5139941573143005},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.49715641140937805},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.47119972109794617},{"id":"https://openalex.org/keywords/false-positive-rate","display_name":"False positive rate","score":0.41778314113616943}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7717496156692505},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.7505148649215698},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6856749057769775},{"id":"https://openalex.org/C2987098735","wikidata":"https://www.wikidata.org/wiki/Q3808900","display_name":"Recall rate","level":2,"score":0.6629955172538757},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6371850967407227},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5230059027671814},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.5210175514221191},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5139941573143005},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.49715641140937805},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.47119972109794617},{"id":"https://openalex.org/C95922358","wikidata":"https://www.wikidata.org/wiki/Q5432725","display_name":"False positive rate","level":2,"score":0.41778314113616943},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icsai48974.2019.9010170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai48974.2019.9010170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 6th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"},{"id":"mag:3087678112","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=202002218671272369","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1483870316","https://openalex.org/W1487583988","https://openalex.org/W1525954826","https://openalex.org/W1536680647","https://openalex.org/W2102605133","https://openalex.org/W2124386111","https://openalex.org/W2161969291","https://openalex.org/W2163605009","https://openalex.org/W2168356304","https://openalex.org/W2963037989","https://openalex.org/W2963542991","https://openalex.org/W3106250896","https://openalex.org/W3214102110","https://openalex.org/W4293584584"],"related_works":["https://openalex.org/W4298130764","https://openalex.org/W2804364458","https://openalex.org/W2132641928","https://openalex.org/W4310225030","https://openalex.org/W2090259340","https://openalex.org/W1926736923","https://openalex.org/W4292830139","https://openalex.org/W4319309705","https://openalex.org/W1988694625","https://openalex.org/W1974492190"],"abstract_inverted_index":{"In":[0,45],"object":[1,21],"detection":[2,5,22,48,85],"tasks,":[3],"the":[4,35,42,46,50,56,61,64,70,73],"accuracy":[6],"and":[7,59,75,94],"recall":[8,99],"rate":[9,100],"of":[10,28,63,72,92],"small":[11],"size":[12],"are":[13,38,66],"not":[14],"satisfied.":[15],"This":[16],"paper":[17],"proposes":[18],"a":[19,78,89],"multi-pass":[20,84],"algorithm,":[23],"applied":[24],"in":[25,34],"flaw":[26],"inspection":[27],"electric":[29],"metering":[30],"devices.":[31],"The":[32],"images":[33],"training":[36],"set":[37],"categorized":[39],"by":[40,55,77],"clustering":[41],"labeled":[43],"positions.":[44],"first":[47],"pass,":[49],"input":[51],"image":[52,65,74],"is":[53,86],"inspected":[54],"YOLO":[57],"method,":[58],"then":[60],"parts":[62],"cropped":[67],"according":[68],"to":[69,88],"type":[71],"detected":[76],"second":[79],"pass.":[80],"Experiments":[81],"show":[82],"that":[83],"superior":[87],"single":[90],"pass":[91],"detection,":[93],"achieves":[95],"4%":[96],"higher":[97],"average":[98],"than":[101],"single-pass":[102],"detection.":[103]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}