{"id":"https://openalex.org/W4367146063","doi":"https://doi.org/10.1109/icmre56789.2023.10106579","title":"Wavelet Scattering Cyclostationarity Representation for Machine Intelligent Fault Diagnosis","display_name":"Wavelet Scattering Cyclostationarity Representation for Machine Intelligent Fault Diagnosis","publication_year":2023,"publication_date":"2023-02-10","ids":{"openalex":"https://openalex.org/W4367146063","doi":"https://doi.org/10.1109/icmre56789.2023.10106579"},"language":"en","primary_location":{"id":"doi:10.1109/icmre56789.2023.10106579","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icmre56789.2023.10106579","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Conference on Mechatronics and Robotics Engineering (ICMRE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100362895","display_name":"Chao Liu","orcid":"https://orcid.org/0000-0001-8683-3473"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Liu","raw_affiliation_strings":["Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083568368","display_name":"Tianyu Han","orcid":"https://orcid.org/0000-0002-6837-4901"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyu Han","raw_affiliation_strings":["Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060711016","display_name":"Xi Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Shi","raw_affiliation_strings":["Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiao Tong University,School of Mechanical Engineering,Shanghai,China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03962577,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"251","last_page":"256"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9793000221252441,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spectrogram","display_name":"Spectrogram","score":0.7707761526107788},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6212566494941711},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.5901396870613098},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5865595936775208},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.562645673751831},{"id":"https://openalex.org/keywords/extractor","display_name":"Extractor","score":0.5521508455276489},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5467795133590698},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49606117606163025},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.4259444773197174},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.3586287498474121},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26739001274108887}],"concepts":[{"id":"https://openalex.org/C45273575","wikidata":"https://www.wikidata.org/wiki/Q578970","display_name":"Spectrogram","level":2,"score":0.7707761526107788},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6212566494941711},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.5901396870613098},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5865595936775208},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.562645673751831},{"id":"https://openalex.org/C117978034","wikidata":"https://www.wikidata.org/wiki/Q5422192","display_name":"Extractor","level":2,"score":0.5521508455276489},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5467795133590698},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49606117606163025},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4259444773197174},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.3586287498474121},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26739001274108887},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icmre56789.2023.10106579","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icmre56789.2023.10106579","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 9th International Conference on Mechatronics and Robotics Engineering (ICMRE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W625540141","https://openalex.org/W1481866092","https://openalex.org/W1970166607","https://openalex.org/W1976479130","https://openalex.org/W1989618028","https://openalex.org/W1994906459","https://openalex.org/W2003202593","https://openalex.org/W2022706486","https://openalex.org/W2028328787","https://openalex.org/W2030252539","https://openalex.org/W2042892597","https://openalex.org/W2045186954","https://openalex.org/W2064324093","https://openalex.org/W2069962935","https://openalex.org/W2072072671","https://openalex.org/W2072525556","https://openalex.org/W2093231248","https://openalex.org/W2128424195","https://openalex.org/W2165878107","https://openalex.org/W2261689926","https://openalex.org/W2556013418","https://openalex.org/W2791694051","https://openalex.org/W2803884688","https://openalex.org/W2904218127","https://openalex.org/W2973516129","https://openalex.org/W2998506103","https://openalex.org/W3100766587","https://openalex.org/W3106050203","https://openalex.org/W3108701224","https://openalex.org/W3157855421","https://openalex.org/W4304943331"],"related_works":["https://openalex.org/W2530685530","https://openalex.org/W4375868962","https://openalex.org/W2011227383","https://openalex.org/W2953302367","https://openalex.org/W2945706271","https://openalex.org/W4387435415","https://openalex.org/W2114169842","https://openalex.org/W2077021924","https://openalex.org/W2535808783","https://openalex.org/W3183408266"],"abstract_inverted_index":{"Machine":[0],"intelligent":[1],"fault":[2,16],"diagnosis(IFD)":[3],"model":[4,73],"consists":[5],"of":[6,23],"a":[7,11,69,96],"feature":[8,28,80],"extractor":[9,29,81],"and":[10,54,100,109],"pattern":[12],"classifier.":[13],"As":[14,68],"machine":[15],"information":[17],"is":[18],"conveyed":[19],"by":[20,64],"the":[21,24,27,32,39,71,79],"cyclostationarity":[22,35,45,76,98],"monitored":[25,33],"signals,":[26],"should":[30],"capture":[31],"signal\u2019s":[34],"to":[36,60,104,111],"ensure":[37],"feeding":[38],"classifier":[40],"with":[41],"diagnostic-relevant":[42],"features.":[43],"Conventional":[44],"representations,":[46],"e.g.,":[47],"cyclic":[48,51],"spectral":[49],"correlation(CSC),":[50],"modulation":[52],"spectrum(CMS),":[53],"multi-scale":[55],"envelope":[56],"spectrogram(MuSEnS),":[57],"are":[58],"unstable":[59],"signal":[61],"deformation":[62],"caused":[63],"working":[65,85,105],"condition":[66,86,106],"variability.":[67],"result,":[70],"IFD":[72],"taking":[74],"conventional":[75],"representation":[77,99],"as":[78,95],"will":[82],"deteriorate":[83],"when":[84],"variation":[87],"occurs.":[88],"This":[89],"current":[90],"work":[91],"formulates":[92],"wavelet":[93],"scattering":[94],"novel":[97],"verifies":[101],"its":[102],"stability":[103],"variability":[107],"theoretically":[108],"experimentally":[110],"remedy":[112],"this":[113],"gap.":[114]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}