{"id":"https://openalex.org/W3009130355","doi":"https://doi.org/10.1109/icsai48974.2019.9010130","title":"A Comparison of Low-frequency Power Distribution on a Realistic Head Model and a Sphere Model","display_name":"A Comparison of Low-frequency Power Distribution on a Realistic Head Model and a Sphere Model","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3009130355","doi":"https://doi.org/10.1109/icsai48974.2019.9010130","mag":"3009130355"},"language":"en","primary_location":{"id":"doi:10.1109/icsai48974.2019.9010130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai48974.2019.9010130","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 6th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036409798","display_name":"Manling Ge","orcid":"https://orcid.org/0000-0003-1090-441X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Manling Ge","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102352011","display_name":"XianChong Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"XianChong Huang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108361021","display_name":"Minghao Yang","orcid":"https://orcid.org/0000-0001-5397-3576"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minghao Yang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101728100","display_name":"Jiajun Cui","orcid":"https://orcid.org/0000-0002-9000-371X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajun Cui","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zhitong Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhitong Guo","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101780191","display_name":"Fuyi Zhang","orcid":"https://orcid.org/0000-0002-8922-3141"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuyi Zhang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036409798","display_name":"Manling Ge","orcid":"https://orcid.org/0000-0003-1090-441X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Manling Ge","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102352011","display_name":"XianChong Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"XianChong Huang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108361021","display_name":"Minghao Yang","orcid":"https://orcid.org/0000-0001-5397-3576"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Minghao Yang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101728100","display_name":"Jiajun Cui","orcid":"https://orcid.org/0000-0002-9000-371X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajun Cui","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zhitong Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhitong Guo","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101780191","display_name":"Fuyi Zhang","orcid":"https://orcid.org/0000-0002-8922-3141"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuyi Zhang","raw_affiliation_strings":["Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Apparatus Reliability of Hebei Province, Key Laboratory of Electromagnetic Field and Electrical, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25040103,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1418","last_page":"1422"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10429","display_name":"EEG and Brain-Computer Interfaces","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10429","display_name":"EEG and Brain-Computer Interfaces","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10581","display_name":"Neural dynamics and brain function","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2805","display_name":"Cognitive Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electroencephalography","display_name":"Electroencephalography","score":0.6406452655792236},{"id":"https://openalex.org/keywords/dipole","display_name":"Dipole","score":0.570237398147583},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.49171119928359985},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.45994019508361816},{"id":"https://openalex.org/keywords/local-field-potential","display_name":"Local field potential","score":0.4420095682144165},{"id":"https://openalex.org/keywords/moment","display_name":"Moment (physics)","score":0.4350617229938507},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.42210981249809265},{"id":"https://openalex.org/keywords/low-frequency","display_name":"Low frequency","score":0.4191238284111023},{"id":"https://openalex.org/keywords/hilbert-transform","display_name":"Hilbert transform","score":0.4121497869491577},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4046960771083832},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.36031320691108704},{"id":"https://openalex.org/keywords/spectral-density","display_name":"Spectral density","score":0.1888866126537323},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1527385413646698},{"id":"https://openalex.org/keywords/neuroscience","display_name":"Neuroscience","score":0.11195561289787292},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.0940629243850708},{"id":"https://openalex.org/keywords/classical-mechanics","display_name":"Classical mechanics","score":0.0898691713809967}],"concepts":[{"id":"https://openalex.org/C522805319","wikidata":"https://www.wikidata.org/wiki/Q179965","display_name":"Electroencephalography","level":2,"score":0.6406452655792236},{"id":"https://openalex.org/C173523689","wikidata":"https://www.wikidata.org/wiki/Q215589","display_name":"Dipole","level":2,"score":0.570237398147583},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.49171119928359985},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.45994019508361816},{"id":"https://openalex.org/C117838684","wikidata":"https://www.wikidata.org/wiki/Q533483","display_name":"Local field