{"id":"https://openalex.org/W2131905586","doi":"https://doi.org/10.1109/icpr.2008.4761181","title":"π-SIFT: A photometric and Scale Invariant Feature Transform","display_name":"π-SIFT: A photometric and Scale Invariant Feature Transform","publication_year":2008,"publication_date":"2008-12-01","ids":{"openalex":"https://openalex.org/W2131905586","doi":"https://doi.org/10.1109/icpr.2008.4761181","mag":"2131905586"},"language":"en","primary_location":{"id":"doi:10.1109/icpr.2008.4761181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2008.4761181","pdf_url":null,"source":{"id":"https://openalex.org/S4393916651","display_name":"Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition","issn_l":"1041-3278","issn":["1041-3278","1051-4651"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 19th International Conference on Pattern Recognition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068836418","display_name":"Jae\u2010Han Park","orcid":"https://orcid.org/0000-0001-5837-3131"},"institutions":[{"id":"https://openalex.org/I89004649","display_name":"Korea Institute of Industrial Technology","ror":"https://ror.org/04qfph657","country_code":"KR","type":"other","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I89004649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Han Park","raw_affiliation_strings":["Korea Institute of Industrial and Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Industrial and Technology, South Korea","institution_ids":["https://openalex.org/I89004649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069919108","display_name":"Kyung-Wook Park","orcid":null},"institutions":[{"id":"https://openalex.org/I89004649","display_name":"Korea Institute of Industrial Technology","ror":"https://ror.org/04qfph657","country_code":"KR","type":"other","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I89004649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyung-Wook Park","raw_affiliation_strings":["Korea Institute of Industrial and Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Industrial and Technology, South Korea","institution_ids":["https://openalex.org/I89004649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012288598","display_name":"Seung\u2010Ho Baeg","orcid":"https://orcid.org/0000-0003-0281-6866"},"institutions":[{"id":"https://openalex.org/I89004649","display_name":"Korea Institute of Industrial Technology","ror":"https://ror.org/04qfph657","country_code":"KR","type":"other","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I89004649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Ho Baeg","raw_affiliation_strings":["Korea Institute of Industrial and Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Industrial and Technology, South Korea","institution_ids":["https://openalex.org/I89004649"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072764066","display_name":"Moon-Hong Baeg","orcid":"https://orcid.org/0000-0001-5493-8238"},"institutions":[{"id":"https://openalex.org/I89004649","display_name":"Korea Institute of Industrial Technology","ror":"https://ror.org/04qfph657","country_code":"KR","type":"other","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I89004649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Moon-Hong Baeg","raw_affiliation_strings":["Korea Institute of Industrial and Technology, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Institute of Industrial and Technology, South Korea","institution_ids":["https://openalex.org/I89004649"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4316,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.51713062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.9394420385360718},{"id":"https://openalex.org/keywords/luminance","display_name":"Luminance","score":0.8129922151565552},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7012729644775391},{"id":"https://openalex.org/keywords/invariant","display_name":"Invariant (physics)","score":0.6492976546287537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5281438827514648},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5250377655029297},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5020644664764404},{"id":"https://openalex.org/keywords/scale-invariance","display_name":"Scale invariance","score":0.4500964283943176},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.40378037095069885},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.356045126914978},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.06870648264884949}],"concepts":[{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.9394420385360718},{"id":"https://openalex.org/C73313986","wikidata":"https://www.wikidata.org/wiki/Q355386","display_name":"Luminance","level":2,"score":0.8129922151565552},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7012729644775391},{"id":"https://openalex.org/C190470478","wikidata":"https://www.wikidata.org/wiki/Q2370229","display_name":"Invariant (physics)","level":2,"score":0.6492976546287537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5281438827514648},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5250377655029297},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5020644664764404},{"id":"https://openalex.org/C135593079","wikidata":"https://www.wikidata.org/wiki/Q1750766","display_name":"Scale invariance","level":2,"score":0.4500964283943176},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.40378037095069885},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.356045126914978},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.06870648264884949},{"id":"https://openalex.org/C37914503","wikidata":"https://www.wikidata.org/wiki/Q156495","display_name":"Mathematical physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icpr.2008.4761181","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2008.4761181","pdf_url":null,"source":{"id":"https://openalex.org/S4393916651","display_name":"Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition","issn_l":"1041-3278","issn":["1041-3278","1051-4651"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 19th International Conference on Pattern Recognition","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1597084354","https://openalex.org/W1677409904","https://openalex.org/W1980911747","https://openalex.org/W1991135461","https://openalex.org/W2111308925","https://openalex.org/W2118153703","https://openalex.org/W2129116707","https://openalex.org/W2145072179","https://openalex.org/W2151103935","https://openalex.org/W2151861336","https://openalex.org/W2296249689","https://openalex.org/W6637400245"],"related_works":["https://openalex.org/W3034955165","https://openalex.org/W2094920358","https://openalex.org/W2041448692","https://openalex.org/W2247121321","https://openalex.org/W2391926582","https://openalex.org/W2049930962","https://openalex.org/W2326240252","https://openalex.org/W2097033632","https://openalex.org/W2021670453","https://openalex.org/W2021783512"],"abstract_inverted_index":{"For":[0],"many":[1],"years,":[2],"various":[3],"local":[4,31,70],"descriptors":[5,32],"that":[6,73],"are":[7,40,74],"insensitive":[8],"to":[9,24,53,76,84],"geometric":[10,78],"changes":[11],"such":[12,56],"as":[13,57],"viewpoint,":[14],"rotation,":[15],"and":[16,60,79],"scale":[17],"changes,":[18],"have":[19],"been":[20],"attracting":[21],"attention":[22],"due":[23],"their":[25],"promising":[26],"performance.":[27],"However,":[28],"most":[29],"existing":[30],"including":[33],"the":[34,95,102],"SIFT":[35],"(Scale":[36],"Invariant":[37],"Feature":[38],"Transform)":[39],"based":[41,93],"on":[42,94],"luminance":[43],"information":[44,48],"rather":[45],"than":[46],"color":[47],"thereby":[49],"resulting":[50],"in":[51],"instability":[52],"photometric":[54,80,86,90],"variations":[55],"shadows,":[58],"highlights,":[59],"illumination":[61],"changes.":[62],"In":[63,82],"this":[64],"paper,":[65],"we":[66,88],"propose":[67],"a":[68],"novel":[69],"descriptor,":[71],"\u03c0-SIFT,":[72],"invariant":[75],"both":[77],"variations.":[81],"order":[83],"achieve":[85],"invariance,":[87],"adopt":[89],"quasi-invariant":[91],"features":[92],"dichromatic":[96],"reflection":[97],"model.":[98],"The":[99],"performance":[100],"of":[101],"proposed":[103],"descriptor":[104],"is":[105],"evaluated":[106],"with":[107],"SIFT.":[108]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}