{"id":"https://openalex.org/W2608012383","doi":"https://doi.org/10.1109/icpr.2016.7900061","title":"Accurate depth-map refinement by per-pixel plane fitting for stereo vision","display_name":"Accurate depth-map refinement by per-pixel plane fitting for stereo vision","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2608012383","doi":"https://doi.org/10.1109/icpr.2016.7900061","mag":"2608012383"},"language":"en","primary_location":{"id":"doi:10.1109/icpr.2016.7900061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2016.7900061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 23rd International Conference on Pattern Recognition (ICPR)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024900204","display_name":"Masashi Yokozuka","orcid":"https://orcid.org/0000-0001-5716-205X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masashi Yokozuka","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006972026","display_name":"Kohji Tomita","orcid":"https://orcid.org/0000-0001-9796-0443"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohji Tomita","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109844738","display_name":"Osamu Matsumoto","orcid":"https://orcid.org/0009-0000-3725-597X"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Osamu Matsumoto","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078435846","display_name":"Atsuhiko Banno","orcid":"https://orcid.org/0000-0002-6394-5947"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsuhiko Banno","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024900204"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.167,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61619145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"2807","last_page":"2812"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7968225479125977},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7699819207191467},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7297265529632568},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.7196263074874878},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6008062958717346},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.5992673635482788},{"id":"https://openalex.org/keywords/stereopsis","display_name":"Stereopsis","score":0.5423579216003418},{"id":"https://openalex.org/keywords/depth-map","display_name":"Depth map","score":0.5418999195098877},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4763365387916565},{"id":"https://openalex.org/keywords/plane","display_name":"Plane (geometry)","score":0.45521658658981323},{"id":"https://openalex.org/keywords/normal","display_name":"Normal","score":0.41815873980522156},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.3245779871940613},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30750828981399536},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.23304417729377747},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.20653095841407776}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7968225479125977},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7699819207191467},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7297265529632568},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.7196263074874878},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6008062958717346},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.5992673635482788},{"id":"https://openalex.org/C68537008","wikidata":"https://www.wikidata.org/wiki/Q247932","display_name":"Stereopsis","level":2,"score":0.5423579216003418},{"id":"https://openalex.org/C141268832","wikidata":"https://www.wikidata.org/wiki/Q2940499","display_name":"Depth map","level":3,"score":0.5418999195098877},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4763365387916565},{"id":"https://openalex.org/C17825722","wikidata":"https://www.wikidata.org/wiki/Q17285","display_name":"Plane (geometry)","level":2,"score":0.45521658658981323},{"id":"https://openalex.org/C118732077","wikidata":"https://www.wikidata.org/wiki/Q273176","display_name":"Normal","level":3,"score":0.41815873980522156},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.3245779871940613},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30750828981399536},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.23304417729377747},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.20653095841407776}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icpr.2016.7900061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2016.7900061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 23rd International Conference on Pattern Recognition (ICPR)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1509167548","https://openalex.org/W1918878870","https://openalex.org/W1964057156","https://openalex.org/W1981705310","https://openalex.org/W2005089986","https://openalex.org/W2019904315","https://openalex.org/W2109918470","https://openalex.org/W2115362620","https://openalex.org/W2118273112","https://openalex.org/W2121781154","https://openalex.org/W2151646056","https://openalex.org/W2159203540","https://openalex.org/W4229504449","https://openalex.org/W6630621609","https://openalex.org/W6676610624"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2510582230","https://openalex.org/W2978674666","https://openalex.org/W2074430941","https://openalex.org/W2113096305","https://openalex.org/W1977636359","https://openalex.org/W2772305933","https://openalex.org/W4319785932"],"abstract_inverted_index":{"This":[0,107],"paper":[1],"discusses":[2],"the":[3,28,40,54,59,65,103],"refinement":[4],"of":[5,30,42,56,61,67,92,113],"sparse":[6,83],"and":[7,26,58,78,84,96],"noisy":[8,85],"depth-maps":[9],"to":[10,23,38],"improve":[11],"stereo":[12,21,115,124],"measurements.":[13],"Our":[14],"method":[15,73,112],"functions":[16],"as":[17],"a":[18,47,76,82,98,110],"post-filter":[19],"for":[20,126],"measurements,":[22],"remove":[24],"outliers":[25,62,95],"interpolate":[27],"depths":[29],"invalid":[31],"pixels.":[32,128],"Per-pixel":[33],"plane":[34],"fitting":[35],"is":[36],"employed":[37],"estimate":[39],"normals":[41,50],"an":[43],"object's":[44],"surface":[45],"in":[46],"depth-map.":[48],"These":[49],"provide":[51],"information":[52],"regarding":[53],"interpolation":[55],"depth":[57],"removal":[60],"by":[63],"evaluating":[64],"directions":[66],"surfaces.":[68],"In":[69],"our":[70,72],"experiments,":[71],"successfully":[74],"reconstructed":[75],"dense":[77,118],"accurate":[79],"geometry":[80],"from":[81,102],"depth-map,":[86],"even":[87],"where":[88],"several":[89],"dozen":[90],"percent":[91,100],"pixels":[93],"were":[94,101],"only":[97],"few":[99],"original":[104],"correct":[105],"geometry.":[106],"result":[108],"indicates":[109],"novel":[111],"fast":[114],"measurement,":[116],"because":[117],"reconstruction":[119],"can":[120],"be":[121],"performed":[122],"without":[123],"matching":[125],"all":[127]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}