{"id":"https://openalex.org/W4408897056","doi":"https://doi.org/10.1109/icmlc63072.2024.10935084","title":"Developing A Tire Inner Surface Appearance Inspection System using A Good Learning Appearance Inspection AI","display_name":"Developing A Tire Inner Surface Appearance Inspection System using A Good Learning Appearance Inspection AI","publication_year":2024,"publication_date":"2024-09-20","ids":{"openalex":"https://openalex.org/W4408897056","doi":"https://doi.org/10.1109/icmlc63072.2024.10935084"},"language":"en","primary_location":{"id":"doi:10.1109/icmlc63072.2024.10935084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc63072.2024.10935084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Machine Learning and Cybernetics (ICMLC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005453849","display_name":"Daiki Nishioka","orcid":"https://orcid.org/0000-0002-3369-7700"},"institutions":[{"id":"https://openalex.org/I180941496","display_name":"University of Hyogo","ror":"https://ror.org/0151bmh98","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Daiki Nishioka","raw_affiliation_strings":["Graduate School of Engineering, University of Hyogo,Department of Electronics and Computer Science,Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, University of Hyogo,Department of Electronics and Computer Science,Japan","institution_ids":["https://openalex.org/I180941496"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072322228","display_name":"Masakazu Morimoto","orcid":"https://orcid.org/0000-0002-7494-0404"},"institutions":[{"id":"https://openalex.org/I180941496","display_name":"University of Hyogo","ror":"https://ror.org/0151bmh98","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masakazu Morimoto","raw_affiliation_strings":["Graduate School of Engineering, University of Hyogo,Department of Electronics and Computer Science,Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, University of Hyogo,Department of Electronics and Computer Science,Japan","institution_ids":["https://openalex.org/I180941496"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035561339","display_name":"Hirotaro Tada","orcid":null},"institutions":[{"id":"https://openalex.org/I4210108878","display_name":"Yokohama Rubber (Japan)","ror":"https://ror.org/01zwphm70","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210108878"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirotaro Tada","raw_affiliation_strings":["The Yokohama Rubber Co., Ltd"],"affiliations":[{"raw_affiliation_string":"The Yokohama Rubber Co., Ltd","institution_ids":["https://openalex.org/I4210108878"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5005453849"],"corresponding_institution_ids":["https://openalex.org/I180941496"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.4315613,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"14","last_page":"19"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6676999926567078,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6676999926567078,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12707","display_name":"Vehicle License Plate Recognition","score":0.6380000114440918,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4923616647720337},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48933714628219604},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.48038560152053833},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4309907555580139},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.40477532148361206},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31258946657180786},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.15876394510269165},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.11016368865966797}],"concepts":[{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4923616647720337},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48933714628219604},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.48038560152053833},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4309907555580139},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.40477532148361206},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31258946657180786},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.15876394510269165},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11016368865966797}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icmlc63072.2024.10935084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc63072.2024.10935084","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Machine Learning and Cybernetics (ICMLC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1995875735","https://openalex.org/W2108598243","https://openalex.org/W2194775991","https://openalex.org/W3169651898"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"The":[0],"study":[1],"aims":[2],"to":[3,23],"develop":[4],"an":[5,41],"automated":[6],"system":[7,44],"for":[8,35,51],"inspecting":[9],"the":[10],"inner":[11,28],"surface":[12,29],"of":[13],"automobile":[14],"tires.":[15],"Current":[16],"manual":[17],"inspections":[18],"are":[19,49],"labor-intensive":[20],"and":[21,57],"prone":[22],"errors,":[24],"especially":[25],"in":[26],"detecting":[27],"defects.":[30],"As":[31],"a":[32],"proposed":[33],"method":[34],"tire":[36],"abnormality":[37,42],"detection,":[38],"we":[39],"propose":[40],"detection":[43],"using":[45],"PatchCore[1].":[46],"Various":[47],"methods":[48],"explored":[50],"comparative":[52],"validation,":[53],"including":[54],"image":[55],"preprocessing":[56],"score":[58],"calculation.":[59]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}