{"id":"https://openalex.org/W4321488637","doi":"https://doi.org/10.1109/icoin56518.2023.10048911","title":"Advanced Signal Processing of Photo-Excited Current Spectroscopy Based on Trap State Distribution for Photo-Sensor Applications","display_name":"Advanced Signal Processing of Photo-Excited Current Spectroscopy Based on Trap State Distribution for Photo-Sensor Applications","publication_year":2023,"publication_date":"2023-01-11","ids":{"openalex":"https://openalex.org/W4321488637","doi":"https://doi.org/10.1109/icoin56518.2023.10048911"},"language":"en","primary_location":{"id":"doi:10.1109/icoin56518.2023.10048911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icoin56518.2023.10048911","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Information Networking (ICOIN)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100389863","display_name":"Dongwook Kim","orcid":"https://orcid.org/0000-0002-5687-7739"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongwook Kim","raw_affiliation_strings":["Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","institution_ids":["https://openalex.org/I236437131","https://openalex.org/I146824383"]},{"raw_affiliation_string":"Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100355270","display_name":"Hyunju Lee","orcid":"https://orcid.org/0000-0003-3742-7115"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunju Lee","raw_affiliation_strings":["Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","institution_ids":["https://openalex.org/I236437131","https://openalex.org/I146824383"]},{"raw_affiliation_string":"Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029261190","display_name":"Jung-Hyok Kwon","orcid":"https://orcid.org/0000-0001-6617-6541"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jung-Hyok Kwon","raw_affiliation_strings":["Hallym University Chuncheon,Smart Computing Laboratory,Gangwon-do,Korea","Smart Computing Laboratory, Hallym University Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University Chuncheon,Smart Computing Laboratory,Gangwon-do,Korea","institution_ids":["https://openalex.org/I146824383","https://openalex.org/I236437131"]},{"raw_affiliation_string":"Smart Computing Laboratory, Hallym University Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101727600","display_name":"Jaehoon Park","orcid":"https://orcid.org/0000-0002-8008-8035"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehoon Park","raw_affiliation_strings":["Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","institution_ids":["https://openalex.org/I236437131","https://openalex.org/I146824383"]},{"raw_affiliation_string":"Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100654725","display_name":"Bokyoung Kim","orcid":"https://orcid.org/0000-0002-8999-1108"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bokyoung Kim","raw_affiliation_strings":["Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University Chuncheon,Department of Electronic Engineering,Gangwon-do,Korea","institution_ids":["https://openalex.org/I236437131","https://openalex.org/I146824383"]},{"raw_affiliation_string":"Department of Electronic Engineering, Hallym University Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058408401","display_name":"Eui\u2010Jik Kim","orcid":"https://orcid.org/0000-0003-4475-8107"},"institutions":[{"id":"https://openalex.org/I146824383","display_name":"Hallym University","ror":"https://ror.org/03sbhge02","country_code":"KR","type":"education","lineage":["https://openalex.org/I146824383"]},{"id":"https://openalex.org/I236437131","display_name":"Hallym Polytechnic University","ror":"https://ror.org/013zxek87","country_code":"KR","type":"education","lineage":["https://openalex.org/I236437131"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eui-Jik Kim","raw_affiliation_strings":["Hallym University,Division of Software,Chuncheon, Gangwon-do,Korea","Division of Software, Hallym University, Chuncheon, Gangwon-do, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hallym University,Division of Software,Chuncheon, Gangwon-do,Korea","institution_ids":["https://openalex.org/I146824383","https://openalex.org/I236437131"]},{"raw_affiliation_string":"Division of Software, Hallym University, Chuncheon, Gangwon-do, Korea","institution_ids":["https://openalex.org/I146824383"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"511","last_page":"516"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photocurrent","display_name":"Photocurrent","score":0.7566431760787964},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.7406915426254272},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6631020307540894},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.615563690662384},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5263258814811707},{"id":"https://openalex.org/keywords/excited-state","display_name":"Excited state","score":0.44161468744277954},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.33576273918151855},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.21054509282112122},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.1976577341556549},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.17575642466545105},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1546507179737091}],"concepts":[{"id":"https://openalex.org/C2779845233","wikidata":"https://www.wikidata.org/wiki/Q3381567","display_name":"Photocurrent","level":2,"score":0.7566431760787964},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.7406915426254272},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6631020307540894},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.615563690662384},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5263258814811707},{"id":"https://openalex.org/C181500209","wikidata":"https://www.wikidata.org/wiki/Q215328","display_name":"Excited state","level":2,"score":0.44161468744277954},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.33576273918151855},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.21054509282112122},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.1976577341556549},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17575642466545105},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1546507179737091},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icoin56518.2023.10048911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icoin56518.2023.10048911","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Information Networking (ICOIN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1979449187","https://openalex.org/W2011366942","https://openalex.org/W2041901107","https://openalex.org/W2067671907","https://openalex.org/W2072959606","https://openalex.org/W2142785713","https://openalex.org/W2150265823","https://openalex.org/W2162368154","https://openalex.org/W2312414961","https://openalex.org/W2345181346","https://openalex.org/W2621524440","https://openalex.org/W2749508313","https://openalex.org/W2751309266","https://openalex.org/W2751322429","https://openalex.org/W2768694643","https://openalex.org/W2786433237","https://openalex.org/W3151991628","https://openalex.org/W6685900085"],"related_works":["https://openalex.org/W1980709495","https://openalex.org/W2588815396","https://openalex.org/W1988655443","https://openalex.org/W2027791172","https://openalex.org/W2902546961","https://openalex.org/W3184800639","https://openalex.org/W2055378928","https://openalex.org/W2067385249","https://openalex.org/W2058676402","https://openalex.org/W4237468622"],"abstract_inverted_index":{"An":[0],"improved":[1,96],"measurement":[2,93,97],"method":[3,29,94],"using":[4],"photocurrent":[5,34],"spectroscopy":[6,79,88],"of":[7,21,60,70,75],"an":[8],"amorphous":[9],"indium-zinc-oxide":[10],"(a-IZO)":[11],"optical":[12],"sensor":[13],"is":[14],"proposed":[15,77],"to":[16,102],"analytically":[17],"calculate":[18],"the":[19,26,33,39,45,52,57,67,71,76],"density":[20],"state":[22,54],"(DOS)":[23],"distributions.":[24],"In":[25,50],"signal":[27,47,69],"conversion":[28],"for":[30],"DOS":[31],"calculation,":[32],"spectrum":[35],"was":[36,48,63,80],"measured":[37],"in":[38,56],"on-state":[40],"and":[41,44,99],"off-state":[42],"regions":[43],"current":[46],"converted.":[49],"addition,":[51],"trap":[53],"distribution":[55],"band":[58],"gap":[59],"a-IZO":[61],"semiconductor":[62],"modeled":[64],"by":[65],"calculating":[66],"photo-current":[68,91],"photo-sensor.":[72],"The":[73],"validity":[74],"photo-carrier":[78],"verified":[81],"through":[82],"comparison":[83],"with":[84],"photo-excited":[85],"charge":[86],"collection":[87],"analysis.":[89,105],"This":[90],"spectroscopy-based":[92],"greatly":[95],"duration":[98],"accuracy":[100],"compared":[101],"threshold":[103],"voltage-based":[104]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}