{"id":"https://openalex.org/W3197591759","doi":"https://doi.org/10.1109/icra48506.2021.9561265","title":"A Robotic Defect Inspection System for Free-form Specular Surfaces","display_name":"A Robotic Defect Inspection System for Free-form Specular Surfaces","publication_year":2021,"publication_date":"2021-05-30","ids":{"openalex":"https://openalex.org/W3197591759","doi":"https://doi.org/10.1109/icra48506.2021.9561265","mag":"3197591759"},"language":"en","primary_location":{"id":"doi:10.1109/icra48506.2021.9561265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icra48506.2021.9561265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Robotics and Automation (ICRA)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025311829","display_name":"Shengzeng Huo","orcid":"https://orcid.org/0000-0002-7652-8958"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Shengzeng Huo","raw_affiliation_strings":["KLN, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KLN, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056734737","display_name":"David Navarro-Alarc\u00f3n","orcid":"https://orcid.org/0000-0002-3426-6638"},"institutions":[{"id":"https://openalex.org/I14243506","display_name":"Hong Kong Polytechnic University","ror":"https://ror.org/0030zas98","country_code":"HK","type":"education","lineage":["https://openalex.org/I14243506"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"David Navarro-Alarcon","raw_affiliation_strings":["KLN, The Hong Kong Polytechnic University, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KLN, The Hong Kong Polytechnic University, Hong Kong","institution_ids":["https://openalex.org/I14243506"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066570308","display_name":"David Chik","orcid":null},"institutions":[{"id":"https://openalex.org/I146617529","display_name":"Applied Science and Technology Research Institute","ror":"https://ror.org/03xmkea05","country_code":"CN","type":"facility","lineage":["https://openalex.org/I146617529"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"David TW Chik","raw_affiliation_strings":["Hong Kong Applied Science and Technology Research Institute, NT, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hong Kong Applied Science and Technology Research Institute, NT, Hong Kong","institution_ids":["https://openalex.org/I146617529"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.576,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.82632355,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"11364","last_page":"11370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/specular-reflection","display_name":"Specular reflection","score":0.6996605396270752},{"id":"https://openalex.org/keywords/free-form","display_name":"Free form","score":0.5558187961578369},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5091027617454529},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.46603482961654663},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.37841713428497314},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37427622079849243},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.19682937860488892},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10237240791320801}],"concepts":[{"id":"https://openalex.org/C118381688","wikidata":"https://www.wikidata.org/wiki/Q1079524","display_name":"Specular reflection","level":2,"score":0.6996605396270752},{"id":"https://openalex.org/C2987653016","wikidata":"https://www.wikidata.org/wiki/Q5500235","display_name":"Free form","level":2,"score":0.5558187961578369},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5091027617454529},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.46603482961654663},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.37841713428497314},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37427622079849243},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19682937860488892},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10237240791320801}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icra48506.2021.9561265","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icra48506.2021.9561265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Robotics and Automation (ICRA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322214","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63"},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W40743071","https://openalex.org/W206745480","https://openalex.org/W630204197","https://openalex.org/W1484177357","https://openalex.org/W1839579409","https://openalex.org/W1928893876","https://openalex.org/W1998709403","https://openalex.org/W2026416280","https://openalex.org/W2060135360","https://openalex.org/W2119851068","https://openalex.org/W2120694107","https://openalex.org/W2127218421","https://openalex.org/W2145023731","https://openalex.org/W2152864241","https://openalex.org/W2155195832","https://openalex.org/W2155903085","https://openalex.org/W2218716403","https://openalex.org/W2427881153","https://openalex.org/W2591119809","https://openalex.org/W2809390628","https://openalex.org/W2901136733","https://openalex.org/W2905168744","https://openalex.org/W2910608697","https://openalex.org/W3087210109","https://openalex.org/W3118462744","https://openalex.org/W6678914141","https://openalex.org/W6756486208"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,41,55,96],"present":[4],"a":[5,26,111],"robotic":[6],"system":[7],"to":[8,30,62,87,102,115],"automatically":[9],"perform":[10],"defect":[11],"inspection":[12],"tasks":[13],"over":[14],"free-form":[15],"specular":[16],"surfaces,":[17],"which":[18],"the":[19,35,39,49,57,64,74,77,88,92,106,117],"image":[20,99],"acquisition":[21],"sub-system":[22],"is":[23,80],"equipped":[24],"with":[25],"6-DOF":[27],"robot":[28],"manipulator":[29],"achieve":[31],"flexible":[32],"scanning.":[33],"Given":[34],"mesh":[36],"model":[37],"of":[38,91],"workpiece,":[40],"implement":[42],"K-means":[43],"based":[44],"region":[45],"segmentation":[46],"algorithm":[47],"on":[48],"point":[50],"cloud":[51],"after":[52],"preprocessing.":[53],"Then,":[54],"take":[56],"smooth":[58],"regions":[59],"as":[60],"input":[61],"plan":[63],"scanning":[65],"path.":[66],"A":[67],"projection":[68],"registration":[69],"method":[70],"that":[71],"robustly":[72],"localizes":[73],"object":[75],"in":[76],"robot\u2019s":[78],"frame":[79],"proposed":[81,118],"for":[82],"real-time":[83],"workpiece":[84],"localization.":[85],"According":[86],"optical":[89],"features":[90],"high-resolution":[93],"line":[94],"scan,":[95],"design":[97],"an":[98],"processing":[100],"pipeline":[101],"detect":[103],"defects":[104],"from":[105],"captured":[107],"images.":[108],"We":[109],"report":[110],"detailed":[112],"experimental":[113],"study":[114],"validate":[116],"methodology.":[119]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}