{"id":"https://openalex.org/W2123163343","doi":"https://doi.org/10.1109/icpr.2002.1048201","title":"A fast and precise system for taking high-density human head measurements with surrounding range finders","display_name":"A fast and precise system for taking high-density human head measurements with surrounding range finders","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2123163343","doi":"https://doi.org/10.1109/icpr.2002.1048201","mag":"2123163343"},"language":"en","primary_location":{"id":"doi:10.1109/icpr.2002.1048201","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2002.1048201","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Object recognition supported by user interaction for service robots","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052489383","display_name":"Atsushi Marugame","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"A. Marugame","raw_affiliation_strings":["Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","Multimedia Research Labs., NEC Corporation, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"Multimedia Research Labs., NEC Corporation, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082805595","display_name":"Shizuo Sakamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Sakamoto","raw_affiliation_strings":["Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","Multimedia Research Labs., NEC Corporation, Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"Multimedia Research Labs., NEC Corporation, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007113848","display_name":"Tetsuya Yoshinaga","orcid":"https://orcid.org/0000-0003-4994-0522"},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"T. Yoshinaga","raw_affiliation_strings":["CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","NEC Engineering, Limited"],"affiliations":[{"raw_affiliation_string":"CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":"NEC Engineering, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079271145","display_name":"K. Miyaoka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"K. Miyaoka","raw_affiliation_strings":["CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","NEC Engineering, Limited"],"affiliations":[{"raw_affiliation_string":"CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":"NEC Engineering, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058729603","display_name":"O. Fujimori","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"O. Fujimori","raw_affiliation_strings":["CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","NEC Engineering, Limited"],"affiliations":[{"raw_affiliation_string":"CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":"NEC Engineering, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074067640","display_name":"Yukio Yamada","orcid":"https://orcid.org/0000-0002-3747-8767"},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Y. Yamada","raw_affiliation_strings":["CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","NEC Engineering, Limited"],"affiliations":[{"raw_affiliation_string":"CyberSolutions Division, NEC Engineering Limited, Fuchu, Tokyo, Japan","institution_ids":[]},{"raw_affiliation_string":"NEC Engineering, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110483452","display_name":"Y. Kitano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]},{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["GB","JP"],"is_corresponding":false,"raw_author_name":"Y. Kitano","raw_affiliation_strings":["Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","NEC Informatec Systems, Limited"],"affiliations":[{"raw_affiliation_string":"Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Informatec Systems, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009130406","display_name":"H. Kabano","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]},{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB","JP"],"is_corresponding":false,"raw_author_name":"H. Kabano","raw_affiliation_strings":["Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","NEC Informatec Systems, Limited"],"affiliations":[{"raw_affiliation_string":"Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Informatec Systems, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085656761","display_name":"WeiHong Tong","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]},{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]}],"countries":["GB","JP"],"is_corresponding":false,"raw_author_name":"W. Tong","raw_affiliation_strings":["Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","NEC Informatec Systems, Limited"],"affiliations":[{"raw_affiliation_string":"Platjorm Software Division, NEC Informatec Systems Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Informatec Systems, Limited","institution_ids":["https://openalex.org/I4210161085"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111642514","display_name":"Johji Tajima","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161085","display_name":"NEC Technologies (United Kingdom)","ror":"https://ror.org/0587waj50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210161085"]},{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["GB","JP"],"is_corresponding":false,"raw_author_name":"J. Tajima","raw_affiliation_strings":["Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","NEC