{"id":"https://openalex.org/W2782802821","doi":"https://doi.org/10.1109/icsai.2017.8248326","title":"Improvement of the anti-aging test device for electronic components","display_name":"Improvement of the anti-aging test device for electronic components","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2782802821","doi":"https://doi.org/10.1109/icsai.2017.8248326","mag":"2782802821"},"language":"en","primary_location":{"id":"doi:10.1109/icsai.2017.8248326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai.2017.8248326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 4th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080733372","display_name":"Ning Jiang","orcid":"https://orcid.org/0000-0002-7771-8665"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Ning Jiang","raw_affiliation_strings":["XI'AN High Voltage Apparatus Research Institute Xi'an, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"XI'AN High Voltage Apparatus Research Institute Xi'an, Xi'an, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001700649","display_name":"Jia Zhuanzhuan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhuanzhuan Jia","raw_affiliation_strings":["XI'AN High Voltage Apparatus Research Institute Xi'an, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"XI'AN High Voltage Apparatus Research Institute Xi'an, Xi'an, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5080733372"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18395412,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"17","issue":null,"first_page":"407","last_page":"411"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","score":0.9789999723434448,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9592000246047974,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.887010931968689},{"id":"https://openalex.org/keywords/residual-current-device","display_name":"Residual-current device","score":0.6730002760887146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5275440216064453},{"id":"https://openalex.org/keywords/current-transformer","display_name":"Current transformer","score":0.5148276686668396},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49936628341674805},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4930841624736786},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.4792468547821045},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4650583863258362},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.44924044609069824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43102747201919556},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4008796811103821}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.887010931968689},{"id":"https://openalex.org/C15116251","wikidata":"https://www.wikidata.org/wiki/Q337716","display_name":"Residual-current device","level":3,"score":0.6730002760887146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5275440216064453},{"id":"https://openalex.org/C133770746","wikidata":"https://www.wikidata.org/wiki/Q856535","display_name":"Current transformer","level":4,"score":0.5148276686668396},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49936628341674805},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4930841624736786},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.4792468547821045},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4650583863258362},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.44924044609069824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43102747201919556},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4008796811103821},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icsai.2017.8248326","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icsai.2017.8248326","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 4th International Conference on Systems and Informatics (ICSAI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2350644057","https://openalex.org/W2380605266","https://openalex.org/W2380044501","https://openalex.org/W2386690649","https://openalex.org/W2357178458","https://openalex.org/W1987608156","https://openalex.org/W2085610745","https://openalex.org/W2364283896","https://openalex.org/W4312991835","https://openalex.org/W2392215035"],"abstract_inverted_index":{"In":[0],"recent":[1],"years,":[2],"the":[3,14,18,22,25,34,44,55,63,66,77,106,117,134,143,159,163,168,175,180],"residual":[4,26,45,78],"current":[5,16,27,46,79,121],"operated":[6,28,47,80],"circuit":[7,20,29,36,48,81],"breaker":[8,30,49],"has":[9],"been":[10],"widely":[11],"used.":[12],"When":[13],"leakage":[15],"in":[17,38,110],"electric":[19],"exceeds":[21],"rated":[23],"value,":[24],"must":[31],"cut":[32],"off":[33],"fault":[35],"quickly":[37],"order":[39,111],"to":[40,54,61,112],"ensure":[41,62],"operator's":[42],"safety,":[43],"should":[50],"be":[51],"tested":[52],"according":[53],"requirements":[56],"of":[57,65,69,76,105,125,137,147,183],"IEC":[58],"61008-1:2012,":[59],"IEC61009-1-2012":[60],"validity":[64],"protection":[67],"function":[68],"its":[70],"electronic":[71,74],"components.":[72],"For":[73],"components":[75],"breaker's":[82],"anti-aging":[83,107],"test,":[84],"existing":[85],"test":[86,108,118,169,176],"devices":[87],"have":[88],"some":[89,103],"disadvantages":[90],"such":[91],"as":[92],"low":[93],"efficiency,":[94],"high":[95],"cost,":[96],"and":[97,120,129,139,141,145,178],"large":[98],"volume,":[99],"this":[100],"paper":[101],"makes":[102],"improvements":[104,172],"device":[109],"overcome":[113],"these":[114],"disadvantages.":[115],"Regulating":[116],"voltage":[119,138],"parameters":[122],"with":[123],"combination":[124],"multiple":[126],"regulating":[127,135],"transformers":[128],"pressure":[130,148],"regulator":[131],"can":[132],"increase":[133,174],"accuracy":[136],"current,":[140],"reduce":[142,179],"capacity":[144],"volume":[146],"regulator,":[149],"it":[150],"also":[151],"realizes":[152],"that":[153],"testing":[154],"on":[155,167],"three":[156],"stations":[157],"at":[158],"same":[160],"time":[161],"through":[162],"photoelectric":[164],"sensors":[165],"set":[166],"stations.":[170],"The":[171],"enormously":[173],"efficiency":[177],"purchase":[181],"cost":[182],"equipment.":[184]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}