potential","level":2,"score":0.4420095682144165},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.4350617229938507},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.42210981249809265},{"id":"https://openalex.org/C104892082","wikidata":"https://www.wikidata.org/wiki/Q17156810","display_name":"Low frequency","level":2,"score":0.4191238284111023},{"id":"https://openalex.org/C28799612","wikidata":"https://www.wikidata.org/wiki/Q685437","display_name":"Hilbert transform","level":3,"score":0.4121497869491577},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4046960771083832},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.36031320691108704},{"id":"https://openalex.org/C168110828","wikidata":"https://www.wikidata.org/wiki/Q1331626","display_name":"Spectral density","level":2,"score":0.1888866126537323},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1527385413646698},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.11195561289787292},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0940629243850708},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0898691713809967},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsai48974.2019.9010130","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai48974.2019.9010130","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 6th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1915565859","https://openalex.org/W1983813797","https://openalex.org/W2000297198","https://openalex.org/W2025065838","https://openalex.org/W2046022759","https://openalex.org/W2067382614","https://openalex.org/W2127389037","https://openalex.org/W2150844196","https://openalex.org/W2478132315","https://openalex.org/W4250804559"],"related_works":["https://openalex.org/W2010724694","https://openalex.org/W2171706619","https://openalex.org/W2313143838","https://openalex.org/W1974662335","https://openalex.org/W2053041863","https://openalex.org/W2052324890","https://openalex.org/W2024738785","https://openalex.org/W2098754140","https://openalex.org/W3140430094","https://openalex.org/W1968695108"],"abstract_inverted_index":{"Local":[0],"field":[1,92,287],"potential(LFP)":[2],"power":[3,45,133,154,161,295,346],"is":[4],"derived":[5],"from":[6],"the":[7,15,21,31,37,41,52,59,68,73,78,109,123,132,143,146,152,167,173,177,180,191,223,226,231,263,267,283,293,305,320,328,335,339,344,351,356,359,363,367,373,382,390],"scalp":[8,96,360],"EEG,":[9],"whose":[10],"significant":[11,153],"value":[12],"can":[13],"reflect":[14],"strength":[16],"of":[17,33,44,61,80,88,125,148,176,193,216,254,259,269,272,285,289,296,307,310,323,330,341,347,376,378,394],"neural":[18,38],"signal":[19],"in":[20,30,36,67,84,108,222,230,366,370,381],"deep":[22,110,368],"brain,":[23,111,369],"thus":[24],"it":[25,236,300,385],"has":[26],"been":[27,47],"widely":[28],"utilized":[29],"analysis":[32,393],"EEG":[34,56,97,297,348,361,397],"rhythms":[35,349],"system.":[39],"However,":[40],"electrical":[42,286,364],"significance":[43],"hasn't":[46],"understood":[48],"totally":[49],"to":[50,185,205,219,245,338,389],"affect":[51],"accurate":[53],"detection":[54],"on":[55,77,122,166,179,190,262,292,313,343,350],"rhythms.":[57,298,398],"Therefore,":[58,384],"sensitivity":[60],"low-frequency":[62,102,240,294,345,396],"power(a":[63],"wide":[64],"application":[65],"parameter":[66],"practice)":[69],"was":[70,201,237,301],"studied":[71],"by":[72,100,118,137,142,163,319],"forward":[74],"problem,":[75],"based":[76],"theory":[79],"equivalent":[81],"dipole":[82,103,149,217,255,324],"current":[83,218,380],"a":[85,101,126,194,198,276],"generalized":[86],"expression":[87],"EEG.":[89],"The":[90,353],"oscillatory":[91],"potentials(FPs,":[93],"representing":[94],"for":[95,105],"recordings)":[98],"evoked":[99],"current(representing":[104],"rhythmic":[106,331],"generator":[107,332],"6Hz":[112],"sine":[113],"function":[114],"here)":[115],"were":[116,135,170,243],"estimated":[117,136],"finite":[119],"element":[120],"method(FEM)":[121],"surface":[124,182,192],"homogeneous":[127],"one-layer":[128],"head":[129,196,264],"model,":[130,197],"where":[131],"values":[134,158],"Hilbert":[138],"transform":[139],"and":[140,151,257,362,392],"indicated":[141,162],"FPs":[144,178],"at":[145],"amplitude":[147],"current,":[150,256,325],"values(LFP":[155],"SPs,":[156],"those":[157],"beyond":[159],"mean":[160],"warm":[164],"color":[165],"standard":[168],"color-map)":[169],"concerned.":[171],"Because":[172],"analytic":[174],"solution":[175],"sphere":[181],"would":[183],"help":[184],"better":[186],"understand":[187],"LFP":[188,241,273,278,314],"SPs":[189,242],"realistic":[195],"comparison":[199],"study":[200],"performed.":[202],"One":[203],"point":[204],"emphasize,":[206],"we":[207],"supposed":[208],"only":[209],"one":[210],"computational":[211],"setting,":[212],"that,":[213],"moment":[214,321],"direction":[215,329],"be":[220,317,334,387],"different":[221],"study,":[224],"while":[225],"other":[227],"settings":[228],"similar":[229],"computing":[232],"two":[233],"models.":[234],"Similarly,":[235],"found":[238],"that":[239,304,327],"sensitive":[244],"multiple":[246],"factors,":[247],"such":[248],"as,":[249],"brain":[250,290,311],"tissue":[251,291,312],"anisotropy,":[252],"position":[253],"sites":[258],"recording":[260],"electrodes":[261],"surface.":[265],"Additionally,":[266],"feature":[268],"limited":[270],"space":[271],"SP":[274,279,315],"with":[275],"great":[277],"level":[280],"might":[281,386],"character":[282],"effect":[284,306],"conduction":[288],"Reversely,":[299],"firstly":[302],"reported":[303],"anisotropic":[308],"conductivity":[309],"could":[316,333],"reversed":[318],"orientation":[322,377],"implying":[326],"determinant":[336],"factor":[337],"influence":[340],"anisotropy":[342],"scalp.":[352],"work":[354],"mapped":[355],"relationship":[357],"between":[358],"activity":[365],"particular,":[371],"highlighted":[372],"important":[374],"role":[375],"source":[379],"mapping.":[383],"helpful":[388],"measurement":[391],"spontaneous":[395]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}