Informatec Systems, Limited"],"affiliations":[{"raw_affiliation_string":"Multimedia Research Laboratories, NEC Corporation Limited, Kawasaki, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]},{"raw_affiliation_string":"NEC Informatec Systems, Limited","institution_ids":["https://openalex.org/I4210161085"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5052489383"],"corresponding_institution_ids":["https://openalex.org/I118347220"],"apc_list":null,"apc_paid":null,"fwci":0.2669,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5918651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3","issue":null,"first_page":"978","last_page":"982"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/head","display_name":"Head (geology)","score":0.7578901052474976},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.6355072259902954},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.632889449596405},{"id":"https://openalex.org/keywords/human-head","display_name":"Human head","score":0.53579181432724},{"id":"https://openalex.org/keywords/chin","display_name":"Chin","score":0.5352582931518555},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.4531365931034088},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.40065112709999084},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.38556036353111267},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.1913112998008728},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15409883856773376},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.12958428263664246},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11981427669525146}],"concepts":[{"id":"https://openalex.org/C2780312720","wikidata":"https://www.wikidata.org/wiki/Q5689100","display_name":"Head (geology)","level":2,"score":0.7578901052474976},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.6355072259902954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.632889449596405},{"id":"https://openalex.org/C2780549717","wikidata":"https://www.wikidata.org/wiki/Q3409626","display_name":"Human head","level":3,"score":0.53579181432724},{"id":"https://openalex.org/C2779881321","wikidata":"https://www.wikidata.org/wiki/Q82714","display_name":"Chin","level":2,"score":0.5352582931518555},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.4531365931034088},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40065112709999084},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38556036353111267},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.1913112998008728},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15409883856773376},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.12958428263664246},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11981427669525146},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C114793014","wikidata":"https://www.wikidata.org/wiki/Q52109","display_name":"Geomorphology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icpr.2002.1048201","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2002.1048201","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Object recognition supported by user interaction for service robots","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W159410591","https://openalex.org/W1995589389","https://openalex.org/W2035754981","https://openalex.org/W2053939793","https://openalex.org/W2088535827","https://openalex.org/W2090353204","https://openalex.org/W2124535811","https://openalex.org/W2130755868","https://openalex.org/W2162569595","https://openalex.org/W6606545912"],"related_works":["https://openalex.org/W2292270636","https://openalex.org/W2434467261","https://openalex.org/W2167872441","https://openalex.org/W2956637324","https://openalex.org/W2119703321","https://openalex.org/W4302967677","https://openalex.org/W1985149223","https://openalex.org/W2352266088","https://openalex.org/W2092147473","https://openalex.org/W1523334596"],"abstract_inverted_index":{"Presents":[0],"a":[1,67],"head":[2,15],"measurement":[3,26],"system":[4,43,105],"with":[5,84],"surrounding":[6],"range":[7],"finders,":[8],"which":[9],"enables":[10,72],"highly":[11],"dense":[12],"3-D":[13,100],"human":[14,40,58],"shape":[16],"measurements":[17,73],"to":[18,81,109],"be":[19,82,107],"taken":[20,83],"quickly":[21],"and":[22,63],"precisely.":[23],"Since":[24],"short":[25],"time":[27],"is":[28],"as":[29,31,87,89],"important":[30],"the":[32,39,42,57,61,64,104],"inherent":[33],"accuracy":[34],"of":[35,56],"instruments":[36],"for":[37],"measuring":[38],"body,":[41],"concurrently":[44],"controls":[45],"multiple":[46],"rangefinders":[47],"at":[48],"video":[49],"rate.":[50],"It":[51],"can":[52],"capture":[53],"all":[54],"images":[55],"head,":[59],"including":[60],"top":[62],"chin,":[65],"within":[66],"single":[68],"second.":[69],"Moreover,":[70],"it":[71],"less":[74],"than":[75],"1":[76],"mm/sup":[77],"2/":[78],"in":[79],"density":[80],"average":[85],"error":[86],"low":[88],"0.4":[90],"mm.":[91],"No":[92],"conventional":[93],"systems":[94],"have":[95],"both":[96],"these":[97],"advantages.":[98],"The":[99],"data":[101],"acquired":[102],"by":[103],"will":[106],"utilized":[108],"design":[110],"ergonomic":[111],"products.":[112]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}