{"id":"https://openalex.org/W2122359896","doi":"https://doi.org/10.1109/icphm.2015.7245016","title":"Development and evaluation of health monitoring techniques for railway point machines","display_name":"Development and evaluation of health monitoring techniques for railway point machines","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W2122359896","doi":"https://doi.org/10.1109/icphm.2015.7245016","mag":"2122359896"},"language":"en","primary_location":{"id":"doi:10.1109/icphm.2015.7245016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icphm.2015.7245016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Prognostics and Health Management (PHM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103244874","display_name":"Wenjing Jin","orcid":"https://orcid.org/0009-0008-1846-0458"},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wenjing Jin","raw_affiliation_strings":["NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA"],"affiliations":[{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101470634","display_name":"Zhe Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhe Shi","raw_affiliation_strings":["NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA"],"affiliations":[{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103643649","display_name":"David Siegel","orcid":null},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Siegel","raw_affiliation_strings":["NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA"],"affiliations":[{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024973618","display_name":"Pierre Dersin","orcid":"https://orcid.org/0000-0003-2268-5277"},"institutions":[{"id":"https://openalex.org/I36169673","display_name":"Alstom (France)","ror":"https://ror.org/00t4db855","country_code":"FR","type":"company","lineage":["https://openalex.org/I36169673"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pierre Dersin","raw_affiliation_strings":["RAM Center of Excellence, Information Solutions, France (St-Ouen)","RAM Center of Excellence, Information Solutions, ALSTOM Transnort, France (St-Ouen)"],"affiliations":[{"raw_affiliation_string":"RAM Center of Excellence, Information Solutions, France (St-Ouen)","institution_ids":[]},{"raw_affiliation_string":"RAM Center of Excellence, Information Solutions, ALSTOM Transnort, France (St-Ouen)","institution_ids":["https://openalex.org/I36169673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013467396","display_name":"Cyril Douziech","orcid":null},"institutions":[{"id":"https://openalex.org/I36169673","display_name":"Alstom (France)","ror":"https://ror.org/00t4db855","country_code":"FR","type":"company","lineage":["https://openalex.org/I36169673"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Cyril Douziech","raw_affiliation_strings":["RAM Center of Excellence, Information Solutions, France (St-Ouen)","RAM Center of Excellence, Information Solutions, ALSTOM Transnort, France (St-Ouen)"],"affiliations":[{"raw_affiliation_string":"RAM Center of Excellence, Information Solutions, France (St-Ouen)","institution_ids":[]},{"raw_affiliation_string":"RAM Center of Excellence, Information Solutions, ALSTOM Transnort, France (St-Ouen)","institution_ids":["https://openalex.org/I36169673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018202934","display_name":"Michele Pugnaloni","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michele Pugnaloni","raw_affiliation_strings":["RAM Department, Information Solutions, Italy (Bologna)","RAM Department, Information Solutions, ALSTOM Transport, Italy (Bologna)"],"affiliations":[{"raw_affiliation_string":"RAM Department, Information Solutions, Italy (Bologna)","institution_ids":[]},{"raw_affiliation_string":"RAM Department, Information Solutions, ALSTOM Transport, Italy (Bologna)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058845701","display_name":"Piero La Cascia","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Piero La Cascia","raw_affiliation_strings":["RAM Department, Information Solutions, Italy (Bologna)","RAM Department, Information Solutions, ALSTOM Transport, Italy (Bologna)"],"affiliations":[{"raw_affiliation_string":"RAM Department, Information Solutions, Italy (Bologna)","institution_ids":[]},{"raw_affiliation_string":"RAM Department, Information Solutions, ALSTOM Transport, Italy (Bologna)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100686648","display_name":"Jay Lee","orcid":"https://orcid.org/0000-0002-4022-4274"},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jay Lee","raw_affiliation_strings":["NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA"],"affiliations":[{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF I/UCRC for Intelligent Maintenance Systems (IMS), University of Cincinnati, Cincinnati, OH 45221 USA","institution_ids":["https://openalex.org/I63135867"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5103244874"],"corresponding_institution_ids":["https://openalex.org/I63135867"],"apc_list":null,"apc_paid":null,"fwci":2.0391,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.88065081,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9610999822616577,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.6872080564498901},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6186319589614868},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5279017090797424},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.5072383880615234},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.48984310030937195},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4749327301979065},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46688786149024963},{"id":"https://openalex.org/keywords/false-alarm","display_name":"False