{"id":"https://openalex.org/W6922211770","doi":"https://doi.org/10.1109/icrc64395.2024.10937018","title":"Exploration of the viability of TiN/TiO<sub>X</sub> ReRAM in Computational Random-Access Memory (CRAM)","display_name":"Exploration of the viability of TiN/TiO<sub>X</sub> ReRAM in Computational Random-Access Memory (CRAM)","publication_year":2024,"publication_date":"2024-12-16","ids":{"openalex":"https://openalex.org/W6922211770","doi":"https://doi.org/10.1109/icrc64395.2024.10937018"},"language":"en","primary_location":{"id":"doi:10.1109/icrc64395.2024.10937018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icrc64395.2024.10937018","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Rebooting Computing (ICRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Brandon R. Zink","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Brandon R. Zink","raw_affiliation_strings":["National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Advait Madhavan","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Advait Madhavan","raw_affiliation_strings":["National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":null,"display_name":"William A. Borders","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William A. Borders","raw_affiliation_strings":["National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":null,"display_name":"Jabez McClelland","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jabez McClelland","raw_affiliation_strings":["National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology,Alternative Computing Group,Gaithersburg,MD","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":0.222,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58315994,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9406999945640564,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9406999945640564,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.02889999933540821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.012600000016391277,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9596999883651733},{"id":"https://openalex.org/keywords/in-memory-processing","display_name":"In-Memory Processing","score":0.59579998254776},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.47269999980926514},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.4683000147342682},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4237000048160553},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.40720000863075256},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.38999998569488525}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9596999883651733},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7157999873161316},{"id":"https://openalex.org/C123593499","wikidata":"https://www.wikidata.org/wiki/Q6008583","display_name":"In-Memory Processing","level":5,"score":0.59579998254776},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4810999929904938},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.47269999980926514},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.4683000147342682},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4237000048160553},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.40720000863075256},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38999998569488525},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.3547999858856201},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.32330000400543213},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3140999972820282},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.2906999886035919},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.2824000120162964},{"id":"https://openalex.org/C459310","wikidata":"https://www.wikidata.org/wiki/Q117801","display_name":"Computational science","level":1,"score":0.27639999985694885},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2721000015735626},{"id":"https://openalex.org/C186967261","wikidata":"https://www.wikidata.org/wiki/Q5082128","display_name":"Mobile device","level":2,"score":0.26100000739097595},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.2567000091075897},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.25360000133514404}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icrc64395.2024.10937018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icrc64395.2024.10937018","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Rebooting Computing (ICRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1564300396","https://openalex.org/W1986389668","https://openalex.org/W2011591402","https://openalex.org/W2018999650","https://openalex.org/W2025674646","https://openalex.org/W2081729575","https://openalex.org/W2100846455","https://openalex.org/W2545376626","https://openalex.org/W2600716332","https://openalex.org/W2756167909","https://openalex.org/W2884227506","https://openalex.org/W2885064169","https://openalex.org/W2911393769","https://openalex.org/W2942415134","https://openalex.org/W3005997294","https://openalex.org/W3201969852","https://openalex.org/W4285305074","https://openalex.org/W4388626384","https://openalex.org/W4400985292","https://openalex.org/W6629285079","https://openalex.org/W6881312372"],"related_works":[],"abstract_inverted_index":{"In-memory":[0],"computing":[1,23],"is":[2,17,65,121],"a":[3,18,37],"promising":[4,19],"solution":[5],"for":[6],"solving":[7],"the":[8,33,44,51,63,82,110,113,125,141,146,153],"von-Neumann":[9],"bottleneck.":[10],"In":[11,77],"particular,":[12],"computational":[13],"random-access":[14,88],"memory":[15,34,45,89],"(CRAM)":[16],"form":[20],"of":[21,57,84,112,148],"in-memory":[22],"where":[24],"cascading":[25],"logic":[26],"operations":[27],"can":[28,162],"be":[29,163],"performed":[30],"directly":[31],"within":[32],"array.":[35],"However,":[36,134],"recent":[38],"experiment":[39],"utilizing":[40],"magnetoresistve":[41],"devices":[42,72,102],"as":[43,128],"element":[46],"in":[47,54,103,152],"CRAM":[48,68,85,120,129],"only":[49],"gave":[50],"correct":[52],"answer":[53],"63":[55],"%":[56,157],"trials.":[58],"One":[59],"way":[60],"to":[61,66,124],"improve":[62],"accuracy":[64,158],"build":[67],"cells":[69],"using":[70,86,117],"resistive":[71,87,150],"with":[73],"larger":[74],"ON/OFF":[75],"ratios.":[76],"this":[78],"study,":[79],"we":[80,107],"explore":[81],"performance":[83,111],"(ReRAM)":[90],"cells.":[91],"Using":[92],"experimental":[93],"data":[94],"obtained":[95],"from":[96],"various":[97],"TiN/TiO<inf":[98],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">X</inf>-based":[100],"ReRAM":[101,118,154],"Monte":[104],"Carlo":[105],"simulations,":[106],"determine":[108],"that":[109,130,138],"full":[114],"adder":[115],"operation":[116],"based":[119],"still":[122],"subject":[123],"same":[126],"inaccuracies":[127],"utilizes":[131],"magnetoresistive":[132],"devices.":[133],"our":[135],"analysis":[136],"reveals":[137],"by":[139],"reducing":[140],"write":[142],"voltages":[143],"and":[144],"removing":[145],"effects":[147],"complementary":[149],"switching":[151],"devices,":[155],"100":[156],"over":[159],"100,000":[160],"trials":[161],"achieved.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}