{"id":"https://openalex.org/W2133426695","doi":"https://doi.org/10.1109/icmlc.2011.6016717","title":"Electrical equipment fault monitoring system based on temperature change information fusion technology","display_name":"Electrical equipment fault monitoring system based on temperature change information fusion technology","publication_year":2011,"publication_date":"2011-07-01","ids":{"openalex":"https://openalex.org/W2133426695","doi":"https://doi.org/10.1109/icmlc.2011.6016717","mag":"2133426695"},"language":"en","primary_location":{"id":"doi:10.1109/icmlc.2011.6016717","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc.2011.6016717","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Machine Learning and Cybernetics","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100360790","display_name":"Wei Li","orcid":"https://orcid.org/0000-0002-2305-2642"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Li","raw_affiliation_strings":["College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)","institution_ids":["https://openalex.org/I34155123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021432652","display_name":"Xueling Song","orcid":"https://orcid.org/0000-0002-2287-6711"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xue-Ling Song","raw_affiliation_strings":["College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)","institution_ids":["https://openalex.org/I34155123"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100717759","display_name":"Yongwei Li","orcid":"https://orcid.org/0000-0003-3587-312X"},"institutions":[{"id":"https://openalex.org/I34155123","display_name":"Hebei University of Science and Technology","ror":"https://ror.org/05h3pkk68","country_code":"CN","type":"education","lineage":["https://openalex.org/I34155123"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong-Wei Li","raw_affiliation_strings":["College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)"],"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Information Science, Hebei University of Science and Technology, Shijiazhuang, China","institution_ids":["https://openalex.org/I34155123"]},{"raw_affiliation_string":"College of Electrical Engineering and Information Science,Hebei University of Science and Technology,Shijiazhuang 050018,China)","institution_ids":["https://openalex.org/I34155123"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100360790"],"corresponding_institution_ids":["https://openalex.org/I34155123"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15188826,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"17","issue":null,"first_page":"10","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9724000096321106,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.960099995136261,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7830334305763245},{"id":"https://openalex.org/keywords/information-fusion","display_name":"Information fusion","score":0.769298791885376},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.6605997085571289},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5589919686317444},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.5186359286308289},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.5081343650817871},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4882853031158447},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.4823252856731415},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29984068870544434},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.25017231702804565},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15537774562835693}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7830334305763245},{"id":"https://openalex.org/C2982962833","wikidata":"https://www.wikidata.org/wiki/Q17092450","display_name":"Information fusion","level":2,"score":0.769298791885376},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.6605997085571289},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5589919686317444},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.5186359286308289},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.5081343650817871},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4882853031158447},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.4823252856731415},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29984068870544434},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.25017231702804565},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15537774562835693},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icmlc.2011.6016717","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmlc.2011.6016717","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International Conference on Machine Learning and Cybernetics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1620345204","https://openalex.org/W1998609659","https://openalex.org/W2046904226","https://openalex.org/W2047237187","https://openalex.org/W2071978572","https://openalex.org/W2144753254","https://openalex.org/W2182632588","https://openalex.org/W6685989438"],"related_works":["https://openalex.org/W2132659060","https://openalex.org/W2031992971","https://openalex.org/W3214791684","https://openalex.org/W2353265673","https://openalex.org/W2152662039","https://openalex.org/W79444681","https://openalex.org/W2383241417","https://openalex.org/W2956133731","https://openalex.org/W2018887750","https://openalex.org/W3088112989"],"abstract_inverted_index":{"Fault":[0],"diagnosis":[1,34,45,68],"is":[2,41,77],"an":[3],"important":[4],"method":[5,46,69],"to":[6,16],"ensure":[7],"the":[8,18,29,56],"normal":[9],"operation":[10],"of":[11,21,35,58],"electrical":[12,22,36],"equipment.":[13],"In":[14,52],"order":[15],"reflect":[17],"operational":[19],"status":[20],"equipment":[23,37],"from":[24],"many":[25],"ways":[26],"and":[27,32,74],"realize":[28],"automatic":[30],"recognition":[31],"accurate":[33],"failure":[38],"modes,":[39],"it":[40],"proposed":[42],"a":[43,63],"fault":[44,67],"based":[47],"on":[48,55],"information":[49,60,66],"fusion":[50,61],"technology.":[51],"this":[53],"paper,":[54],"basis":[57],"multi-source":[59,65],"technology,":[62],"new":[64],"combining":[70],"D-S":[71],"evidence":[72],"theory":[73],"fuzzy":[75],"mathematics":[76],"put":[78],"forward.":[79]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}