alarm","score":0.4592471122741699},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4443177580833435},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.44393235445022583},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4106835722923279},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29667896032333374}],"concepts":[{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.6872080564498901},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6186319589614868},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5279017090797424},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.5072383880615234},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.48984310030937195},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4749327301979065},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46688786149024963},{"id":"https://openalex.org/C2776836416","wikidata":"https://www.wikidata.org/wiki/Q1364844","display_name":"False alarm","level":2,"score":0.4592471122741699},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4443177580833435},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.44393235445022583},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4106835722923279},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29667896032333374},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icphm.2015.7245016","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icphm.2015.7245016","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE Conference on Prognostics and Health Management (PHM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1989560862","https://openalex.org/W1990517717","https://openalex.org/W2011092307","https://openalex.org/W2034766449","https://openalex.org/W2061482291","https://openalex.org/W2084566093","https://openalex.org/W2098761778","https://openalex.org/W2107723392","https://openalex.org/W2116518242","https://openalex.org/W2158363765","https://openalex.org/W2171835421","https://openalex.org/W2540839912","https://openalex.org/W2895467277","https://openalex.org/W6754972181"],"related_works":["https://openalex.org/W2310476526","https://openalex.org/W3213192587","https://openalex.org/W2144291498","https://openalex.org/W2535730979","https://openalex.org/W2370073012","https://openalex.org/W4386567722","https://openalex.org/W2168646784","https://openalex.org/W2030958945","https://openalex.org/W2466930957","https://openalex.org/W3182014137"],"abstract_inverted_index":{"A":[0,164],"more":[1,238],"predictive":[2,38],"maintenance":[3],"approach":[4,242],"for":[5,20,41,65,78,99,111,123,214,243,250,263,271,277],"railway":[6,22],"point":[7,45,71,100,115,174,278],"machines":[8],"can":[9],"lead":[10],"to":[11,145,160],"fewer":[12],"delays,":[13],"lower":[14],"operating":[15],"costs,":[16],"and":[17,31,62,74,80,95,127,130,137,154,180,190,203,222,240,268],"improved":[18,248],"safety":[19],"the":[21,34,42,53,56,67,82,90,93,124,143,147,157,173,207,224,265],"industry.":[23],"However,":[24],"achieving":[25],"this":[26,196,273],"improvement":[27],"in":[28,117,195],"reliability,":[29],"availability,":[30],"maintainability,":[32],"necessitates":[33],"development":[35,91,108,129],"of":[36,44,58,70,92,134,149,156,166,217,227],"a":[37,75,119,230,237],"monitoring":[39,48,106,275],"system":[40,49,276],"fleet":[43],"machines.":[46,279],"This":[47,85],"would":[50],"include":[51,171,236],"acquiring":[52],"appropriate":[54,266],"signals,":[55],"use":[57],"advanced":[59],"pattern":[60,96],"recognition":[61,97],"statistical":[63,94,177],"methods":[64],"finding":[66],"early":[68],"symptoms":[69],"machine":[72,101,175],"degradation,":[73,219],"user":[76],"interface":[77],"displaying":[79],"reporting":[81],"health":[83,102,105,182,208,274],"results.":[84],"research":[86],"effort":[87],"focuses":[88],"on":[89,142],"tools":[98,184],"monitoring.":[103],"The":[104,132,198],"algorithm":[107,128,159,167],"was":[109,121],"performed":[110],"an":[112,247,254],"MET":[113],"electromechanical":[114],"machine,":[116],"which":[118,170],"test-bed":[120,144],"constructed":[122],"data":[125],"collection":[126],"validation.":[131],"introduction":[133],"seeded":[135],"faults":[136],"degraded":[138],"conditions":[139],"were":[140,193],"used":[141,194],"determine":[146],"level":[148],"accuracy,":[150],"false":[151],"alarm":[152],"rate,":[153],"sensitivity":[155],"health-monitoring":[158],"various":[161,215],"failure":[162],"modes.":[163],"series":[165],"processing":[168],"steps,":[169],"segmenting":[172],"movements,":[176],"feature":[178],"extraction,":[179],"multivariate":[181],"assessment":[183,210],"such":[185],"as":[186],"principal":[187],"component":[188],"analysis":[189],"self-organizing":[191],"maps":[192],"study.":[197],"results":[199],"showed":[200],"significant":[201],"promise,":[202],"it":[204],"appears":[205],"that":[206],"condition":[209],"is":[211,258],"quite":[212],"good":[213],"levels":[216,226],"friction":[218],"obstacle":[220],"detection,":[221],"detecting":[223],"higher":[225],"misalignment.":[228],"From":[229,253],"technical":[231],"perspective,":[232,256],"future":[233],"work":[234,261],"could":[235],"robust":[239],"general":[241],"segmentation,":[244],"along":[245],"with":[246],"method":[249],"threshold":[251],"setting.":[252],"implementation":[255],"there":[257],"still":[259],"additional":[260],"needed":[262],"selecting":[264],"hardware":[267],"software":[269],"platform":[270],"deploying":[272]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2026-03-09T08:58:05.943551","created_date":"2025-10-10T00:00:00"}